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In this paper, we present the unique features exhibited by modified asymmetrical Double Gate (DG) silicon on insulator (SOI) MOSFET. The proposed structure is similar to that of the asymmetrical DG SOI MOSFET with the exception that the…

介观与纳米尺度物理 · 物理学 2010-08-19 G. Venkateshwar Reddy , M. Jagadesh Kumar1

This paper examines the performance degradation of a MOS device fabricated on silicon-on-insulator (SOI) due to the undesirable short-channel effects (SCE) as the channel length is scaled to meet the increasing demand for high-speed…

介观与纳米尺度物理 · 物理学 2010-08-17 Anurag Chaudhry , M. Jagadesh Kumar

Fully depleted (FD) Silicon on Insulator (SOI) metal oxide Field Effect Transistor (MOSFET) Is the Leading Contender for Sun 65nm Regime. This paper presents a study of effects of work functions of metal gate on the performance of FD-SOI…

其他计算机科学 · 计算机科学 2011-04-06 Deepesh Ranka , Ashwani K. Rana , Rakesh Kumar Yadav , Kamalesh Yadav , Devendra Giri

We have performed numerical modeling of dual-gate ballistic n-MOSFET's with channel length of the order of 10 nm, including the effects of quantum tunneling along the channel and through the gate oxide. Our analysis includes a…

介观与纳米尺度物理 · 物理学 2009-10-31 Y. Naveh , K. K. Likharev

This study simulated negative-capacitance double gate FinFETs with channel lengths ranging from 25nm to 100nm using TCAD. The results show that negative capacitance significantly reduces subthreshold swing as well as drain induced barrier…

应用物理 · 物理学 2021-04-08 Jhang-Yan Ciou , Sourav De , Chien-Wei-Wang , Wallace Lin , Yao-Jen Lee , Darsen Lu

Spin-based metal-oxide-semiconductor field-effect transistors (MOSFET) with a high-mobility III-V channel are studied using self-consistent quantum corrected ensemble Monte Carlo device simulations of charge and spin transport. The…

介观与纳米尺度物理 · 物理学 2022-06-15 B Thorpe , K Kalna , S Schirmer

We report the fabrication and study of Hall bar MOSFET devices in which an overlapping-gate architecture allows four-terminal measurements of low-density 2D electron systems, while maintaining a high density at the ohmic contacts.…

介观与纳米尺度物理 · 物理学 2010-10-13 Laurens H. Willems van Beveren , Kuan Y. Tan , Nai-Shyan Lai , Andrew S. Dzurak , Alex R. Hamilton

Design considerations for a below 100 nm channel length SOI MOSFET with electrically induced shallow source/drain junctions are presented. Our simulation results demonstrate that the application of induced source/drain extensions to the SOI…

介观与纳米尺度物理 · 物理学 2015-05-20 Ali A. Orouji , M. Jagadesh Kumar

Spin-based logic devices could operate at very high speed with very low energy consumption and hold significant promise for quantum information processing and metrology. Here, an in-house developed, experimentally verified, ensemble…

计算物理 · 物理学 2018-01-03 B. Thorpe , K. Kalna , F. C. Langbein , S Schirmer

Capacitance-Voltage (C-V) & Ballistic Current- Voltage (I-V) characteristics of Double Gate (DG) Silicon-on- Insulator (SOI) Flexible FETs having sub 35nm dimensions are obtained by self-consistent method using coupled Schrodinger- Poisson…

In this letter we discuss how the short channel behavior in sub 100 nm channel range can be improved by inducing a step surface potential profile at the back gate of an asymmetrical double gate (DG) Silicon-On-Insulator (SOI)…

介观与纳米尺度物理 · 物理学 2010-08-19 M. Jagadesh Kumar , G. V. Reddy

Silicon carbide (SiC) metal-oxide-semiconductor field-effect-transistors (MOSFETs) enable high-voltage and high-temperature power conversion. Compared to Si devices, they suffer from pronounced gate leakage due to the reduced electron…

材料科学 · 物理学 2025-12-03 Ang Feng , Alexander Karl , Dominic Waldhör , Marina Avramenko , Peter Moens , Tibor Grasser

Two-dimensional (2D) layered materials-based field-effect transistors (FETs) are promising for ultimate scaled electron device applications because of the improved electrostatics to atomically thin body thickness. However, compared with the…

应用物理 · 物理学 2019-10-02 Nan Fang , Kosuke Nagashio

In this paper, we have presented the impact of the gate leakage through thin gate dielectrics (SiO2 and high-\k{appa} gate dielectric) on the subthreshold characteristics of the tunnel field effect transistors (TFET) for a low operating…

介观与纳米尺度物理 · 物理学 2014-06-06 Poornendu Chaturvedi , M. Jagadesh Kumar

A simulation methodology for ultra-scaled InAs quantum well field effect transistors (QWFETs) is presented and used to provide design guidelines and a path to improve device performance. A multiscale modeling approach is adopted, where…

介观与纳米尺度物理 · 物理学 2011-10-28 Neerav Kharche , Gerhard Klimeck , Dae-Hyun Kim , Jesús. A. del Alamo , Mathieu Luisier

In this article, we investigate electrical transport properties in ultrathin body (UTB) MoS2 two-dimensional (2D) crystals with channel lengths ranging from 2 {\mu}m down to 50 nm. We compare the short channel behavior of sets of MOSFETs…

材料科学 · 物理学 2013-03-05 Han Liu , Adam T. Neal , Peide D. Ye

In this work, quantum ballistic simulation study of a III-V tri-gate MOSFET has been presented. At the same time, effects of device parameter variation on ballistic, subthrshold and short channel performance is observed and presented. The…

计算物理 · 物理学 2018-02-27 Kanak Datta , Quazi D. M. Khosru

In this work, we propose a new Stepped Oxide Hetero-Material Trench (SOHMT) power MOSFET with three sections in the trench gate (an N+ poly gate sandwiched between two P+ poly gates) and having different gate oxide thicknesses (increasing…

材料科学 · 物理学 2010-08-19 Raghvendra S. Saxena , M. Jagadesh Kumar

We describe a Monte Carlo simulation study of the magnetic phase diagram of diluted magnetic semiconductors doped with shallow impurities in the low concentration regime. We show that because of a wide distribution of interaction strengths,…

无序系统与神经网络 · 物理学 2015-06-25 R. N. Bhatt , Xin Wan

In this paper we have developed a two dimensional (2D) analytical model for surface potential and drain current for a long channel Dual Material Gate (DMG) Silicon-on-Insulator (SOI) Tunneling Field Effect Transistor (TFET). This model…

介观与纳米尺度物理 · 物理学 2014-05-27 Rajat Vishnoi , M. Jagadesh Kumar
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