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We demonstrate hydrogen assisted growth of high quality epitaxial graphene on the C-face of 4H-SiC. Compared with the conventional thermal decomposition technique, the size of the growth domain by this method is substantially increased and…

材料科学 · 物理学 2015-06-23 Tuocheng Cai , Zhenzhao Jia , Baoming Yan , Dapeng Yu , Xiaosong Wu

The morphology of graphene formed on the (000-1) surface (the C-face) and the (0001) surface (the Si-face) of SiC, by annealing in ultra-high vacuum or in an argon environment, is studied by atomic force microscopy and low-energy electron…

材料科学 · 物理学 2015-05-20 Luxmi , N. Srivastava , Guowei He , R. M. Feenstra

The formation of graphene on the (0001) surface of SiC (the Si-face) is studied by atomic force microscopy, low-energy electron microscopy, and scanning tunneling microscopy/spectroscopy. The graphene forms due to preferential sublimation…

材料科学 · 物理学 2023-05-03 Luxmi , N. Srivastava , R. M. Feenstra , P. J. Fisher

Graphene was epitaxially grown on both the C- and Si-faces of 4H- and 6H-SiC(0001) under an argon atmosphere and under high vacuum conditions. Following growth, samples were imaged with Nomarski interference contrast and atomic force…

We review progress in developing epitaxial graphene as a material for carbon electronics. In particular, improvements in epitaxial graphene growth, interface control and the understanding of multilayer epitaxial graphene's electronic…

The evolution in the surface morphology of epitaxial graphene films and 6H-SiC(0001) substrates is studied by electron channeling contrast imaging. Whereas film thickness is determined by growth temperature only, increasing growth times at…

材料科学 · 物理学 2009-11-13 Nicola Ferralis , Jason Kawasaki , Roya Maboudian , Carlo Carraro

Graphene is formed on SiC(000-1) surfaces (the so-called C-face of the crystal) by annealing in vacuum, with the resulting films characterized by atomic force microscopy, Auger electron spectroscopy, scanning Auger microscopy and Raman…

材料科学 · 物理学 2015-05-13 Luxmi , P. J. Fisher , N. Srivastava , R. M. Feenstra , Yugang Sun , J. Kedzierski , P. Healey , Gong Gu

The morphology of graphene on SiC {0001} surfaces formed in various environments including ultra-high vacuum, 1 atm of argon, and 10^-6 to 10^-4 Torr of disilane is studied by atomic force microscopy, low-energy electron microscopy, and…

材料科学 · 物理学 2015-05-30 N. Srivastava , Guowei He , Luxmi , P. C. Mende , R. M. Feenstra , Yugang Sun

We investigate the microscopic processes leading to graphene growth by the chemical vapor deposition of propane in the argon atmosphere at the SiC surface. Experimentally, it is known that the presence of argon fastens the dehydrogenation…

材料科学 · 物理学 2017-09-13 Malgorzata Wierzbowska , Adam Dominiak , Kamil Tokar

We present epitaxial graphene (EG) growth on non-polar a-plane and m-plane 6H-SiC faces where material characterization is compared with that known for EG grown on polar faces. Atomic force microscopy (AFM) surface morphology exhibits…

材料科学 · 物理学 2012-03-02 B. K. Daas , K. Daniels , S. Shetu , T. S. Sudarshan , M. V. S. Chandrashekhar

Graphene layers were created on both C and Si faces of semi-insulating, on-axis, 4H- and 6H-SiC substrates. The process was performed under high vacuum (<10-4 mbar) in a commercial chemical vapor deposition SiC reactor. A method for H2…

The structure of the SiC(000-1) surface, the C-face of the {0001} SiC surfaces, is studied as a function of temperature and of pressure in a gaseous environment of disilane (Si2H6). Various surface reconstructions are observed, both with…

介观与纳米尺度物理 · 物理学 2019-08-28 Jun Li , Qingxiao Wang , Guowei He , Michael Widom , Lydia Nemec , Volker Blum , Moon Kim , Patrick Rinke , Randall M. Feenstra

The electrical transport properties of epitaxial graphene layers are correlated with the SiC surface morphology. In this study we show by atomic force microscopy and Raman measurements that the surface morphology and the structure of the…

The growth of graphene by catalytic decomposition of ethylene on Cu(111) in an ultra-high vacuum system was investigated with low energy electron diffraction, low energy electron microscopy, and atomic force microscopy. Attempts to form a…

材料科学 · 物理学 2013-07-19 Zachary R. Robinson , Parul Tyagi , Tyler R. Mowll , James B. Hannon , Carl A. Ventrice

Growth of epitaxial graphene on the C-face of SiC has been investigated. Using a confinement controlled sublimation (CCS) method, we have achieved well controlled growth and been able to observe propagation of uniform monolayer graphene.…

材料科学 · 物理学 2012-11-29 Rui Zhang , Yunliang Dong , Wenjie Kong , Wenpeng Han , Pingheng Tan , Zhimin Liao , Xiaosong Wu , Dapeng Yu

We have determined the growth mode of graphene on SiC(0001) and SiC(000-1) using ultra-thin, isotopically-labeled Si13C `marker layers' grown epitaxially on the Si12C surfaces. Few-layer graphene overlayers were formed via thermal…

材料科学 · 物理学 2011-08-15 J. B. Hannon , M. Copel , R. M. Tromp

Patterning of graphene is key for device fabrication. We report a way to increase or reduce the number of layers in epitaxial graphene grown on the C-face (000-1) of silicon carbide by the deposition of a 120 nm to 150nm-thick silicon…

The inability to grow large well ordered graphene with a specific number of layers on SiC(0001) is well known. The growth involves several competing processes (Si desorption, carbon diffusion, island nucleation etc.), and because of the…

材料科学 · 物理学 2008-09-23 M. Hupalo , E. Conrad , M. C. Tringides

We report on a comparative structural characterization of two types of high quality epitaxial graphene layers grown by CVD on 4H-SiC(0001). The layers under study are a single layer graphene on top of a buffer layer and a…

An in vacuo thermal desorption process has been accomplished to form epitaxial graphene (EG) on 4H- and 6H-SiC substrates using a commercial chemical vapor deposition reactor. Correlation of growth conditions and the morphology and…

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