相关论文: Refractive index of nanoscale thickness films meas…

Two methods of refractometry in reflected light from optical surface of samples are considered and studied experimentally. Methods are grounded on results of Fresnel theory of concerning light reflectivity at near normal incidence and…

Studied experimentally the origin of the non-zero reflection of p-polarized radiation (TM) of Brewster's angle. The results have shown the residual reflected light in the vicinity of Brewster angle occurs due to inaccessibility 100%…

A refractometry taking measuring of Brewster angles for birefringent materials is proposed. The technique is based on the angular scanning of the reflected power of p-polarized light and the determination of the two specific minimums at the…

Two approaches (micro- and macro- investigations) are used to determine the dimension dependences of the optical parameters of the nanometer-scale layers of materials. It is shown that both an index of refraction and coefficient of…

Determination of refractive index of micro-disks of a calcinated ($1100^\circ$C in air) photo-resist SZ2080$^\mathrm{TM}$ was carried out using transmission and reflection spectroscopy. Interference fringes at specific…

A novel method is proposed to measure the refractive indices (RIs) of the materials of different transparent solid state media. To exploit the advantage of non-contact measurement laser beam interferometry is used as an effective technique…

The refractive index of single microparticles is derived from precise measurement and rigorous modeling of the stiffness of a laser trap. We demonstrate the method for particles of four different materials with diameters from 1.6 to 5.2…

White light spectral interferometry is applied to measure the refractive index in absorbing liquids in the spectral range from 400 to 1000 nm. We analyze the influence of absorption on the visibility of interferometric fringes and,…

The refractive index of novel organosilica (nano/micro)material is determined using two methods. The first method is based on analysis of optical extinction efficiency of organosilica beads versus wavelength, which is obtained by a standard…

We present a robust, precise, and accurate method to simultaneously measure the refractive indices of two transparent materials within an interference coating. This is achieved by measuring both a photometrically accurate transmittance…

In this work, a refractive index (RI) sensor with an effective integration of colorimetric detection and optical sensing capabilities has been developed. Colorimetric detection relies on the sensitivity of the structural color of photonic…

A method to engineer the refractive indices of functional materials (TiO2, ZnO, SnO2, SiO2), by nanostructuring in the deep sub-wavelength regime (<20nm), is presented. Block-copolymer templating combined with a wet processing route is used…

Specially designed metal-dielectric composites can have a negative refractive index in the optical range. Specifically, it is shown that arrays of single and paired nanorods can provide such negative refraction. For pairs of metal rods, a…

Diffraction of light beams from the phase steps due to the abrupt changes in the boundary of step leads to Fresnel fringes that their visibility and intensity profile depend on the change of the step height or light incident angle. The…

How to make a material anti-reflective without changing its high refraction index? Achieving anti-reflection in high-refractive-index materials poses challenges due to their high reflectivity (Fresnel equations). Based on theory with new…

There are two main physical properties needed to fabricate 1D photonic structures and form perfect photonic bandgaps: the quality of the thickness periodicity and the refractive index of their components. Porous silicon (PS) is a…

We demonstrate aqueous refractive index sensing with 15 to 30 {\mu}m diameter silicon nitride microdisk resonators to detect small concentrations of Li salt. A dimpled-tapered fiber is used to couple 780 nm visible light to the microdisks,…

Here, we present a novel microscopic technique for measuring wavelength-dependent three-dimensional (3-D) distributions of the refractive indices (RIs) of microscopic samples in the visible wavelengths. Employing 3-D quantitative phase…

In semiconductor manufacturing processes, silicon dioxide films are commonly used as barrier layers, insulating layers, and protective layers. Coherence scanning interferometry (CSI) offers thin film thickness measurements with a…

A key optical parameter characterizing the existence of negative refraction in a thin layer of a composite material is the effective refractive index of an equivalent, homogenized layer with the same physical thickness as the initial…