相关论文: Counterfeit Chip Detection using Scattering Parame…

I investigate the scattering properties of transformation devices as the traditional impedance matching criteria are altered. This is demonstrated using simple theory and augmented by numerical simulations that investigate the role of…

Micron-scale randomness during manufacturing can ensure anti-counterfeiting labels are unclonable. However, this security typically comes at the expense of complex hardware being needed for authentication (e.g., microscopy systems). We…

Reliable hardware connectivity is vital in heterogeneous integrated systems. For example, in digital microfluidics lab-on-a-chip systems, there are hundreds of physical connections required between a micro-electro-mechanical fabricated…

Cyber-Physical Systems (CPS) play a significant role in our critical infrastructure networks from power-distribution to utility networks. The emerging smart-grid concept is a compelling critical CPS infrastructure that relies on two-way…

In recent years, a number of process-based anomaly detection schemes for Industrial Control Systems were proposed. In this work, we provide the first systematic analysis of such schemes, and introduce a taxonomy of properties that are…

Physical side-channel attacks can compromise the security of integrated circuits. Most physical side-channel attacks (e.g., power or electromagnetic) exploit the dynamic behavior of a chip, typically manifesting as changes in current…

Scattering scanning near-field optical microscopy enables optical imaging and characterization of plasmonic devices with nanometer-scale resolution well below the diffraction limit. This technique enables developers to probe and understand…

Electromagnetic (EM) side-channel analysis (SCA) is a prominent tool to break mathematically-secure cryptographic engines, especially on resource-constrained IoT devices. Presently, to perform EM SCA on an embedded IoT device, the entire…

This paper reports a novel approach that uses transistor aging in an integrated circuit (IC) to detect hardware Trojans. When a transistor is aged, it results in delays along several paths of the IC. This increase in delay results in timing…

Counterfeit apps impersonate existing popular apps in attempts to misguide users to install them for various reasons such as collecting personal information, spreading malware, or simply to increase their advertisement revenue. Many…

Embedded digital devices are progressively deployed in dependable or safety-critical systems. These devices undergo significant hardware ageing, particularly in harsh environments. This increases their likelihood of failure. It is crucial…

The counterfeit goods trade represents nowadays more than 3.3% of the whole world trade and thus it's a problem that needs now more than ever a lot of attention and a reliable solution that would reduce the negative impact it has over the…

We present a kernel-level infrastructure that allows system-wide detection of malicious applications attempting to exploit cache-based side-channel attacks to break the process confinement enforced by standard operating systems. This…

Polymer banknotes are the trend for printed currency and have been adopted by more than fifty countries worldwide. However, over the past years, the quantity of polymer counterfeits has been increasing, so has the quality of counterfeits.…

We report on ultrasonic imaging in a random heterogeneous medium. The goal is to detect flaws embedded deeply into a polycrystalline material. A 64-element array of piezoelectric transmitters/receivers at a central frequency of 5 MHz is…

Fingerprint authentication is widely used in biometrics due to its simple process, but it is vulnerable to fake fingerprints. This study proposes a patch-based fake fingerprint detection method using a fully convolutional neural network…

This paper is concerned with the inverse problem of determining the shape of penetrable periodic scatterers from scattered field data. We propose a sampling method with a novel indicator function for solving this inverse problem. This…

We present a simple measurement and analysis technique to determine the fraction of optical loss due to both radiation (scattering) and linear absorption in microphotonic components. The method is generally applicable to optical materials…

Recent progress in fault detection and identification increasingly relies on sophisticated techniques for fault detection, applied through either centralized or distributed approaches. Instead of increasing the sophistication of the fault…

A method of the mid-IR-laser microscopy has been proposed for the investigation of the large-scale electrically and recombination active defects in semiconductors and non-destructive inspection of semiconductor materials and structures in…