通过多临界点淬火及沿无能隙线淬火导致的缺陷产生
统计力学
2015-05-14 v1
摘要
在这篇综述中，我们研究了一维横向场中XY哈密顿量在不同参数线性变化下的淬火动力学，使得系统被驱动穿过各种临界点和无能隙线。观察到缺陷密度随淬火速率呈幂律衰减，其中幂律由底层晶格的维度和与量子临界点相关的临界指数决定，正如Kibble-Zurek标度所预测的那样。然而，我们表明，当系统被驱动穿过多临界点或沿无能隙线时，Kibble-Zurek标度需要修正。我们讨论了上述两种情况下缺陷密度的广义标度形式。
引用
@article{arxiv.0908.4004,
title = {Defect production due to quenching through a multicritical point and along a gapless line},
author = {Uma Divakaran and Victor Mukherjee and Amit Dutta and Diptiman Sen},
journal= {arXiv preprint arXiv:0908.4004},
year = {2015}
}
备注
16 pages, 7 figures, an updated version will be published in "Quantum Quenching, Annealing and Computation", Eds. A. Das, A. Chandra and B. K. Chakrabarti, Lect. Notes in Phys., Springer, Heidelberg (2009, to be published)