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相关论文: Compact Analytical Model of Dual Material Gate Tun…

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In this paper, we have worked out a pseudo two dimensional (2D) analytical model for surface potential and drain current of a long channel p-type Dual Material Gate (DMG) Gate All-Around (GAA) nanowire Tunneling Field Effect Transistor…

介观与纳米尺度物理 · 物理学 2014-06-23 Rajat Vishnoi , M. Jagadesh Kumar

Dual-material double-gate tunnel field effect transistor (DMDG TFET) is a promising candidate for low-power, high-speed electronics due to enhanced electrostatic control and superior switching characteristics. Integrating a pocket region…

应用物理 · 物理学 2025-06-11 Ramisa Fariha , Saikat Das , Labiba Tanjil Nida , Abeer Khan , Md Tashfiq Bin Kashem

In this paper, we propose the application of a Dual Material Gate (DMG) in a Tunnel Field Effect Transistor (TFET) to simultaneously optimize the on-current, the off-current and the threshold voltage, and also improve the average…

介观与纳米尺度物理 · 物理学 2011-08-17 Sneh Saurabh , M. Jagadesh Kumar

In this paper, we present the unique features exhibited by modified asymmetrical Double Gate (DG) silicon on insulator (SOI) MOSFET. The proposed structure is similar to that of the asymmetrical DG SOI MOSFET with the exception that the…

介观与纳米尺度物理 · 物理学 2010-08-19 G. Venkateshwar Reddy , M. Jagadesh Kumar1

Tunnel field effect transistor (TFET) devices are attractive as they show good scalability and have very low leakage current. However they suffer from low on-current and high threshold voltage. In order to employ the TFET for circuit…

介观与纳米尺度物理 · 物理学 2015-05-19 Sneh Saurabh , M. Jagadesh Kumar

Tunnel Field Effect Transistors (TFET) have extremely low leakage current, exhibit excellent subthreshold swing and are less susceptible to short channel effects. However, TFETs do face certain special challenges, particularly with respect…

介观与纳米尺度物理 · 物理学 2010-10-19 Sneh Saurabh , M. Jagadesh Kumar

In this work, the performance of Tunnel Field-Effect Transistors (TFETs) based on two-dimensional Transition Metal Dichalcogenide (TMD) materials is investigated by atomistic quantum transport simulations. One of the major challenges of…

In this letter we discuss how the short channel behavior in sub 100 nm channel range can be improved by inducing a step surface potential profile at the back gate of an asymmetrical double gate (DG) Silicon-On-Insulator (SOI)…

介观与纳米尺度物理 · 物理学 2010-08-19 M. Jagadesh Kumar , G. V. Reddy

In this paper, a two-dimensional analytical model of a laterally graded-channel triple-metal double-gate Junctionless Field Effect Transistor with hetero dielectric gate oxide stack consisting of SiO$_2$ and HfO$_2$ is derived. The model…

材料科学 · 物理学 2021-09-24 Shib Sankar Das , Barun Majumder , Ankush Ghosh

Traditional transistors based on complementary metal-oxide-semiconductor (CMOS) and metal-oxide-semiconductor field-effect transistors (MOSFETs) are facing significant limitations as device scaling reaches the limits of Moore's Law. These…

应用物理 · 物理学 2024-09-30 Chloe Isabella Tsang , Haihui Pu , Junhong Chen

Tunneling field-effect transistors (TFETs) based on 2D materials are promising steep sub-threshold swing (SS) devices due to their tight gate control. There are two major methods to create the tunnel junction in these 2D TFETs: electrical…

介观与纳米尺度物理 · 物理学 2016-08-30 Hesameddin Ilatikhameneh , Gerhard Klimeck , Joerg Appenzeller , Rajib Rahman

Topological insulator field-effect transistors (TIFETs) built on 2-D quantum spin Hall insulators are being considered as advanced logic transistors due to their potentially superior performance originating from the dissipationless edge…

介观与纳米尺度物理 · 物理学 2026-03-17 Yungyeong Park , Yosep Park , Hyeonseok Choi , Subeen Lim , Dongwook Kim , Yeonghun Lee

A physics-based model for the surface potential and drain current for monolayer transition metal dichalcogenide (TMD) field-effect transistor (FET) is presented. Taking into account the 2D density-of-states of the atomic layer thick TMD and…

介观与纳米尺度物理 · 物理学 2015-06-05 David Jimenez

We present a quasi-analytical model for Tunnel Field Effect Transistors (TFETs) that includes the microscopic physics and chemistry of interfaces and non-idealities. The ballistic band-to-band tunneling current is calculated by modifying…

材料科学 · 物理学 2018-11-14 Sheikh Z. Ahmed , Yaohua Tan , Daniel S. Truesdell , Benton H. Calhoun , Avik W. Ghosh

In this paper, we have presented the impact of the gate leakage through thin gate dielectrics (SiO2 and high-\k{appa} gate dielectric) on the subthreshold characteristics of the tunnel field effect transistors (TFET) for a low operating…

介观与纳米尺度物理 · 物理学 2014-06-06 Poornendu Chaturvedi , M. Jagadesh Kumar

In recent part extensive simulation work has already been done on TFETs. However this is limited to device performance analysis. Evaluation of circuit performance is a topic that is very little touched. This is due to the non availability…

介观与纳米尺度物理 · 物理学 2011-05-26 Rahul Mishra , Bahniman Ghosh

The dielectric engineered tunnel field-effect transistor (DE-TFET) as a high performance steep transistor is proposed. In this device, a combination of high-k and low-k dielectrics results in a high electric field at the tunnel junction. As…

介观与纳米尺度物理 · 物理学 2015-10-23 Hesameddin Ilatikhameneh , Tarek A. Ameen , Gerhard Klimeck , Joerg Appenzeller , Rajib Rahman

Two-dimensional (2D) materials are particularly attractive to build the channel of next-generation field-effect transistors (FETs) with gate lengths below 10-15 nm. Because the 2D technology has not yet reached the same level of maturity as…

介观与纳米尺度物理 · 物理学 2023-10-30 Mathieu Luisier , Cedric Klinkert , Sara Fiore , Jonathan Backman , Youseung Lee , Christian Stieger , Áron Szabó

A new compact modeling approach is presented which describes the full current-voltage (I-V) characteristic of high-performance (aggressively scaled-down) tunneling field-effect-transistors (TFETs) based on homojunction direct-bandgap…

介观与纳米尺度物理 · 物理学 2015-11-02 Ramon B. Salazar , Hesameddin Ilatikhameneh , Rajib Rahman , Gerhard Klimeck , Joerg Appenzeller

We present a scaling theory of two-dimensional (2D) field effect transistors (FETs). For devices with channel thickness less than 4 nm, the device electrostatics is dominated by the physical gate oxide thickness and not the effective oxide…

介观与纳米尺度物理 · 物理学 2021-05-25 Saurabh V. Suryavanshi , Chris D. English , H. -S. P. Wong , Eric Pop
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