关于硫化锡纳米晶薄膜折射率的评论
材料科学
2013-02-19 v1
摘要
本文研究了硫化锡 (SnS) 纳米晶薄膜的折射率。实验数据与折射率的单振子模型吻合良好。基于此，我们将折射率的增加趋势解释为随着晶粒尺寸增大，晶体有序度的改善。
引用
@article{arxiv.1302.3953,
title = {Comments on the Refractive Index of Tin Sulphide Nano-crystalline Thin Films},
author = {Amit Jakhar and Ashu Jamdagni and Ayushi Bakshi and Taruna Verma and Vibhav Shukla and Priyal Jain and Nidhi Sinha and P Arun},
journal= {arXiv preprint arXiv:1302.3953},
year = {2013}
}
备注
Nine figures