对《绘制高度瞬态 EUV 光子诱导等离子体中的电子动力学：一种基于多模微波腔共振光谱的新诊断方法》的补充说明
等离子体物理
2020-05-04 v1
摘要
近期一篇论文（Beckers, J., et al. "Mapping electron dynamics in highly transient EUV photon-induced plasmas: a novel diagnostic approach using multi-mode microwave cavity resonance spectroscopy." Journal of Physics D: Applied Physics 52.3 (2018): 034004.）提出了一种用于电离辐射的在线束流监测新方法。由于后来文章（Platier, B., et al. "Transition from ambipolar to free diffusion in an EUV-induced argon plasma." Applied Physics Letters 116.10 (2020).）中描述并研究了对极紫外光子诱导等离子体余辉的第三种附加衰减机制，该方法生效所需的最少光子数有了额外的依据。在该阈值附近或以下，我们说明该诊断方法的响应时间是限制因素。此外，我们形式化给出了脉冲内光子数的第二个限制，其与高能自由电子的俘获有关。
引用
@article{arxiv.2003.03279,
title = {Addendum to `Mapping electron dynamics in highly transient EUV photon-induced plasmas: a novel diagnostic approach using multi-mode microwave cavity resonance spectroscopy'},
author = {Bart Platier and Ferdi van de Wetering and Mark van Ninhuijs and Seth Brussaard and Vadim Banine and Jom Luiten and Job Beckers},
journal= {arXiv preprint arXiv:2003.03279},
year = {2020}
}
备注
addendum to https://doi.org/10.1088/1361-6463/aaeb17