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相关论文: Resistance and Resistance Fluctuations in Random R…

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We investigate the steady state of a two-dimensional random resistor network subjected to two competing biased percolations as a function of the bias strength. The properties of the linear and nonlinear regimes are studied by means of Monte…

统计力学 · 物理学 2007-05-23 C. Pennetta , E. Alfinito , L. Reggiani

The state of a 2-D random resistor network, resulting from the simultaneous evolutions of two competing biased percolations, is studied in a wide range of bias values. Monte Carlo simulations show that when the external current $I$ is below…

统计力学 · 物理学 2009-11-07 C. Pennetta , L. Reggiani , E. Alfinito , G. Trefan

A short review is presented of a recently developed computational approach which allows the study of the resistance noise over the full range of bias values, from the linear regime up to electrical breakdown. Resistance noise is described…

无序系统与神经网络 · 物理学 2007-05-23 Cecilia Pennetta

We study the distribution of the resistance fluctuations of biased resistor networks in nonequilibrium steady states. The stationary conditions arise from the competition between two stochastic and biased processes of breaking and recovery…

统计力学 · 物理学 2011-02-17 C. Pennetta , E. Alfinito , L. Reggiani , S. Ruffo

We introduce a multi-species network model which describes the resistance fluctuations of a resistor in a non-equilibrium stationary state. More precisely, a thin resistor characterized by a 1/f^alpha resistance noise is described as a…

材料科学 · 物理学 2007-05-23 C. Pennetta , E. Alfinito , L. Reggiani

A new network model is proposed to describe the $1/f^\alpha$ resistance noise in disordered materials for a wide range of $\alpha$ values ($0< \alpha < 2$). More precisely, we have considered the resistance fluctuations of a thin resistor…

材料科学 · 物理学 2009-11-13 C. Pennetta , E. Alfinito , L. Reggiani

This article is a mini-review about electrical current flows in networks from the perspective of statistical physics. We briefly discuss analytical methods to solve the conductance of an arbitrary resistor network. We then turn to basic…

统计力学 · 物理学 2007-10-08 S. Redner

We study the resistance fluctuation distribution of a thin film near electrical breakdown. The film is modeled as a stationary resistor networkunder biased percolation. Depending on the value of the external current,on the system sizes and…

凝聚态物理 · 物理学 2009-11-10 C. Pennetta , E. Alfinito , L. Reggiani , S. Ruffo

We study the distribution of resistance fluctuations of conducting thin films with different levels of internal disorder. The film is modeled as a resistor network in a steady state determined by the competition between two biased…

无序系统与神经网络 · 物理学 2009-11-10 C. Pennetta , E. Alfinito , L. Reggiani , S. Ruffo

The Random Resistor cum Tunneling Network (RRTN) model was proposed from our group by considering an extra phenomenological (semi-classical) tunneling process into a classical RRN bond percolation model. We earlier reported about…

无序系统与神经网络 · 物理学 2021-05-21 Somnath Bhattacharya

We investigated the 1/f noise of Pt/NiO/Pt capacitors that show unipolar resistance switching. When they were switched from the low to high resistance states, the power spectral density of the voltage fluctuation was increased by…

材料科学 · 物理学 2015-05-13 S. B. Lee , S. Park , J. S. Lee , S. C. Chae , S. H. Chang , M. H. Jung , Y. Jo , B. Kahng , B. S. Kang , M. -J. Lee , T. W. Noh

Numerically we study the bulk current relaxation in percolative Random Resistor cum Tunneling Network (RRTN) model through a first-passage route. The RRTN considers an extra semi-classical barrier-crossing process over a voltage threshold…

无序系统与神经网络 · 物理学 2021-05-21 Somnath Bhattacharya

We study nonlinear random resistor diode networks at the transition from the non percolating to the directed percolating phase. The resistor-like bonds and the diode-like bonds under forward bias voltage obey a generalized Ohm's law, $V…

统计力学 · 物理学 2009-11-07 Olaf Stenull , Hans-Karl Janssen

Shear relaxation and dynamic density fluctuations are studied within a Rouse model, generalized to include the effects of permanent random crosslinks. We derive an exact correspondence between the static shear viscosity and the resistance…

统计力学 · 物理学 2009-10-31 Kurt Broderix , Henning Loewe , Peter Mueller , Annette Zippelius

We study the critical behavior of various geometrical and transport properties of percolation in 6 dimensions. By employing field theory and renormalization group methods we analyze fluctuation induced logarithmic corrections to scaling up…

统计力学 · 物理学 2009-11-10 Olaf Stenull , Hans-Karl Janssen

The degradation of ultrathin oxide layers in the presence of a stress voltage is modeled in terms of two antagonist percolation processes taking place in a random resistor network. The resistance and leakage current fluctuations are studied…

凝聚态物理 · 物理学 2009-11-07 C. Pennetta , L. Reggiani , Gy. Trefan

Tensor networks are employed to characterize the current fluctuations in one-dimensional diffusion-reaction systems. The representative system under study is a semiconducting material where holes and electrons constitute two types of charge…

统计力学 · 物理学 2025-12-16 Jiayin Gu

We study energy flow between two resistors coupled by an arbitrary linear and lossless electric circuit. We show that the fluctuations of energy transferred between the resistors are determined by random scattering of photons on an…

统计力学 · 物理学 2015-08-24 D. S. Golubev , J. P. Pekola

The distribution of resistance fluctuations of conducting thin films with granular structure near electrical breakdown is studied by numerical simulations. The film is modeled as a resistor network in a steady state determined by the…

统计力学 · 物理学 2009-11-10 C. Pennetta , E. Alfinito , L. Reggiani , S. Ruffo

Resistance noise spectroscopy is applied to bulk single crystals of the quasi-two-dimensional organic Mott insulator $\kappa$-(BEDT-TTF)$_2$Cu[N(CN)$_2$]Cl both under moderate pressure and at ambient-pressure conditions. When pressurized,…

超导电性 · 物理学 2009-03-19 Jens Mueller , Jens Brandenburg , John A. Schlueter
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