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We present a data-calibrated compact model of carbon nanotube (CNT) field-effect transistors (CNFETs) including contact resistance, direct source-to-drain and band-to-band tunneling currents. The model captures the effects of dimensional…

介观与纳米尺度物理 · 物理学 2015-10-28 Chi-Shuen Lee , Eric Pop , Aaron D. Franklin , Wilfried Haensch , H. -S. Philip Wong

Monolayer molybdenum disulfide (MoS$_2$) nanosheets, obtained via chemical vapor deposition onto SiO$_2$/Si substrates, are exploited to fabricate field-effect transistors with n-type conduction, high on/off ratio, steep subthreshold slope…

In this paper, we have presented the impact of the gate leakage through thin gate dielectrics (SiO2 and high-\k{appa} gate dielectric) on the subthreshold characteristics of the tunnel field effect transistors (TFET) for a low operating…

介观与纳米尺度物理 · 物理学 2014-06-06 Poornendu Chaturvedi , M. Jagadesh Kumar

In semiconductor electronics, the field-effect refers to the control of electrical conductivity in nanoscale devices, which underpins the field-effect transistor, one of the cornerstones of present-day semiconductor technology. The effect…

介观与纳米尺度物理 · 物理学 2021-06-09 Ilia Golokolenov , Andrew Guthrie , Sergey Kafanov , Yuri Pashkin , Viktor Tsepelin

Dual-material double-gate tunnel field effect transistor (DMDG TFET) is a promising candidate for low-power, high-speed electronics due to enhanced electrostatic control and superior switching characteristics. Integrating a pocket region…

应用物理 · 物理学 2025-06-11 Ramisa Fariha , Saikat Das , Labiba Tanjil Nida , Abeer Khan , Md Tashfiq Bin Kashem

The application of a gate voltage to control the superconducting current flowing through a nanoscale superconducting constriction, named as gate-controlled supercurrent (GCS), has raised great interest for fundamental and technological…

Nano-membrane tri-gate beta-gallium oxide (\b{eta}-Ga2O3) field-effect transistors (FETs) on SiO2/Si substrate fabricated via exfoliation have been demonstrated for the first time. By employing electron beam lithography, the minimum-sized…

应用物理 · 物理学 2022-01-05 Hagyoul Bae , Tae Joon Park , Jinhyun Noh , Wonil Chung , Mengwei Si , Shriram Ramanathan , Peide D. Ye

As we move beyond the era of transistor miniaturization, back-end-of-line-compatible transistors that can be stacked monolithically in the third dimension promise improved performance for low-power electronics. In advanced transistor…

The scaling behaviors of graphene nanoribbon (GNR) Schottky barrier field-effect transistors (SBFETs) are studied by solving the non-equilibrium Green's function (NEGF) transport equation in an atomistic basis set self-consistently with a…

介观与纳米尺度物理 · 物理学 2009-11-13 Yijian Ouyang* , Youngki Yoon* , Jing Guo

Traditional transistors based on complementary metal-oxide-semiconductor (CMOS) and metal-oxide-semiconductor field-effect transistors (MOSFETs) are facing significant limitations as device scaling reaches the limits of Moore's Law. These…

应用物理 · 物理学 2024-09-30 Chloe Isabella Tsang , Haihui Pu , Junhong Chen

A common issue in low temperature measurements of enhancement-mode metal-oxide-semiconductor (MOS) field-effect transistors (FETs) in the low electron density regime is the high contact resistance dominating the device impedance. In that…

介观与纳米尺度物理 · 物理学 2011-10-10 Laurens H. Willems Van Beveren , Kuan Y. Tan , Nai-Shyan Lai , Oleh Klochan , Andrew S. Dzurak , Alex R. Hamilton

The electrical and optical response of a field-effect device comprising a network of semiconductor-enriched single-wall carbon nanotubes, gated with sodium chloride solution is investigated. Field-effect is demonstrated in a device that…

介观与纳米尺度物理 · 物理学 2010-09-24 Manu Jaiswal , C. S. Suchand Sangeeth , Wei Wang , Ya-Ping Sun , Reghu Menon

High performance p- and n-type single-walled carbon nanotube (SWNT) field-effect transistors (FETs) are obtained by using high and low work function metals, Pd and Al as source/drain (S/D) electrodes respectively. Ohmic contacts made to…

介观与纳米尺度物理 · 物理学 2007-05-23 Ali Javey , Qian Wang , Woong Kim , Hongjie Dai

We investigate by low-temperature transport experiments the sub-threshold behavior of triple-gate silicon field-effect transistors. These three-dimensional nano-scale devices consist of a lithographically defined silicon nanowire surrounded…

介观与纳米尺度物理 · 物理学 2009-11-11 H. Sellier , G. P. Lansbergen , J. Caro , N. Collaert , I. Ferain , M. Jurczak , S. Biesemans , S. Rogge

Most carbon nanotube field-effect transistors (CNTFETs) directly attach metal source/drain contacts to an intrinsic nanotube channel. When the gate oxide thickness is reduced, such transistors display strong ambipolar conduction, even when…

介观与纳米尺度物理 · 物理学 2007-05-23 Jing Guo , Ali Javey , Hongjie Dai , Supriyo Datta , Mark Lundstrom

In this paper, we demonstrate by simulation the general usability of an electrostatically doped and electrically reconfigurable planar field-effect transistor (FET) structure. The device concept is partly based on our already published and…

材料科学 · 物理学 2014-05-30 Tillmann Krauss , Frank Wessely , Udo Schwalke

The performance and scalability of two-dimensional (2D) field-effect transistors (FETs) are strongly influenced by geometry-defined electrostatics. In most 2D FET studies, the gate overlaps with the source and drain electrodes, allowing the…

We investigate the operation of dual-gate reconfigurable field-effect transistor (RFET) in the programgate at drain (PGAD) and program-gate at source (PGAS) configurations. To this end, dual-gate silicon nanowire (SiNW) FETs are fabricated…

In this paper, we present the unique features exhibited by modified asymmetrical Double Gate (DG) silicon on insulator (SOI) MOSFET. The proposed structure is similar to that of the asymmetrical DG SOI MOSFET with the exception that the…

介观与纳米尺度物理 · 物理学 2010-08-19 G. Venkateshwar Reddy , M. Jagadesh Kumar1

An evaluation of the gate capacitance of a field-effect transitor (FET) whose channel length and width are several ten nanometer, is a key point for sensors applications. However, experimental and precise evaluation of capacitance in the aF…

介观与纳米尺度物理 · 物理学 2011-09-16 Nicolas Clement , Katsuhiko Nishiguchi , Akira Fujiwara , Dominique Vuillaume