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相关论文: Electronic structure of graphite/6H-SiC interfaces

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We demonstrate the formation of semimetal graphite/semiconductor Schottky barriers where the semiconductor is either silicon (Si), gallium arsenide (GaAs) or 4H-silicon carbide (4H-SiC). Near room temperature, the forward-bias diode…

材料科学 · 物理学 2015-05-14 S. Tongay , T. Schumann , A. F. Hebard

Realizing an optimal Schottky interface of graphene on Si is challenging, as the electrical transport strongly depends on the graphene quality and the fabrication processes. Such interfaces are of increasing research interest for…

介观与纳米尺度物理 · 物理学 2017-02-08 S. Parui , R. Ruiter , P. J. Zomer , M. Wojtaszek , B. J. van Wees , T. Banerjee

The electronic and magnetic properties of Fe/GaAs(001) magnetic junctions are investigated using first-principles density-functional calculations. Abrupt and intermixed interfaces are considered, and the dependence of charge transfer,…

其他凝聚态物理 · 物理学 2009-11-11 D. O. Demchenko , Amy Y. Liu

The Schottky barrier height (SBH) is mapped with nanoscale resolution at pure Au/Si(001) and mixed Au/Ag/Si(001) interfaces utilizing ballistic electron emission microscopy (BEEM) by acquiring and fitting spectra every 11.7 nm over a 1…

介观与纳米尺度物理 · 物理学 2014-11-04 Robert Balsano , Chris Durcan , Akitomo Matsubayashi , Vincent P. LaBella

We present a structural analysis of the graphene-4HSiC(0001) interface using surface x-ray reflectivity. We find that the interface is composed of an extended reconstruction of two SiC bilayers. The interface directly below the first…

材料科学 · 物理学 2009-11-13 J. Hass , J. E. Millan-Otoya , P. N. First , E. H. Conrad

Graphene films prepared by heating the SiC(000-1) surface (the C-face of the {0001} surfaces) in vacuum or in a Si-rich environment are compared. It is found that different interface structures occur for the two situations. The former…

材料科学 · 物理学 2015-06-03 N. Srivastava , Guowei He , Luxmi , R. M. Feenstra

Ab-initio calculations have been used to study the influence of the interface morphology and, notably, of the exchange reaction on the electronic properties of Al/GaN (100) interfaces. In particular, the effects of interface structure (i.e.…

材料科学 · 物理学 2009-10-31 S. Picozzi , A. Continenza , S. Massidda , A. J. Freeman , N. Newman

We perform density functional theory calculations for the determination of the structural and electronic properties of epitaxial graphene on 4H-SiC(000$\bar{1}$). Using commensurate supercells that minimize non-physical stresses we show…

介观与纳米尺度物理 · 物理学 2011-03-07 I. Deretzis , A. La Magna

The problem of Fermi-level pinning at semiconductor-metal contacts is readdressed starting from first-principles calculations for Al/GaAs. We give quantitative evidence that the Schottky barrier height is very little affected by any…

材料科学 · 物理学 2009-10-30 Alice Ruini , Raffaele Resta , Stefano Baroni

The formation of a Schottky barrier at the interface between a metal and hexagonal boron nitride (h-BN) is studied using density functional theory. For metals whose work functions range from 4.2 to 6.0 eV, we find Schottky barrier heights…

介观与纳米尺度物理 · 物理学 2014-08-15 Menno Bokdam , Geert Brocks , Mikhail I. Katsnelson , Paul J. Kelly

A systematic treatment of graphene-semiconductor junction is presented. Finite density of states at the Fermi level of graphene leads to exotic electronic properties at graphene-semiconductor interface. Quite generally, the Schottky-Mott…

应用物理 · 物理学 2020-04-28 M. Javadi

Graphitization of the 6H-SiC(0001) surface as a function of annealing temperature has been studied by ARPES, high resolution XPS, and LEED. For the initial stage of graphitization - the 6root3 reconstructed surface - we observe sigma-bands…

材料科学 · 物理学 2007-05-23 K. V. Emtsev , Th. Seyller , F. Speck , L. Ley , P. Stojanov , J. D. Riley , R. G. C. Leckey

Graphene interfaced with a semiconductor forms a Schottky junction with rectifying properties, however, fluctuations in the Schottky barrier height are often observed. In this work, Schottky junctions are fabricated by transferring chemical…

材料科学 · 物理学 2015-05-20 D. Tomer , S. Rajput , L. J. Hudy , C. H. Li , L. Li

Understanding of the electrical contact properties of semiconductor nanowire (NW) field effect transistors (FETs) plays a crucial role in employing semiconducting NWs as building blocks for future nanoelectronic devices and in the study of…

介观与纳米尺度物理 · 物理学 2016-05-30 Dingxun Fan , N Kang , Sepideh Gorji Ghalamestani , Kimberly A Dick , H Q Xu

The 5x5, 6rt(3)x6rt(3)-R30deg, and graphene-covered 6rt(3)x6rt(3)-R30deg reconstructions of the SiC(0001) surface are studied by scanning tunneling microscopy and spectroscopy. For the 5x5 structure a rich spectrum of surface states is…

材料科学 · 物理学 2010-11-23 Shu Nie , R. M. Feenstra

We present a scanning tunneling microscopy (STM) study of a gently-graphitized 6H-SiC(0001) surface in ultra high vacuum. From an analysis of atomic scale images, we identify two different kinds of terraces, which we unambiguously attribute…

Using current-voltage (I-V) and capacitance-voltage (C-V) measurements, we report on the unusual physics and promising technical applications associated with the formation of Schottky barriers at the interface of a one-atom-thick zero-gap…

材料科学 · 物理学 2012-03-27 S. Tongay , M. Lemaitre , X. Miao , B. Gila , B. R. Appleton , A. F. Hebard

Recent transport measurements on thin graphite films grown on SiC show large coherence lengths and anomalous integer quantum Hall effects expected for isolated graphene sheets. This is the case eventhough the layer-substrate epitaxy of…

In this paper, the electrical behavior of tungsten carbide (WC) Schottky barrier on 4H-SiC was investigated. First, a statistical current-voltage (I-V) analysis in forward bias, performed on a set of equivalent diodes, showed a symmetric…

It has been shown that the first C layer on the SiC(0001)(2{\times}2)C surface already exhibits graphene-like electronic structure, with linear pi bands near the Dirac point. Indeed, the (2{\times}2)C reconstruction, with a Si adatom and C…

介观与纳米尺度物理 · 物理学 2015-05-27 F. Hiebel , P. Mallet , J. -Y. Veuillen , L. Magaud
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