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相关论文: First Experimental Demonstration of Gate-all-aroun…

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In this paper, we have experimentally demonstrated, for the first time, III-V 4D transistors with vertically stacked InGaAs nanowire (NW) channels and gate-all-around (GAA) architecture. Novel process technology enabling the transition from…

介观与纳米尺度物理 · 物理学 2012-12-19 J. J. Gu , X. W. Wang , J. Shao , A. T. Neal , M. J. Manfra , R. G. Gordon , P. D. Ye

High performance InGaAs gate-all-around (GAA) nanowire MOSFETs with channel length (Lch) down to 20nm have been fabricated by integrating a higher-k LaAlO3-based gate stack with an equivalent oxide thickness of 1.2nm. It is found that…

介观与纳米尺度物理 · 物理学 2015-06-15 Jiangjiang J. Gu , Xinwei Wang , Heng Wu , Roy G. Gordon , Peide D. Ye

In this paper, 20nm - 80nm channel length (Lch) InGaAs gate- all-around (GAA) nanowire MOSFETs with record high on- state and off-state performance have been demonstrated by equivalent oxide thickness (EOT) and nanowire width (WNW) scaling…

介观与纳米尺度物理 · 物理学 2012-12-19 J. J. Gu , X. W. Wang , H. Wu , J. Shao , A. T. Neal , M. J. Manfra , R. G. Gordon , P. D. Ye

InGaAs gate-all-around nanowire MOSFETs with channel length down to 50nm have been experimentally demonstrated by top-down approach. The nanowire size-dependent transport properties have been systematically investigated. It is found that…

介观与纳米尺度物理 · 物理学 2015-06-04 Jiangjiang J. Gu , Heng Wu , Yiqun Liu , Adam T. Neal , Roy G. Gordon , Peide D. Ye

Gate-all-around (GAA) nanowire (NW) field-effect transistor (FET) is a promising device architecture due to its superior gate controllability than that of the conventional FinFET architecture. The significantly higher electron mobility of…

材料科学 · 物理学 2023-10-18 Linqiang Xu , Lianqiang Xu , Qiuhui Li , Shibo Fang , Ying Li , Ying Guo , Aili Wang , Ruge Quhe , Yee Sin Ang , Jing Lu

We demonstrate atomic-layer-deposited (ALD) high-k dielectric integration on two-dimensional (2D) layer-structured molybdenum disulfide (MoS2) crystals and MoS2 dual-gate n-channel MOSFETs with ALD Al2O3 as top-gate dielectric. Our C-V…

材料科学 · 物理学 2013-12-04 Han Liu , Peide D. Ye

In this work, we demonstrate atomic-layer-deposited (ALD) single-channel indium oxide (In2O3) gate-all-around (GAA) nanoribbon FETs in a back-end-of-line (BEOL) compatible process. A maximum on-state current (ION) of 19.3 mA/{\mu}m (near 20…

Nano-membrane tri-gate beta-gallium oxide (\b{eta}-Ga2O3) field-effect transistors (FETs) on SiO2/Si substrate fabricated via exfoliation have been demonstrated for the first time. By employing electron beam lithography, the minimum-sized…

应用物理 · 物理学 2022-01-05 Hagyoul Bae , Tae Joon Park , Jinhyun Noh , Wonil Chung , Mengwei Si , Shriram Ramanathan , Peide D. Ye

We report Beta-AlGaO/Ga2O3 tri-gate heterostructure MOSHEMTs incorporating a thin 5 nm Al2O3 gate oxide layer for improved gate control and reduced leakage. The devices were fabricated on AlGaO/GaO heterostructures grown by ozone MBE on…

材料科学 · 物理学 2026-01-21 Noor Jahan Nipu , Chinmoy Nath Saha , Uttam Singisetti

This paper presents a self-consistent numerical model for calculating the charge profile and gate capacitance and therefore obtaining C-V characterization for a gate-all-around graded nanowire MOSFET with a high mobility axially graded…

This letter reports high-performance $\mathrm{\beta} Ga2O3 thin channel MOSFETs with T-gate and degenerately doped source/drain contacts regrown by MOCVD. Gate length scaling (LG= 160-200 nm) leads to a peak drain current (ID,MAX) of 285…

As we move beyond the era of transistor miniaturization, back-end-of-line-compatible transistors that can be stacked monolithically in the third dimension promise improved performance for low-power electronics. In advanced transistor…

In this work, quantum ballistic simulation study of a III-V tri-gate MOSFET has been presented. At the same time, effects of device parameter variation on ballistic, subthrshold and short channel performance is observed and presented. The…

计算物理 · 物理学 2018-02-27 Kanak Datta , Quazi D. M. Khosru

We introduce a fabrication method for gate-all-around nanowire field-effect transistors. Single nanowires were aligned perpendicular to underlying bottom gates using a resist-trench alignment technique. Top gates were then defined aligned…

An analysis of recent experimental data for high-performance In0.7Ga0.3As high electron mobility transistors (HEMTs) is presented. Using a fully quantum mechanical, ballistic model, we simulate In0.7Ga0.3As HEMTs with gate lengths of LG =…

介观与纳米尺度物理 · 物理学 2015-05-13 Neophytos Neophytou , Titash Rakshit , Mark S. Lundstrom

Silicon photonics is a rapidly developing technology that promises to revolutionize the way we communicate, compute, and sense the world. However, the lack of highly scalable, native CMOS-integrated light sources is one of the main factors…

In this letter, fin-shape tri-gate $\beta$-Ga$_{2}$O$_{3}$ lateral MESFETs are demonstrated with a high power figure of merit of 0.95 GW/cm$^{2}$ - a record high for any $\beta$-Ga$_{2}$O$_{3}$ transistor to date. A low-temperature undoped…

We investigate the performance of gate-defined devices fabricated on high mobility InAs metamorphic heterostructures. We find that heterostructures capped with In$_{0.75}$Ga$_{0.25}$As often show signs of parallel conduction due to…

介观与纳米尺度物理 · 物理学 2015-06-22 J. Shabani , A. P. McFadden , B. Shojaei , C. J. Palmstrøm

In this paper, we have worked out a pseudo two dimensional (2D) analytical model for surface potential and drain current of a long channel p-type Dual Material Gate (DMG) Gate All-Around (GAA) nanowire Tunneling Field Effect Transistor…

介观与纳米尺度物理 · 物理学 2014-06-23 Rajat Vishnoi , M. Jagadesh Kumar

We report the operation of a field-effect transistor based on a single InAs nanowire gated by an ionic liquid. Liquid gating yields very efficient carrier modulation with a transconductance value thirty time larger than standard back gating…

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