BTeV 硅像素探测器的束流测试结果
高能物理 - 实验
2008-11-26 v1
摘要
报告 BTeV 硅像素探测器在 1999-2000 年于 Fermilab 进行的束流测试结果。探讨了像素探测器随轨迹倾斜角、传感器偏置和读出阈值变化而引起的空间分辨率。
引用
@article{arxiv.hep-ex/0009023,
title = {Beam Test Results of the BTeV Silicon Pixel Detector},
author = {G. Chiodini and J. A. Appel and M. Artuso and J. N. Butler and G. Cardoso and H. Cheung and D. C. Christian and A. Colautti and R. Coluccia and M. Di Corato and E. E. Gottschalk and B. K. Hall and J. Hoff and P. A. Kasper and R. Kutschke and S. W. Kwan and A. Mekkaoui and D. Menasce and C. Newsom and S. Sala and R. Yarema and J. C. Wang and S. Zimmermann},
journal= {arXiv preprint arXiv:hep-ex/0009023},
year = {2008}
}
备注
8 pages of text, 8 figures, Proceedings paper of Pixel 2000: International Workshop on Semiconductor Pixel Detectors for Particles and X-Rays, Genova, June 5-8, 2000