A random matrix approach to detect defects in a strongly scattering polycrystal: how the memory effect can help overcome multiple scattering
Abstract
We report on ultrasonic imaging in a random heterogeneous medium. The goal is to detect flaws embedded deeply into a polycrystalline material. A 64-element array of piezoelectric transmitters/receivers at a central frequency of 5 MHz is used to capture the Green's matrix in a backscattering configuration. Because of multiple scattering, conventional imaging completely fails to detect the deepest flaws. We utilize a random matrix approach, taking advantage of the deterministic coherence of the backscattered wave-field which is characteristic of single scattering and related to the memory effect. This allows us to separate single and multiple scattering contributions. As a consequence, we show that flaws are detected beyond the conventional limit, as if multiple scattering had been overcome.
Cite
@article{arxiv.1405.6526,
title = {A random matrix approach to detect defects in a strongly scattering polycrystal: how the memory effect can help overcome multiple scattering},
author = {Sharfine Shahjahan and Alexandre Aubry and Fabienne Rupin and Bertrand Chassignole and Arnaud Derode},
journal= {arXiv preprint arXiv:1405.6526},
year = {2015}
}
Comments
11 pages, 4 figures