Reconstructing the Scattering Matrix from Scanning Electron Diffraction Measurements Alone
Computational Physics
2021-06-02 v1 Optimization and Control
Abstract
Three-dimensional phase contrast imaging of multiply-scattering samples in X-ray and electron microscopy is extremely challenging, due to small numerical apertures, the unavailability of wavefront shaping optics, and the highly nonlinear inversion required from intensity-only measurements. In this work, we present a new algorithm using the scattering matrix formalism to solve the scattering from a non-crystalline medium from scanning diffraction measurements, and recover the illumination aberrations. Our method will enable 3D imaging and materials characterization at high resolution for a wide range of materials.
Cite
@article{arxiv.2008.12768,
title = {Reconstructing the Scattering Matrix from Scanning Electron Diffraction Measurements Alone},
author = {Philipp M Pelz and Hamish G Brown and Jim Ciston and Scott D Findlay and Yaqian Zhang and Mary Scott and Colin Ophus},
journal= {arXiv preprint arXiv:2008.12768},
year = {2021}
}