A Model for Striped Growth
软凝聚态物质
2009-11-10 v1 统计力学
摘要
We introduce a model for describing the defected growth of striped patterns. This model, while roughly related to the Swift-Hohenberg model, generates a quite different mixture of defects during phase ordering. We find two characteristic lengths in the system: the scaling length L(t), and the average width of the domain walls. The growth law exponent is larger than the value of 1/2 found in typical point defect systems.
引用
@article{arxiv.cond-mat/0307715,
title = {A Model for Striped Growth},
author = {Hai Qian and Gene F. Mazenko},
journal= {arXiv preprint arXiv:cond-mat/0307715},
year = {2009}
}
备注
7 pages, 14 figures