工业生产的GEM箔片制成的径迹探测器的束流性能
仪器与探测器
2009-11-13 v2
摘要
三个有效面积为10 cm x 10 cm、具有二维激光刻蚀正交条读出结构的气体电子倍增器径迹探测器，已在费米实验室介子测试束流设施中进行了广泛的粒子束流测试。这些探测器使用了Tech-Etch公司生产的GEM箔片。它们显示出超过95%的效率以及优于70微米的空间分辨率。详细研究了粒子入射角对效率和空间分辨率的影响。
引用
@article{arxiv.0808.3477,
title = {Beam Performance of Tracking Detectors with Industrially Produced GEM Foils},
author = {Frank Simon and James Kelsey and Michael Kohl and Richard Majka and Miro Plesko and Tai Sakuma and Nikolai Smirnov and Harold Spinka and Bernd Surrow and David Underwood},
journal= {arXiv preprint arXiv:0808.3477},
year = {2009}
}
备注
8 pages, 9 figures, accepted by Nuclear Instruments and Methods in Physics Research A