中文
相关论文

相关论文: Aluminum Single Electron Transistors with Islands …

200 篇论文

We have fabricated and examined several Al single electron transistors whose small islands were positioned on top of a counter electrode and hence did not come into contact with a dielectric substrate. The equivalent charge noise figure of…

介观与纳米尺度物理 · 物理学 2009-10-31 V. A. Krupenin , D. E. Presnov , M. N. Savvateev , H. Scherer , A. B. Zorin , J. Niemeyer

We report on measurements of low frequency noise in a single electron transistor from a few Hz up to 10 MHz. Measurements were done for different bias and gate voltages, which allows us to separate noise contributions from different noise…

介观与纳米尺度物理 · 物理学 2011-03-11 S. Kafanov , H. Brenning , T. Duty , P. Delsing

We present observations of background charge fluctuators near an Al-AlO_x-Al single-electron transistor on an oxidized Si substrate. The transistor design incorporates a heavily doped substrate and top gate, which allow for independent…

介观与纳米尺度物理 · 物理学 2007-05-23 K. R. Brown , L. Sun , B. E. Kane

An extensive investigation of low frequency noise in single electron transistors as a function of gain is presented. Comparing the output noise with gain for a large number of bias points, it is found that the noise is dominated by external…

介观与纳米尺度物理 · 物理学 2016-08-31 B. Starmark , Torsten Henning , A. N. Korotkov , T. Claeson , P. Delsing

We fabricated a large number of single and bilayer graphene transistors and carried out a systematic experimental study of their low-frequency noise characteristics. A special attention was given to determining the dominant noise sources in…

材料科学 · 物理学 2015-05-19 S. Rumyantsev , G. Liu , W. Stillman , M. Shur , A. A. Balandin

We have fabricated aluminum single-electron transistors in which the island is not in contact with the substrate. This new type of device, which can be called suspended single-electron transistor (SUSET), displayed well-defined I-V and…

超导电性 · 物理学 2009-11-13 G. S. Paraoanu , A. M. Halvari

We report the 1/f noise characteristics at low-frequency in graphene field-effect transistors that utilized a high-k dielectric tantalum oxide encapsulated layer (a few nanometers thick) placed by atomic layer deposition on Si3N4. A…

材料科学 · 物理学 2021-03-30 Yifei Wang , Vinh X. Ho , Zachary. N. Henschel , Michael P. Cooney , Nguyen Q. Vinh

We investigate the properties of a hybrid single electron transistor, involving a small superconducting island sandwiched between normal metal leads, which is driven by dc plus ac voltages. In order to describe its properties we derive from…

We report on a new type of single-electron transistor (SET) comprising two highly resistive Cr thin-film strips (~ 1um long) connecting a 1 um-long Al island to two Al outer electrodes. These resistors replace small-area oxide tunnel…

介观与纳米尺度物理 · 物理学 2009-10-31 V. A. Krupenin , A. B. Zorin , D. E. Presnov , M. N. Savvateev , J. Niemeyer

We present low-frequency electrical resistance fluctuations, or noise, in graphene-based field-effect devices with varying number of layers. In single-layer devices the noise magnitude decreases with increasing carrier density, which…

介观与纳米尺度物理 · 物理学 2010-06-09 Atindra Nath Pal , Arindam Ghosh

We present the results of the experimental investigation of the low - frequency noise in bilayer graphene transistors. The back - gated devices were fabricated using the electron beam lithography and evaporation. The charge neutrality point…

材料科学 · 物理学 2009-11-13 Q. Shao , G. Liu , D. Teweldebrhan , A. A. Balandin , S. Roumyantesv , M. Shur , D. Yan

We consider the possibility of using a micromechanical gate electrode located just above the island of a single-electron transistor to measure directly the fluctuating island charge due to tunnelling electrons.

介观与纳米尺度物理 · 物理学 2009-11-07 M. P. Blencowe , Y. Zhang

Ubiquitous low frequency 1/f noise can be a limiting factor in the performance and application of nanoscale devices. Here, we quantitatively investigate low frequency electronic noise in single-layer transition metal dichalcogenide MoS2…

介观与纳米尺度物理 · 物理学 2013-08-16 Vinod K. Sangwan , Heather N. Arnold , Deep Jariwala , Tobin J. Marks , Lincoln J. Lauhon , Mark C. Hersam

We consider a single-electron transistor (SET) whose central island is a nanomechanical oscillator. The gate capacitance of the SET depends on the mechanical displacement, thus, the vibrations of the island vibrations may strongly influence…

介观与纳米尺度物理 · 物理学 2009-11-10 N. M. Chtchelkatchev , W. Belzig , C. Bruder

We have investigated the low frequency (f) flicker (also called 1/f) noise of single-layer graphene devices on h-BN (placed on SiO2/Si) along with those on SiO2/Si. We observe that the devices fabricated on h-BN have on average one order of…

介观与纳米尺度物理 · 物理学 2015-09-30 Morteza Kayyalha , Yong P. Chen

The current noise spectrum of a single-electron transistor (SET) coupled to a nano-mechanical resonator is calculated in the classical regime. Correlations between the charge on the SET island and the position of the resonator give rise to…

介观与纳米尺度物理 · 物理学 2009-11-10 A. D. Armour

A single electron transistor based on Al-AlO_x-Nb tunnel junctions was fabricated by shadow evaporation and in situ barrier formation. Its output current noise was measured, using a transimpedance amplifier setup, as a function of bias…

介观与纳米尺度物理 · 物理学 2009-10-31 Torsten Henning , B. Starmark , T. Claeson , P. Delsing

We have suspended an Al based single-electron transistor whose island can resonate freely between the source and drain leads forming the clamps. In addition to the regular side gate, a bottom gate with a larger capacitance to the SET island…

介观与纳米尺度物理 · 物理学 2015-05-18 Yu. A. Pashkin , T. F. Li , J. P. Pekola , O. Astafiev , D. A. Knyazev , F. Hoehne , H. Im , Y. Nakamura , J. S. Tsai

Two different types of Cooper pair transistors, with Al and Nb islands, have been investigated in a tunable electromagnetic environment. The device with an Al island demonstrates gate charge modulation with 2e-periodicity in a wide range of…

超导电性 · 物理学 2009-11-13 A. M. Savin , M. Meschke , J. P. Pekola , Yu. A. Pashkin , T. F. Li , H. Im , J. S. Tsai

Measurements of the temperature and bias dependence of Single Electron Transistors (SETs) in a dilution refrigerator show that charge noise increases linearly with refrigerator temperature above a voltage-dependent threshold temperature,…

介观与纳米尺度物理 · 物理学 2014-06-10 Martin V. Gustafsson , Arsalan Pourkabirian , Göran Johansson , John Clarke , Per Delsing
‹ 上一页 1 2 3 10 下一页 ›