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相关论文: Silicon dry oxidation kinetics at low temperature …

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The thermal growth of silicon oxide films on Si in dry O2 is modelled as a dynamical system, assuming that it is basically a diffusion-reaction phenomenon. Relevant findings of the last decade are incorporated, as structure and composition…

材料科学 · 物理学 2009-10-31 R. M. C. de Almeida , S. Goncalves , I. J. R. Baumvol , F. C. Stedile

Silicon nanowires have attracted considerable interest due to their wide-ranging applications in nanoelectromechanical systems and nanoelectronics. Molecular dynamics simulations are powerful tools for studying the mechanical properties of…

材料科学 · 物理学 2023-08-25 Sina Zare Pakzad , Mohammad Nasr Esfahani , B. Erdem Alaca

In-depth understanding of the retarded oxidation phenomenon observed during the oxidation of silicon nanostructures is proposed. The wet thermal oxidation of various silicon nanostructures such as nanobeams, concave/convex nanorings and…

材料科学 · 物理学 2012-07-11 C. Krzeminski , X. -L. Han , G. Larrieu

Self-limiting oxidation of nanowires has been previously described as a reaction- or diffusion-controlled process. In this letter, the concept of finite reactive region is introduced into a diffusion-controlled model, based upon which a…

材料科学 · 物理学 2019-11-21 Mingchao Liu , Peng Jin , Zhiping Xu , Dorian A. H. Hanaor , Yixiang Gan , Changqing Chen

We present a generalized mathematical model for thermal oxidation and the growth kinetics of oxide films. The model expands long-standing classical models by taking into account the reaction occurring at the interface as well as transport…

化学物理 · 物理学 2018-08-03 Zhijie Xu , Kevin M. Rosso , Stephen M. Bruemmer

Silicon together with its native oxide SiO$_2$ was recognized as an outstanding material system for the semiconductor industry in the 1950s. In state-of-the-art device technology, SiO$_2$ is widely used as an insulator in combination with…

The synthesis of Si3N4 nanowires from the reaction of silicon nanoparticles with N2 in the 1200-1440 C temperature range is reported. The nitridation conditions are such that the reaction with nitrogen is favoured by the presence of silicon…

材料科学 · 物理学 2008-11-24 J. Farjas , A. Pinyol , Chandana Rath , P. Roura , E. Bertran

The doping dependence of dry thermal oxidation rates in n-type 4H-SiC was investigated. The oxidation was performed in the temperature range 1000C to 1200C for samples with nitrogen doping in the range of 6.5e15/cm3 to 9.3e18/cm3, showing a…

材料科学 · 物理学 2015-05-20 B. K. Daas , M. M. Islam , I. A. Chowdhury , F. Zhao , T. S. Sudarshan , M. V. S. Chandrashekhar

We study the formation of nanometer thick oxide layers around nanoparticles (plateaus) in a wet nitrogen environment over 32 days. We determine both the plateau height and the lateral force needed to remove the particles with an atomic…

材料科学 · 物理学 2019-02-13 Clara C. Wanjura , Daniel Geiger , Irina Schrezenmeier , Matthias Roos , Othmar Marti

Coherent grazing-incidence small-angle X-ray scattering is used to investigate the average kinetics and the fluctuation dynamics during self-organized nanopatterning of silicon by Ar$^+$ bombardment at 65$^{\circ}$ polar angle. At early…

Silicon, despite its abundance and high energy density, remains underexplored as a carbon-free fuel, with limited data available on its combustion characteristics. In this work, the combustion behaviour of silicon particles is examined…

应用物理 · 物理学 2025-09-30 Herman , Heng , Hugo Keck , Christian Chauveau , Samuel Goroshin , Jeffrey Bergthorson , Fabien Halter

We derive reduced finite dimensional ODE models starting from one dimensional lubrication equations describing coarsening dynamics of droplets in nanometric polymer film interacting on a hydrophobically coated solid substrate in the…

偏微分方程分析 · 数学 2019-02-20 Georgy Kitavtsev

The thermal characteristics of silicon between 15 and 300 deg K are investigated by applying a computer program on the solution of the differential heat diffusion equation. The computer model is linked to high-purity silicon through a set…

材料科学 · 物理学 2007-08-31 H. Diedrich , R. Liberati

The deformation kinetics for glassy solid helium confined in microscopic domain at very low temperature regime was investigated using a transition-rate model considering the shear thinning behavior which means, once material being subjected…

综合物理 · 物理学 2009-04-09 Zotin K. -H. Chu

The formation of a hydroxylated native oxide layer on Si(001) under wet conditions is studied by means of first principles molecular dynamics simulations. Water molecules are found to adsorb and dissociate on the oxidised surface leading to…

材料科学 · 物理学 2009-04-15 Lucio Colombi Ciacchi , Daniel J. Cole , Mike C. Payne , Peter Gumbsch

This paper presents a modeling study of the oxidation of cyclohexane from low to intermediate temperature (650-1050 K), including the negative temperature coefficient (NTC) zone. A detailed kinetic mechanism has been developed using…

Using molecular dynamics simulations we investigate the relaxation dynamics of a supercooled liquid close to a rough as well as close to a smooth wall. For the former situation the relaxation times increase strongly with decreasing distance…

统计力学 · 物理学 2009-11-07 Peter Scheidler , Walter Kob , Kurt Binder

Molecular dynamic (MD) simulations are applied to investigate the dependency of the kinetic friction coefficient on the temperature at the nano-scale. The system is comprised of an aluminum spherical particle consisting of 32000 atoms in an…

数据分析、统计与概率 · 物理学 2023-11-08 Rasoul Kheiri , Alexey A Tsukanov

The oxygen and silicon dynamics in silica is compared via computer simulations. In agreement with experimental data and previous simulations a decoupling of oxygen and silicon dynamics is observed upon cooling. The origin of this decoupling…

无序系统与神经网络 · 物理学 2009-11-11 A. Saksaengwijit , A. Heuer

Analysis of lithiation and delithiation kinetics in pulse-laser-deposited crystalline thin-film silicon (Si) electrodes is presented. Data from open-circuit relaxation experiments are used in conjunction with a model based on Tafel kinetics…

材料科学 · 物理学 2013-01-04 Vijay A. Sethuraman , Venkat Srinivasan , John Newman
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