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相关论文: The energy scale behind the metallic behaviors in …

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We have studied the metallic behaviour in low density GaAs hole systems, and Si electron systems, close to the apparent two-dimensional metal-insulator transition. Two observations suggest a semi-classical origin for the metallic-like…

强关联电子 · 物理学 2009-10-31 A. R. Hamilton , M. Y. Simmons , M. Pepper , D. A. Ritchie

Two phenomena have been recently observed in high-mobility Si MOS structures: (1) strong enhancement of the metallic conduction at low temperatures, T < 2K, and (2) the scaling behavior of the temperature and electric field dependences of…

强关联电子 · 物理学 2008-02-03 V. M. Pudalov

In recent years systematic experimental studies of the temperature dependence of the resistivity in a variety of dilute, ultra clean two dimensional electron/hole systems have revived the fundamental question of localization or,…

无序系统与神经网络 · 物理学 2015-06-24 Alexander Punnoose , Alexander M. Finkel'stein

We calculate the temperature, density, and parallel magnetic field dependence of low temperature electronic resistivity in 2D high-mobility Si/SiGe quantum structures, assuming the conductivity limiting mechanism to be carrier scattering by…

介观与纳米尺度物理 · 物理学 2009-11-11 E. H. Hwang , S. Das Sarma

The resistivities of the dilute, strongly-interacting 2D electron systems in the insulating phase of a silicon MOSFET are the same for unpolarized electrons in the absence of magnetic field and for electrons that are fully spin polarized by…

强关联电子 · 物理学 2017-01-18 Shiqi Li , M. P. Sarachik

This paper reports thermopower and conductivity measurements through the metal-insulator transition for 2-dimensional electron gases in high mobility Si-MOSFETs. At low temperatures both thermopower and conductivity show critical behaviour…

强关联电子 · 物理学 2009-11-07 R. Fletcher , V. M. Pudalov , A. D. B. Radcliffe , C. Possanzini

This letter reports thermopower and conductivity measurements through the metal-insulator transition for 2-dimensional electron gases in high mobility Si-MOSFET's. At low temperatures both thermopower and conductivity show critical behavior…

无序系统与神经网络 · 物理学 2007-05-23 R. Fletcher , V. M. Pudalov , A. D. B. Radcliffe , C. Possanzini

The interplay between strong Coulomb interactions and randomness has been a long-standing problem in condensed matter physics. According to the scaling theory of localization, in two-dimensional systems of noninteracting or weakly…

强关联电子 · 物理学 2007-05-23 S. V. Kravchenko , M. P. Sarachik

Studies of different experimental groups that explore the properties of a two-dimensional electron gas in silicon semiconductor systems ((100) Si metal-oxide-semiconductor field-effect transistors (MOSFETs) and (100) SiGe/Si/SiGe quantum…

强关联电子 · 物理学 2019-10-15 V. T. Dolgopolov

Magnetotransport in 2DES's formed in Si-MOSFET's and Si/SiGe quantum wells at low temperatures is reported. Metallic temperature dependence of resistivity is observed for the n-Si/SiGe sample even in a parallel magnetic field of 9T, where…

强关联电子 · 物理学 2009-10-31 Tohru Okamoto , K. Hosoya , S. Kawaji , A. Yagi , A. Yutani , Y. Shiraki

We have studied the temperature dependence of resistivity, $\rho$, for a two-dimensional electron system in silicon at low electron densities, $n_s\sim10^{11}$ cm$^{-2}$, near the metal/insulator transition. The resistivity was empirically…

凝聚态物理 · 物理学 2007-05-23 S. V. Kravchenko , Whitney E. Mason , G. E. Bowker , J. E. Furneaux , V. M. Pudalov , M. D'Iorio

We have varied the disorder in a two-dimensional electron system in silicon by applying substrate bias. When the disorder becomes sufficiently low, we observe the emergence of the metallic phase, and find evidence for a metal-insulator…

强关联电子 · 物理学 2009-10-30 Dragana Popovic , A. B. Fowler , S. Washburn

In a recent Letter, Kravchenko et al. [cond-mat/9608101] have provided evidence for a metal-insulator transition (MIT) in a two-dimensional electron system (2DES) in Si metal-oxide-semiconductor field-effect transistors (MOSFETs). The…

强关联电子 · 物理学 2008-02-03 K. Ismail , J. O. Chu , Dragana Popovic , A. B. Fowler , S. Washburn

We report measurements of the resistance of silicon MOSFETs as a function of temperature in high parallel magnetic fields where the 2D system of electrons has been shown to be fully spin-polarized. A magnetic field suppresses the metallic…

强关联电子 · 物理学 2009-10-31 K. M. Mertes , Hairong Zheng , S. A. Vitkalov , M. P. Sarachik , T. M. Klapwijk

We argue on the basis of experimental numbers that the B=0 metal-insulator transition in two dimensions, observed in Si-MOSFETs and in other two-dimensional systems, is likely to be due to a few strongly interacting electrons, which also…

介观与纳米尺度物理 · 物理学 2009-10-31 T. M. Klapwijk , S. Das Sarma

The existence of a metal-insulator transition at zero magnetic field in two- dimensional electron systems has recently been confirmed in high mobility Si-MOSFETs. In this work, the temperature dependence of the resistivity of gated…

介观与纳米尺度物理 · 物理学 2009-10-30 J. Lam , M. D'Iorio , D. Brown , H. Lafontaine

We have studied the magnetic and transport properties of an ultra-low-resistivity two-dimensional electron system in a Si/SiGe quantum well. The spin polarization increases linearly with the in-plane magnetic field and the enhancement of…

介观与纳米尺度物理 · 物理学 2009-11-10 Tohru Okamoto , Mitsuaki Ooya , Kunio Hosoya , Shinji Kawaji

The low-temperature resistivity of a SiGe 2-dimensional hole gas has been studied using the gate controlled carrier density as a parameter. A metal-insulator transition is seen both in the temperature and in the electric field behaviour.…

介观与纳米尺度物理 · 物理学 2007-05-23 V. Senz , U. Doetsch , U. Gennser , T. Ihn , T. Heinzel , K. Ensslin , R. Hartmann , D. Gruetzmacher

Metal-oxide-semiconductor field-effect transistors (MOSFET's) using atomic-layer-deposited (ALD) Al$_2$O$_3$ as the gate dielectric are fabricated on the Si/Si$_{1-x}$Ge$_x$ heterostructures. The low-temperature carrier density of a…

介观与纳米尺度物理 · 物理学 2007-05-23 K. Lai , P. D. Ye , W. Pan , D. C. Tsui , S. A. Lyon , M. Muhlberger , F. Schaffler

It is shown that the electronic conduction in silicon-on-insulator (SOI) layers exhibits a metallic regime which is very similar to that in high-mobility Si-metal oxide semiconductor structures (MOS). The peak in the electron mobility…

强关联电子 · 物理学 2007-05-23 G. Brunthaler , A. Prinz , G. Pillwein , P. E. Lindelof , J. Ahopelto
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