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相关论文: STM and RHEED study of the Si(001)-c(8x8) surface

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The Si(001) surface subjected to different treatments in ultrahigh vacuum molecular beam epitaxy chamber for SiO$_2$ film decomposition has been in situ investigated by reflected high energy electron diffraction (RHEED) and high resolution…

材料科学 · 物理学 2010-11-23 L. V. Arapkina , V. A. Yuryev , V. M. Shevlyuga , K. V. Chizh

The reconstructions of the InP(001) surface prepared by molecular beam epitaxy have been studied with in situ reflection high-energy electron diffraction (RHEED) and scanning tunneling microscopy (STM). The growth chamber contains a highly…

介观与纳米尺度物理 · 物理学 2015-03-16 V. P. LaBella , Z. Ding , D. W. Bullock , C. Emery , P. M. Thibado

Pre-growth preparation of the Si(001) clean surface is a key process for Ge/Si UHV MBE. It usually includes pre-cleaning by liquid etchants, thermal pretreatment in UHV and removal of SiO2 or a different protective coat prior to MBE.…

材料科学 · 物理学 2011-05-18 L. V. Arapkina , V. A. Yuryev , K. V. Chizh , V. M. Shevlyuga , M. S. Storojevyh , L. A. Krylova

Structure of the Ga-stabilized GaAs(001)-c(8x2) surface has been studied using rocking-curve analysis of reflection high-energy electron diffraction (RHEED). The c(8x2) structure emerges at temperatures higher than 600C, but is unstable…

化学物理 · 物理学 2009-11-07 Akihiro Ohtake , Shiro Tsukamoto , Markus Pristovsek , Nobuyuki Koguchi , Masashi Ozeki

The c(6x2) is a reconstruction of the SrTiO3(001) surface that is formed between 1050-1100oC in oxidizing annealing conditions. This work proposes a model for the atomic structure for the c(6x2) obtained through a combination of results…

A clean Si(001) surface thermally purified in an ultrahigh vacuum molecular-beam epitaxy chamber has been investigated by means of scanning tunneling microscopy. The morphological peculiarities of the Si(001) surface have been explored in…

材料科学 · 物理学 2010-03-16 L. V. Arapkina , V. M. Shevlyuga , V. A. Yuryev

We present a study of the rubidium adsorption on the Si(111)-(7x7) surface and the related Rb-induced reconstructions as a function of deposition temperature and Rb-coverage via scanning tunneling microscopy (STM) and low-energy electron…

材料科学 · 物理学 2022-01-04 Letizia Ferbel , Stefano Veronesi , Stefan Heun

Using low energy electron diffraction (LEED), Auger electron spectroscopy (AES), scanning tunnelling microscopy (STM) and high resolution photo-electron spectroscopy (HR-PES) techniques we have studied the annealing effect of one silicon…

材料科学 · 物理学 2013-03-20 B. Lalmi , C. Girardeaux , A. Portavoce , C. Ottaviani , B. Aufray , J. Bernardini

The structure of the Fe3O4(110)-(1x3) surface was studied with scanning tunneling microscopy (STM), low-energy electron diffraction (LEED), and reflection high energy electron diffraction (RHEED). The so-called one-dimensional…

The (001) surfaces of cubic SiC were investigated with ab-initio molecular dynamics simulations. We show that C-terminated surfaces can have different c(2x2) and p(2x1) reconstructions, depending on preparation conditions and thermal…

mtrl-th · 物理学 2009-10-30 A. Catellani , G. Galli , F. Gygi

Structural properties of the clean Si(001) surface obtained as a result of low-temperature (470--650C) pre-growth annealings of silicon wafers in a molecular-beam epitaxy chamber have been investigated. To decrease the cleaning temperature,…

材料科学 · 物理学 2012-07-09 L. V. Arapkina , L. A. Krylova , K. V. Chizh , V. A. Chapnin , O. V. Uvarov , V. A. Yuryev

We show that reflection high-energy electron diffraction (RHEED) can be used as a highly sensitive tool to track surface and resulting film stoichiometry in adsorption-limited molecular beam epitaxy of (001) SrTiO3 thin films. Even under…

材料科学 · 物理学 2015-03-17 Adam P. Kajdos , Susanne Stemmer

Using low energy electron diffraction (LEED), scanning tunnelling microscopy (STM) and x-ray absorption spectroscopy (XAS) techniques, we have studied the first steps of silicon adsorption onto Cu (001) single crystal substrate. For low…

材料科学 · 物理学 2015-06-16 B. Lalmi , M. Chorro , R. Belkhou

As-rich GaAs (001) surfaces are successfully observed during As4-irradition by a system in which scanning tunneling microscopy (STM) and molecular beam epitaxy can be performed simultaneously. With a substrate temperature of 440 C and an…

The tensile strained Si(111) layers grown on top of Ge(111) substrates are studied by combining scanning tunneling microscopy, low energy electron diffraction and first-principles calculations. It is shown that the layers exhibit c(2x4)…

材料科学 · 物理学 2017-09-04 R. Zhachuk , J. Coutinho , A. Dolbak , V. Cherepanov , B. Voigtländer

The peculiarities of superstructural transition (2x4) -> (3x1(6)) on the GaAs(001) surface were studied by the RHEED method in the conditions initiated by a sharp change of the arsenic flux. The specular beam intensities RHEED picture…

材料科学 · 物理学 2018-03-12 A. V. Vasev , M. A. Putyato , V. V. Preobrazhenskii

Ga-rich GaAs (001) surfaces are successfully observed during high-temperature annealing by scanning tunneling microscopy (STM). With a substrate temperature of 550 C, reflection high-energy diffraction patterns and reflectance anisotropy…

原子与分子团簇 · 物理学 2007-05-23 Shiro Tsukamoto , Markus Pristovsek , Bradford G. Orr , Akihiro Ohtake , Gavin R. Bell , Nobuyuki Koguchi

The adsorption of CO molecules at the Ca3Ru2O7(001) surface was studied using low-temperature scanning tunneling microscopy (STM) and density functional theory (DFT). Ca3Ru2O7 can be easily cleaved along the (001) plane, yielding a smooth,…

Recent experimental studies have shown that well-annealed, unstrained Si(105) surfaces appear disordered and atomically rough when imaged using scanning tunnelling microscopy (STM). We construct new models for the Si(105) surface that are…

凝聚态物理 · 物理学 2009-11-10 C. V. Ciobanu , V. B. Shenoy , C. Z. Wang , K. M. Ho

The Te-covered Si(111) surface has received recent interest as a template for the epitaxy of van der Waals (vdW) materials, e.g. Bi$_2$Te$_3$. Here, we report the formation of a Te buffer layer on Si(111)$-$(7$\times$7) by low-energy…

介观与纳米尺度物理 · 物理学 2024-01-30 Felix Lüpke , Jiří Doležal , Vasily Cherepanov , Ivan Ošt'ádal , F. Stefan Tautz , Bert Voigtländer
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