中文
相关论文

相关论文: Detection of a single-charge defect in a metal-oxi…

200 篇论文

We incorporate an Al-AlO_x-Al single-electron transistor as the gate of a narrow (~100 nm) metal-oxide-semiconductor field-effect transistor (MOSFET). Near the MOSFET channel conductance threshold, we observe oscillations in the conductance…

介观与纳米尺度物理 · 物理学 2011-11-10 L. Sun , K. R. Brown , B. E. Kane

Radio-frequency reflectometry in silicon single-electron transistors (SETs) is presented. At low temperatures (<4 K), in addition to the expected Coulomb blockade features associated with charging of the SET dot, quasi-periodic oscillations…

介观与纳米尺度物理 · 物理学 2015-05-30 B. J. Villis , A. O. Orlov , X. Jehl , G. L. Snider , P. Fay , M. Sanquer

Studying the electrical and structural properties of the interface of the gate oxide (SiO2) with silicon carbide (4H-SiC) is a fundamental topic, with important implications for understanding and optimizing the performances of…

We report on a new type of single-electron transistor (SET) comprising two highly resistive Cr thin-film strips (~ 1um long) connecting a 1 um-long Al island to two Al outer electrodes. These resistors replace small-area oxide tunnel…

介观与纳米尺度物理 · 物理学 2009-10-31 V. A. Krupenin , A. B. Zorin , D. E. Presnov , M. N. Savvateev , J. Niemeyer

We evaluate the detector nonideality (and energy sensitivity) of a normal-state single-electron transistor (SET) in the cotunneling regime in a two-charge-state approximation. For small conductances and at zero temperature, the SET's…

介观与纳米尺度物理 · 物理学 2015-06-24 Alec Maassen van den Brink

We measure the temperature of a mesoscopic system consisting of an ultra-dilute two dimensional electron gas at the $Si/SiO_2$ interface in a metal-oxide-semiconductor field effect transistor (MOSFET) quantum dot by means of the capture and…

介观与纳米尺度物理 · 物理学 2015-05-18 Enrico Prati , Matteo Belli , Marco Fanciulli , Giorgio Ferrari

The single electron transistor (SET) offers unparalled opportunities as a nano-scale electrometer, capable of measuring sub-electron charge variations. SETs have been proposed for read-out schema in solid-state quantum computing where…

介观与纳米尺度物理 · 物理学 2007-05-23 Vincent I. Conrad , Andrew D. Greentree , David N. Jamieson , Lloyd C. L. Hollenberg

We study a tunnel contact that acts as charge detector for a single-electron transistor (SET) focusing on correlations between the detector current and the current through the SET. This system can be described fully by a Markovian master…

介观与纳米尺度物理 · 物理学 2013-06-25 Sigmund Kohler

We present observations of background charge fluctuators near an Al-AlO_x-Al single-electron transistor on an oxidized Si substrate. The transistor design incorporates a heavily doped substrate and top gate, which allow for independent…

介观与纳米尺度物理 · 物理学 2007-05-23 K. R. Brown , L. Sun , B. E. Kane

We compare charge transitions on a deterministic single P donor in silicon using radio frequency reflectometry measurements with a tunnel coupled reservoir and DC charge sensing using a capacitively coupled single electron transistor (SET).…

A dual mode device behaving either as a field-effect transistor or a single electron transistor (SET) has been fabricated using silicon-on-insulator metal oxide semiconductor technology. Depending on the back gate polarisation, an electron…

介观与纳米尺度物理 · 物理学 2012-05-17 Benoît Roche , Benoit Voisin , Xavier Jehl , Romain Wacquez , Marc Sanquer , Maud Vinet , Veeresh Deshpande , Bernard Previtali

Single electron transistors (SETs) are fabricated by placing single walled carbon nanotubes (SWNTs) on a 100 nm wide local Al/Al2O3 bottom gate and then contacting with Pd electrodes. Coulomb oscillations up to 125 K were observed and…

介观与纳米尺度物理 · 物理学 2009-11-13 Paul Stokes , Saiful I. Khondaker

We report electronic transport on n-type silicon Single Electron Transistors (SETs) fabricated in Complementary Metal Oxide Semiconductor (CMOS) technology. The n-MOSSETs are built within a pre-industrial Fully Depleted Silicon On Insulator…

We report on the charge offset drift (time stability) in Si single electron devices (SEDs) defined with aluminum (Al) gates. The size of the charge offset drift (0.15 $e$) is intermediate between that of Al/AlO$_x$/Al tunnel junctions…

介观与纳米尺度物理 · 物理学 2015-06-22 Neil M. Zimmerman , Chih-Hwan Yang , Nai Shyan Lai , Wee Han Lim , Andrew S. Dzurak

We consider a hybrid single-electron transistor (SET) constituted by a gate-controlled normal-metal island (N) connected to two voltage-biased superconducting leads (S) by means of two tunnel junctions (S-I-N-I-S), operated as a turnstile.…

介观与纳米尺度物理 · 物理学 2015-10-07 Angelo Di Marco , Ville F. Maisi , Frank W. J. Hekking , Jukka P. Pekola

Single dopants in semiconductor nanostructures have been studied in great details recently as they are good candidates for quantum bits, provided they are coupled to a detector. Here we report coupling of a single As donor atom to a…

介观与纳米尺度物理 · 物理学 2015-05-20 V. N. Golovach , X. Jehl , M. Houzet , M. Pierre , B. Roche , M. Sanquer , L. I. Glazman

We have suspended an Al based single-electron transistor whose island can resonate freely between the source and drain leads forming the clamps. In addition to the regular side gate, a bottom gate with a larger capacitance to the SET island…

介观与纳米尺度物理 · 物理学 2015-05-18 Yu. A. Pashkin , T. F. Li , J. P. Pekola , O. Astafiev , D. A. Knyazev , F. Hoehne , H. Im , Y. Nakamura , J. S. Tsai

Silicon carbide (SiC) metal-oxide-semiconductor field-effect-transistors (MOSFETs) enable high-voltage and high-temperature power conversion. Compared to Si devices, they suffer from pronounced gate leakage due to the reduced electron…

材料科学 · 物理学 2025-12-03 Ang Feng , Alexander Karl , Dominic Waldhör , Marina Avramenko , Peter Moens , Tibor Grasser

A simple and highly reproducible single electron transistor (SET) has been fabricated using gated silicon nanowires. The structure is a metal-oxide-semiconductor field-effect transistor made on silicon-on-insulator thin films. The channel…

介观与纳米尺度物理 · 物理学 2009-11-11 M. Hofheinz , X. Jehl , M. Sanquer , G. Molas , M. Vinet , S. Deleonibus

Telegraph noise, which originates from the switching of charge between meta-stable trapping sites, becomes increasingly important as device sizes approach the nano-scale. For charge-based quantum computing, this noise may lead to…

介观与纳米尺度物理 · 物理学 2009-11-10 T. M. Buehler , D. J. Reilly , R. P. Starrett , V. C. Chan , A. R. Hamilton , A. S. Dzurak , R. G. Clark
‹ 上一页 1 2 3 10 下一页 ›