相关论文: Counterfeit Chip Detection using Scattering Parame…

Attestation is a strong tool to verify the integrity of an untrusted system. However, in recent years, different attacks have appeared that are able to mislead the attestation process with treacherous practices as memory copy, proxy, and…

We demonstrate chip-scale flat-top filters at near-infrared wavelengths using negative index photonic crystal based Mach Zehnder interferometers. Supported by full three-dimensional numerical simulations, we experimentally demonstrate a new…

Controlling the in-band co-polarization scattering of the antenna while maintaining its radiation performance is crucial for the low observable platform. Thus, this paper studies the in-band co-polarization scattering beam scanning of…

Power-based side-channel is a serious security threat to the System on Chip (SoC). The secret information is leaked from the power profile of the system while a cryptographic algorithm is running. The mitigation requires efforts from both…

Protection of physical objects against counterfeiting is an important task for the modern economies. In recent years, the high-quality counterfeits appear to be closer to originals thanks to the rapid advancement of digital technologies. To…

Industrial Control Systems are under increased scrutiny. Their security is historically sub-par, and although measures are being taken by the manufacturers to remedy this, the large installed base of legacy systems cannot easily be updated…

In this paper, we propose an effective and easily deployable approach to detect the presence of stealthy sensor attacks in industrial control systems, where (legacy) control devices critically rely on accurate (and usually non-encrypted)…

Fingerprint liveness detection systems have been affected by spoofing, which is a severe threat for fingerprint-based biometric systems. Therefore, it is crucial to develop some techniques to distinguish the fake fingerprints from the real…

The presence of any type of defect on the glass screen of smart devices has a great impact on their quality. We present a robust semi-supervised learning framework for intelligent micro-scaled localization and classification of defects on a…

The smart grid concept has transformed the traditional power grid into a massive cyber-physical system that depends on advanced two-way communication infrastructure to integrate a myriad of different smart devices. While the introduction of…

A method of scanning mid-IR-laser microscopy has recently been proposed for the investigation of large-scale electrically and recombination-active defects in semiconductors and non-destructive inspection of semiconductor materials and…

Rapid and reliable detection and identification of unknown chemical substances is critical to homeland security. It is challenging to identify chemical components from a wide range of explosives. There are two key steps involved. One is a…

The power consumption of a microprocessor is a huge channel for information leakage. While the most popular exploitation of this channel is to recover cryptographic keys from embedded devices, other applications such as mobile app…

A growing need exists for efficient and accurate methods for detecting defects in semiconductor materials and devices. These defects can have a detrimental impact on the efficiency of the manufacturing process, because they cause critical…

Solid-state quantum coherent devices are quickly progressing. Superconducting circuits, for instance, have already been used to demonstrate prototype quantum processors comprising a few tens of quantum bits. This development also revealed…

Credit card fraud incurs a considerable cost for both cardholders and issuing banks. Contemporary methods apply machine learning-based classifiers to detect fraudulent behavior from labeled transaction records. But labeled data are usually…

A fundamental pursuit of microwave metrology is the determination of the characteristic impedance profile of microwave systems. Among other methods, this can be practically achieved by means of time-domain reflectometry (TDR) that measures…

We develop two inverse scattering schemes for locating multiple electromagnetic (EM) scatterers by the electric far-field measurement corresponding to a single incident/detecting plane wave. The first scheme is for locating scatterers of…

In the design flow of integrated circuits, chip-level verification is an important step that sanity checks the performance is as expected. Power grid verification is one of the most expensive and time-consuming steps of chip-level…

Electron scattering on liquid samples has been enabled recently by the development of ultrathin liquid sheet technologies. The data treatment of liquid-phase electron scattering has been mostly reliant on methodologies developed for gas…