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相关论文: Simultaneous Extraction of Charge Density Dependen…

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Thin-film transistors (TFTs) represent a wide-spread tool to determine the charge-carrier mobility of materials. Mobilities and further transistor parameters like contact resistances are commonly extracted from the electrical…

The mobility of emerging (e.g., two-dimensional, oxide, organic) semiconductors is commonly estimated from transistor current-voltage measurements. However, such devices often experience contact gating, i.e., electric fields from the gate…

应用物理 · 物理学 2025-02-24 Robert K. A. Bennett , Lauren Hoang , Connor Cremers , Andrew J. Mannix , Eric Pop

The intrinsic mobility degradation coefficient, contact resistance and the transconductance parameter of graphene field-effect transistors (GFETs) are extracted for different technologies by considering a novel transport model embracing…

介观与纳米尺度物理 · 物理学 2022-06-02 Anibal Pacheco-Sanchez , Nikolaos Mavredakis , Pedro C. Feijoo , David Jiménez

Straightforward contact resistance extraction methods based on electrical device characteristics are described and applied here to graphene field-effect transistors from different technologies. The methods are an educated adaptation of…

应用物理 · 物理学 2020-09-24 Anibal Pacheco-Sanchez , Pedro C. Feijoo , David Jiménez

Contact resistances between organic semiconductors and metal electrodes have been shown to play a dominant role in electronic charge injection properties of organic field-effect transistors. These effects are more prevalent in short channel…

其他凝聚态物理 · 物理学 2007-05-23 B. H. Hamadani , D. Natelson

Thin film magnetization problems in type-II superconductivity are usually formulated in terms of the magnetization function alone, which allows one to compute the sheet current density and the magnetic field but often inhibits computing the…

超导电性 · 物理学 2015-06-15 John W. Barrett , Leonid Prigozhin , Vladimir Sokolovsky

The accuracy of contact resistance values of two-dimensional field-effect transistors extracted with the \textit{Y}-function considering the impact of the intrinsic mobility degradation is evaluated here. The difference between…

应用物理 · 物理学 2020-09-21 Anibal Pacheco-Sanchez , David Jiménez

The local conductivity in the channel of a thin-film field-effect transistor is proportional to the charge density induced by the local gate voltage. We show how this determines the frequency- and position-dependence of the charge induced…

材料科学 · 物理学 2015-06-05 E. G. Bittle , J. W. Brill , J. P. Straley

Measuring carrier mobility as a function of the carrier density in semiconductors using Hall effect is the gold standard for quantifying scattering mechanisms. However, for nanostructures, the Hall effect is not applicable, and the density…

A MOSFET threshold voltage extraction method covering the entire range of drain-to-source voltage, from linear to saturation modes, is presented. Transconductance-to-current ratio is obtained from MOSFET transfer characteristics measured at…

应用物理 · 物理学 2021-06-03 Nikolaos Makris , Matthias Bucher

The conductivity of organic semiconductors is measured {\it in-situ} and continuously with a bottom contact configuration, as a function of film thickness at various gate voltages. The depletion layer thickness can be directly determined as…

材料科学 · 物理学 2009-11-10 Manabu Kiguchi , Manabu Nakayama , Toshihiro Shimada , Koichiro Saiki

We have developed and applied a mobility edge model that takes into account drift and diffusion currents to characterize the space charge limited current in organic semiconductors. The numerical solution of the drift-diffusion equation…

材料科学 · 物理学 2015-05-30 Javier Dacuña , Alberto Salleo

The method of current extraction under linear increasing voltages (CELIV) allows for the simultaneous determination of charge mobilities and charge densities directly in thin films as used in organic photovoltaic cells (OPV). In the past,…

材料科学 · 物理学 2010-03-10 Sebastian Bange , Marcel Schubert , Dieter Neher

We have measured both the current-voltage ($I_\mathrm{SD}$-$V_\mathrm{GS}$) and capacitance-voltage ($C$-$V_\mathrm{GS}$) characteristics of a $\mathrm{MoS_2-LiNbO_3}$ field effect transistor. From the measured capacitance we calculate the…

介观与纳米尺度物理 · 物理学 2017-06-23 W. Michailow , F. J. R. Schülein , B. Möller , E. Preciado , A. E. Nguyen , G. v. Son , J. Mann , A. L. Hörner , A. Wixforth , L. Bartels , H. J. Krenner

Transient photovoltage (TPV) is a technique frequently used to determine charge carrier lifetimes in thin-film solar cells such as organic, dye sensitized and perovskite solar cells. As this lifetime is often incident light intensity…

应用物理 · 物理学 2019-08-06 Oskar J. Sandberg , Kristofer Tvingstedt , Paul Meredith , Ardalan Armin

We obtain the output characteristics of graphene field-effect transistors by using the charge-control model for the current, based on the solution of the Boltzmann equation in the field-dependent relaxation time approximation. Closed…

介观与纳米尺度物理 · 物理学 2010-07-22 Brett W. Scott , Jean-Pierre Leburton

We suggest the nondestructive method for determination of the dielectric constant of substrate-deposited thin films by capacitance measurement with two parallel wires placed on top of the film. The exact analytical formula for the…

介观与纳米尺度物理 · 物理学 2016-11-29 Svitlana Kondovych , Igor Luk'yanchuk

We employ the density matrix renormalization group to construct the exact time-dependent exchange correlation potential for an impurity model with an applied transport voltage. Even for short-ranged interaction we find an infinitely…

介观与纳米尺度物理 · 物理学 2017-09-13 Peter Schmitteckert , Michael Dzierzawa , Peter Schwab

We obtain the output and transfer characteristics of graphene field-effect transistors by using the charge-control model for the current, based on the solution of the Boltzmann equation in the field-dependent relaxation time approximation.…

介观与纳米尺度物理 · 物理学 2015-05-20 Brett W. Scott , Jean-Pierre Leburton

A simple electronic experiment with a field effect transistor type microstructure is suggested. The thin superconductor layer is the source-drain channel of the layered structure where an AC current is applied. It is necessary to measure…

超导电性 · 物理学 2009-09-29 Todor Mishonov , Martin Stoev
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