相关论文: Comments on the Refractive Index of Tin Sulphide N…
Tin Sulphide is a layered compound which retains its structure when deposited as thin films by thermal evaporation. The films were found to have oriented growth with the direction of orientation changing with film thickness. The film's…
Tin sulphide thin films of p-type conductivity were grown on glass substrates. The refractive index of the as grown films, calculated using both Transmission and ellipsometry data were found to follow the Sellmeier dispersion model. The…
We deposit thin titanium-nitride (TiN) and TiN/Ti/TiN multilayer films on sapphire substrates and measure the reflectance and transmittance in the wavelength range from 400 nm to 2000 nm using a spectrophotometer. The optical constants…
With the rise of AI-assisted materials screening, extraordinary properties are now frequently predicted in experimentally uncharted material systems, highlighting the need to develop new synthesis methods for unconventional materials beyond…
Novel low index (n less than 1.3)/high light trapping cladding films consisting of nanoporous alumina (sapphire), as formed by controlled anodization of aluminum, are described. These films are mechanically hard, intrinsically very…
Brownian thermal noise of thin-film coatings is a fundamental limit for high-precision experiments based on optical resonators such as gravitational-wave interferometers. Here we present the results of a research activity aiming to develop…
Transition metal chalcogenide tin sulfide (SnS) films as alternative noncontact alignment layer for liquid crystals, have been demonstrated and investigated. The SnS has an anisotropic atomic chain structure similar to black Phosphorous…
This paper describes the spherical concave mirror method for measuring the index of refraction of transparent liquids. We derived the refractive index equation using Snell's law and the small-angle approximation. We also verified the…
We developed a phase correction method for broadband terahertz time-domain spectroscopy in reflection geometry, which allows us to obtain quantitative and accurate values for the complex refractive index of materials. The process is…
Determination of refractive index of micro-disks of a calcinated ($1100^\circ$C in air) photo-resist SZ2080$^\mathrm{TM}$ was carried out using transmission and reflection spectroscopy. Interference fringes at specific…
We report on the realization of silicon nitride membranes with enhanced and electrically tunable reflectivity. A subwavelength one-dimensional grating is directly patterned on a suspended 200 nm-thick, high stress commercial film using…
It is shown that reflective laser refractometery at Brewster angle can be usefull for precision measurements of refractive indexes (RI) in the transparency band of various films of nanoscale thickness. The RI measurements of nanoscale…
The plasmonic properties of vacuum evaporated nanostructured gold thin films having different types of nanoparticles are presented. The films with more than 6 nm thickness show presence of nanorods having non cylindrical shape with…
Carbon nanofibers (CNF) are used as components of planar photonic crystals. Square and rectangular lattices and random patterns of vertically aligned CNF were fabricated and their properties studied using ellipsometry. We show that detailed…
Nano-composite films of Tin Sulfide (SnS) and silver (Ag) fabricated by thermal evaporation showed two prominent peaks in the visible region of their extinction spectra. Theoretical modeling of the extinction spectra suggest that these two…
There are two main physical properties needed to fabricate 1D photonic structures and form perfect photonic bandgaps: the quality of the thickness periodicity and the refractive index of their components. Porous silicon (PS) is a…
The race to engineering metamaterials comprising of a negative refractive index in the optical range has been fueled by the realization of negative index materials for GHz frequencies six years ago. Sheer miniaturization of the GHz resonant…
The objective of this work was to study the RF sputtering process parameters optimisation for deposition of Silicon Nitride thin films. The process parameters chosen to be varied were deposition power, deposition duration, flow rate of…
We calculate the index of refraction of sodium matter waves propagating through a gas of nitrogen molecules. We use a recent ab initio potential for the ground state of the NaN_2 Van der Waals complex to perform quantal close-coupling…
Susceptibility measurements of patterned thin films at sub-K temperatures were carried out using a scanning SQUID microscope that can resolve signals corresponding to a few hundred Bohr magnetons. Several metallic and insulating thin films,…