低能电子衍射和表面 X 射线衍射确定的 Bi2Se3(111) 表面结构
材料科学
2013-08-09 v1
摘要
原型拓扑绝缘体 Bi2Se3 的表面结构是在室温下通过低能电子衍射和表面 X 射线衍射确定的。两种方法均表明晶体由完整的五原子层终止。具体而言，排除了由铋双层构成的替代终止可能性。两种技术获得的表面弛豫彼此吻合良好，且发现弛豫量很小。这包括前两个五原子层之间范德华间隙的弛豫。
引用
@article{arxiv.1306.3310,
title = {Surface structure of Bi2Se3(111) determined by low-energy electron diffraction and surface X-ray diffraction},
author = {Diogo Duarte dos Reis and Lucas Barreto and Marco Bianchi and Guilherme Almeida Silva Ribeiro and Edmar Avellar Soares and Wendell Simoes e Silva and Vagner Eustaquio de Carvalho and Jonathan Rawle and Moritz Hoesch and Chris Nicklin and Willians Principe Fernandes and Jianli Mi and Bo Brummerstedt Iversen and Philip Hofmann},
journal= {arXiv preprint arXiv:1306.3310},
year = {2013}
}