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Capacitance-Voltage (C-V) & Ballistic Current- Voltage (I-V) characteristics of Double Gate (DG) Silicon-on- Insulator (SOI) Flexible FETs having sub 35nm dimensions are obtained by self-consistent method using coupled Schrodinger- Poisson…

This paper presents a self-consistent numerical model for calculating the charge profile and gate capacitance and therefore obtaining C-V characterization for a gate-all-around graded nanowire MOSFET with a high mobility axially graded…

We investigated Capacitance-Voltage (C-V) characteristics of the Depletion Mode Buried Channel InGaAs/InAs Quantum Well FET by using Self-Consistent method incorporating Quantum Mechanical (QM) effects. Though the experimental results of…

Silicon carbide (SiC) metal-oxide-semiconductor field-effect-transistors (MOSFETs) enable high-voltage and high-temperature power conversion. Compared to Si devices, they suffer from pronounced gate leakage due to the reduced electron…

材料科学 · 物理学 2025-12-03 Ang Feng , Alexander Karl , Dominic Waldhör , Marina Avramenko , Peter Moens , Tibor Grasser

This paper critically examines the leakage current reduction techniques for improving the performance of poly-Si TFTs used in active matrix liquid crystal displays. This is a first comprehensive study in literature on this topic. The review…

介观与纳米尺度物理 · 物理学 2010-08-17 Ali A. Orouji , M. Jagadesh Kumar

This paper addresses the question of whether a ``rigid molecule'' (one which does not deform in an external field) used as the conducting channel in a standard three-terminal MOSFET configuration can offer any performance advantage relative…

介观与纳米尺度物理 · 物理学 2009-11-07 Prashant Damle , Titash Rakshit , Magnus Paulsson , Supriyo Datta

We have presented a compact MOSFET model, which allows us to describe the I-V characteristics of irradiated long-channel and short-channel transistors in all operation modes at different measurement temperatures and interface trap…

介观与纳米尺度物理 · 物理学 2017-02-22 G. I. Zebrev , V. V. Orlov , A. S. Bakerenkov , V. A. Felitsyn

In this work, quantum ballistic simulation study of a III-V tri-gate MOSFET has been presented. At the same time, effects of device parameter variation on ballistic, subthrshold and short channel performance is observed and presented. The…

计算物理 · 物理学 2018-02-27 Kanak Datta , Quazi D. M. Khosru

In this paper, we propose a new trench power MOSFET with strained Si channel that provides lower on resistance than the conventional trench MOSFET. Using a 20% Ge mole fraction in the Si1-xGex body with a compositionally graded Si1-xGex…

材料科学 · 物理学 2010-08-19 Raghvendra S. Saxena , M. Jagadesh Kumar

For nanoscale CMOS applications, strained-silicon devices have been receiving considerable attention owing to their potential for achieving higher performance and compatibility with conventional silicon processing. In this work, an…

介观与纳米尺度物理 · 物理学 2010-08-19 Vivek Venkataraman , Susheel Nawal , M. Jagadesh Kumar

This paper depicts the actual variation of gate induced drain leakage current with impurity doping concentration by complete qualitative and quantitative approach. De Casteljaus algorithm is applied to describe the band to band tunneling in…

介观与纳米尺度物理 · 物理学 2019-04-11 Arnesh Sen , Jayoti Das

GaSb p-channel MOSFETs with an atomic layer deposited Al2O3 gate dielectric and a self-aligned Si implanted source/drain are demonstrated. Thermal anneal conditions are optimized for the source/drain impurity activation. Temperature…

材料科学 · 物理学 2014-02-25 Lianfeng Zhao , Zhen Tan , Jing Wang , Jun Xu

We investigated the effect of material choice and orientation in limiting source to drain tunneling (SDT) in nanowire (NW) p-MOSFETs. Si, Ge, GaSb, and Ge0.96Sn0.04 nanowire MOSFETs (NWFETs) were simulated using rigorous ballistic quantum…

应用物理 · 物理学 2020-01-01 Dibakar Yadav , Deleep R Nair

In this letter we not only show improvement in the performance but also in the reliability of 30nm thick biaxially strained SiGe (20%Ge) channel on Si p-MOSFETs. Compared to Si channel, strained SiGe channel allows larger hole mobility…

介观与纳米尺度物理 · 物理学 2015-05-20 Shweta Deora , Abhijeet Paul , R. Bijesh , Jeff Huang , Gerhard Klimeck , Gennadi Bersuker , P. D. Krisch , Raj Jammy

The electrostatic performance of p-type nanowires (NWs) made of InSb and GaSb, with special focus on their gate capacitance behavior, is analyzed and compared to that achieved by traditional semiconductors usually employed for p-MOS such as…

We present a computational study on the impact of tensile/compressive uniaxial ($\varepsilon_{xx}$) and biaxial ($\varepsilon_{xx}=\varepsilon_{yy}$) strain on monolayer MoS$_{2}$ NMOS and PMOS FETs. The material properties like band…

介观与纳米尺度物理 · 物理学 2013-08-02 Amretashis Sengupta , Ram Krishna Ghosh , Santanu Mahapatra

We have performed numerical modeling of dual-gate ballistic n-MOSFET's with channel length of the order of 10 nm, including the effects of quantum tunneling along the channel and through the gate oxide. Our analysis includes a…

介观与纳米尺度物理 · 物理学 2009-10-31 Y. Naveh , K. K. Likharev

A simulation methodology for ultra-scaled InAs quantum well field effect transistors (QWFETs) is presented and used to provide design guidelines and a path to improve device performance. A multiscale modeling approach is adopted, where…

介观与纳米尺度物理 · 物理学 2011-10-28 Neerav Kharche , Gerhard Klimeck , Dae-Hyun Kim , Jesús. A. del Alamo , Mathieu Luisier

Voltage-dependent ion channels determine the electric properties of axonal cell membranes. They not only allow the passage of ions through the cell membrane but also contribute to an additional charging of the cell membrane resulting in the…

神经元与认知 · 定量生物学 2009-11-13 G. Schmid , I. Goychuk , P. Hanggi

In this work, an analytical model to calculate the channel potential and current-voltage characteristics in a Symmetric tunneling Field-Effect-Transistor (SymFET) is presented. The current in a SymFET flows by tunneling from an n-type…

介观与纳米尺度物理 · 物理学 2013-01-07 Pei Zhao , Randall M. Feenstra , Gong Gu , Debdeep Jena
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