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We investigate the mechanisms responsible for the low-frequency noise in liquid-gated nano-scale silicon nanowire field-effect transistors (SiNW-FETs) and show that the charge-noise level is lower than elementary charge. Our measurements…

介观与纳米尺度物理 · 物理学 2011-01-24 N. Clement , K. Nishiguchi , J. F. Dufreche , D. Guerin , A. Fujiwara , D. Vuillaume

We have investigated low-frequency 1/f noise in the boron nitride - grapheme - boron nitride heterostructure field - effect transistors on Si/SiO2 substrates (f is a frequency). The device channel was implemented with a single layer…

介观与纳米尺度物理 · 物理学 2015-08-11 Maxim A. Stolyarov , Guanxiong Liu , Sergey L. Rumyantsev , Michael Shur , Alexander A. Balandin

We theoretically investigate the finite-frequency as well as the zero-frequency charge-current fluctuations through a noncollinear single-electron spin-valve transistor in the limit of sequential tunneling. The system under consideration…

介观与纳米尺度物理 · 物理学 2012-12-11 Stephan Lindebaum , Jürgen König

Transport properties of ferromagnetic/non-magnetic/ferromagnetic single electron transistors are investigated as a function of external magnetic field, temperature, bias and gate voltage. By designing the magnetic electrodes to have…

介观与纳米尺度物理 · 物理学 2009-11-07 Jan Johansson , Mattias Urech , David Haviland , V. Korenivski

Low temperature electron transport measurements of single electron transistors fabricated in advanced CMOS technology with polysilicon gates not only exhibit clear Coulomb blockade behavior but also show a large number of additional…

介观与纳米尺度物理 · 物理学 2014-01-08 Dharmraj Kotekar-Patil , Stefan Jauerneck , David Wharam , Dieter Kern , Xavier Jehl , Romain Wacquez , M. Sanquer

An analytical analysis of quantum shuttle phenomena in a nanoelectromechanical single-electron transistor has been performed in the realistic case, when the electron tunnelling length is much greater than the amplitude of the zero point…

介观与纳米尺度物理 · 物理学 2009-11-10 D. Fedorets , L. Y. Gorelik , R. I. Shekhter , M. Jonson

By using the drone-fermion representation and the Schwinger-Keldysh approach, we calculate the current noise and the charge noise for a single-electron transistor in the non-equilibrium state in the presence of large quantum fluctuation of…

介观与纳米尺度物理 · 物理学 2009-11-07 Yasuhiro Utsumi , Hiroshi Imamura , Masahiko Hayashi , Hiromichi Ebisawa

We have investigated the low-frequency 1/f noise of both suspended and on-substrate graphene field-effect transistors and its dependence on gate voltage, in the temperature range between 300K and 30K. We have found that the noise amplitude…

材料科学 · 物理学 2012-04-09 Yan Zhang , E. E. Mendez , Xu Du

Charge noise in semiconducting quantum dots has been observed to have a 1/f spectrum. We propose a model in which a pair of quantum dots are coupled to a 2D bath of fluctuating two level systems (TLS) that have electric dipole moments and…

介观与纳米尺度物理 · 物理学 2024-03-15 D. L. Mickelsen , Herve M. Carruzzo , Clare C. Yu

We incorporate an Al-AlO_x-Al single-electron transistor as the gate of a narrow (~100 nm) metal-oxide-semiconductor field-effect transistor (MOSFET). Near the MOSFET channel conductance threshold, we observe oscillations in the conductance…

介观与纳米尺度物理 · 物理学 2011-11-10 L. Sun , K. R. Brown , B. E. Kane

In this letter we present the results of systematic experimental investigations of the effect of different chemical environments on the low frequency resistance fluctuations of single layer graphene field effect transistors (SLG-FET). The…

介观与纳米尺度物理 · 物理学 2015-10-29 Kazi Rafsanjani Amin , Aveek Bid

We demonstrate graphene thickness-graded transistors with high electron mobility and low 1/f noise (f is a frequency). The device channel is implemented with few-layer graphene with the thickness varied from a single layer in the middle to…

介观与纳米尺度物理 · 物理学 2015-06-03 Guanxiong Liu , Sergey Rumyantsev , Michael Shur , Alexander A. Balandin

We report on measurements on a sample consisting of two nominally identical single-electron transistors the islands of which are coupled capacitively. One transistor at a time is operated as electron box. The remaining transistor is used as…

介观与纳米尺度物理 · 物理学 2007-05-23 R. Schaefer , B. Limbach , P. v. Stein , C. Wallisser

We report on the results of the low-frequency (1/f, where f is frequency) noise measurements in MoS2 field-effect transistors revealing the relative contributions of the MoS2 channel and Ti/Au contacts to the overall noise level. The…

介观与纳米尺度物理 · 物理学 2015-06-18 J. Renteria , R. Samnakay , S. L. Rumyantsev , P. Goli , M. S. Shur , A. A. Balandin

We report on low-temperature noise measurements of a single electron transistor (SET) immersed in superfluid $^4$He. The device acts as a charge sensitive electrometer able to detect the fluctuations of charged defects in close proximity to…

量子物理 · 物理学 2021-10-27 N. R. Beysengulov , J. R. Lane , J. M. Kitzman , K. Nasyedkin , D. G. Rees , J. Pollanen

We probe electric-field noise near the metal surface of an ion trap chip in a previously unexplored high-temperature regime. We observe a non-trivial temperature dependence with the noise amplitude at 1-MHz frequency saturating around…

We report low frequency charge noise measurement on silicon substrates with different phosphorus doping densities. The measurements are performed with aluminum single electron transistors (SETs) at millikelvin temperatures where the…

介观与纳米尺度物理 · 物理学 2009-11-10 A. J. Ferguson , V. C. Chan , A. R. Hamilton , R. G. Clark

Due to presence of magnetic field gradient needed for coherent spin control, dephasing of single-electron spin qubits in silicon quantum dots is often dominated by $1/f$ charge noise. We investigate theoretically fluctuations of ground…

介观与纳米尺度物理 · 物理学 2024-08-09 Marcin Kępa , Niels Focke , Łukasz Cywiński , Jan. A. Krzywda

We theoretically investigate the noise of a single-electron transistor in the regime of large quantum fluctuation of charge out of equilibrium. We show that the charge noise is suppressed due to the charge renormalization caused by the…

介观与纳米尺度物理 · 物理学 2015-06-24 Yasuhiro Utsumi , Hiroshi Imamura , Masahiko Hayashi , Hiromichi Ebisawa

We report results of experimental investigation of the low-frequency noise in the top-gate graphene transistors. The back-gate graphene devices were modified via addition of the top gate separated by 20 nm of HfO2 from the single-layer…

材料科学 · 物理学 2015-05-14 G. Liu , W. Stillman , S. Rumyantsev , Q. Shao , M. Shur , A. A. Balandin