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Atomic layer deposition of ultrathin HfO2 on unmodified graphene from HfCl4 and H2O was investigated. Surface RMS roughness down to 0.5 nm was obtained for amorphous, 30 nm thick hafnia film grown at 180 degrees C. HfO2 was deposited also…

We have investigated the atomically-resolved substrate and homoepitaxial thin film surfaces of SrTiO3(001) using low-temperature scanning tunneling microscopy/spectroscopy (STM/STS) combined with pulsed laser deposition (PLD). It was found…

材料科学 · 物理学 2015-05-18 Takeo Ohsawa , Katsuya Iwaya , Ryota Shimizu , Tomihiro Hashizume , Taro Hitosugi

Transition metal aluminum nitrides are a technologically important class of multifunctional ceramics, however, the HfAlN system remains largely unexplored. We investigate phase stability, nanostructure design, and mechanical behavior of…

Tin (IV) oxide (SnO2) sols have been synthesized from SnCl2.2H2O precursor solution by applying two different processing conditions. The prepared sols were then deposited on UV-Ozone treated quartz and soda lime glass (SLG) substrates by…

材料科学 · 物理学 2023-01-31 Md. Nur Amin Bitu , Nazmul Islam Tanvir , Suravi Islam , Syed Farid Uddin Farhad

The surface structure of SrTiO3(001) thin films homoepitaxially grown by PLD in step-flow mode was characterized using low temperature STM. It was found that one-dimensional (1D) TiOx-based nanostructures were formed on the thin film…

材料科学 · 物理学 2015-05-18 Katsuya Iwaya , Takeo Ohsawa , Ryota Shimizu , Tomihiro Hashizume , Taro Hitosugi

Al2O3 thin films have been deposited at substrate temperatures between 500{\deg}C to 600{\deg}C by reactive magnetron sputtering using an additional arbitrary substrate bias to tailor the energy distribution of the incident ions. The films…

等离子体物理 · 物理学 2015-06-16 Marina Prenzel , Annika Kortmann , Adrian Stein , Achim von Keudell , Farwah Nahif , Jochen M. Schneider

CoFe2O4 thin films (5 nm and 20 nm thick) were grown by oxygen assisted molecular beam epitaxy on Pt(111) at 523~K and subsequently annealed at 773 K in vacuum or oxygen. They were characterized in-situ using Auger Electron Spectroscopy,…

LaFeAsO1-xFx thin films were deposited successfully on (001)-oriented LaAlO3 and MgO substrates from stoichiometric LaFeAsO1-xFx polycrystalline targets with fluorine concentrations up to x = 0.25 by PLD. Room temperature deposition and…

超导电性 · 物理学 2009-11-13 E. Backen , S. Haindl , T. Niemeier , T. Freudenberg , J. Werner , G. Behr , L. Schultz , B. Holzapfel

Oblique angle deposition of oxides is being famous for fabricating inhomogeneous thin films with variation of refractive index along thickness in a functional form. Inhomogeneous layers play a key role in the development of rugate…

材料科学 · 物理学 2014-06-27 R B Tokas , S Jena , P Sarkar , Shyam polaki , S Thakur , S Basu , N K Sahoo

Single phase nano and micro crystalline silicon films deposited using SiF4/H2 plasma at different H2 dilution levels were studied at initial and terminal stages of film growth with spectroscopic ellipsometry (SE), Raman scattering (RS) and…

材料科学 · 物理学 2009-11-13 Sanjay K. Ram , Md. N. Islam , P. Roca i Cabarrocas , Satyendra Kumar

Classical molecular-dynamics simulations have been carried out to investigate densification mechanisms in silicon dioxide thin films deposited on an amorphous silica surface, according to a simplified ion-beam assisted deposition (IBAD)…

材料科学 · 物理学 2009-11-07 Alexis Lefevre , Laurent J. Lewis , Ludvik Martinu , Michael R. Wertheimer

Ruthenium dioxide (RuO$_2$) thin films were synthesized by Chemical Solution Deposition (CSD) on silicon substrates using only water and acetic acid as solvents. The microstructure, phase-purity, electrical and optical properties as well as…

Highly crystallized undoped hydrogenated microcrystalline silicon films prepared using SiF4-H2 mixture plasma were investigated at various stages of growth employing different microstructural probes. Our self-consistent results elucidate…

材料科学 · 物理学 2007-07-03 Sanjay K. Ram , MD. N. Islam , P. Roca I Cabarrocas , Satyendra Kumar

Silicon thin films for coverages ($\theta$) between 0.3 and 3 monolayers have been grown on rutile \ce{TiO2}(110)-(1x1) at room temperature and studied by x-ray and ultra-violet photoelectron spectroscopies, Auger electron spectroscopy, and…

材料科学 · 物理学 2011-06-03 J. Abad , C. Gonzalez , P. L. de Andres , E. Roman

We report the physical properties of Co$_2$CrAl Heusler alloy epitaxial thin films grown on single crystalline MgO(001) substrate using pulsed laser deposition technique. The x-ray diffraction pattern in $\theta$-2$\theta$ mode showed the…

材料科学 · 物理学 2022-08-10 Guru Dutt Gupt , Rajendra S. Dhaka

In the present work, HfO2 thin film (100nm) has been deposited by sputtering technique and annealed at various temperatures ranging from 400 to 1000\degree (in step of 200 \degree) in O2 ambient for 10 min. The samples have been…

材料科学 · 物理学 2016-05-05 Shilpi Pandey , Prateek Kothari , Sunil Kumar Sharma , Seema Verma , K. J. Rangra

Nanolaminated Al2O3/HfO2 thin films as well as single Al2O3 and HfO2 layers have been grown as gate dielectrics by Plasma Enhanced Atomic Layer Deposition (PEALD) technique on silicon carbide (4H-SiC) substrates. All the three dielectric…

应用物理 · 物理学 2021-04-29 Raffaella Lo Nigro , Emanuela Schilirò , Patrick Fiorenza , Fabrizio Roccaforte

A systematic investigation has been performed to optimize the microstructure of $\mathrm{L1_0-FePt-SiO_x}$ granular thin film as recording media for heat-assisted magnetic recording. The FePt-BN nucleation layer, which is stable even at…

Thick (~50 nm) films of Hf were evaporated onto bare and oxidized Si(001) samples, and thin (~monolayer) films of Hf were evaporated onto clean Si(001)-(2x1) surfaces. Upon annealing to 1000$^/circ$C, films of HfSi2 were formed after…

材料科学 · 物理学 2007-05-23 H. T. Johnson-Steigelman , A. V. Brinck , P. F. Lyman

We have investigated the initial growth behavior and resulting microstructural properties of heteroepitaxial ZnO thin films prepared by pulsed laser deposition on sapphire (0001) substrates. High-resolution x-ray diffraction and…

材料科学 · 物理学 2015-06-25 C. Liu , S. H. Chang , T. W. Noh , M. Abouzaid , P. Ruterana , H. H. Lee , D. -W. Kim , J. -S. Chung
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