中文
相关论文

相关论文: Nanoscale Field-Effect Transistors: An Ultimate Si…

200 篇论文

We have performed numerical modeling of dual-gate ballistic n-MOSFET's with channel length of the order of 10 nm, including the effects of quantum tunneling along the channel and through the gate oxide. Our analysis includes a…

介观与纳米尺度物理 · 物理学 2009-10-31 Y. Naveh , K. K. Likharev

We study the channel width scaling of back-gated MoS2 metal-oxide-semiconductor field-effect transistors (MOSFETs) from 2 {\mu}m down to 60 nm. We reveal that the channel conductance scales linearly with channel width, indicating no evident…

介观与纳米尺度物理 · 物理学 2012-09-13 Han Liu , Jiangjiang Gu , Peide Ye

We present a scaling theory of two-dimensional (2D) field effect transistors (FETs). For devices with channel thickness less than 4 nm, the device electrostatics is dominated by the physical gate oxide thickness and not the effective oxide…

介观与纳米尺度物理 · 物理学 2021-05-25 Saurabh V. Suryavanshi , Chris D. English , H. -S. P. Wong , Eric Pop

As metal-oxide-semiconductor field-effect transistors (MOSFET) channel lengths (Lg) are scaled to lengths shorter than Lg<8 nm source-drain tunneling starts to become a major performance limiting factor. In this scenario a heavier transport…

介观与纳米尺度物理 · 物理学 2015-06-15 Saumitra Mehrotra , SungGeun Kim , Tillmann Kubis , Michael Povolotskyi , Mark Lundstrom , Gerhard Klimeck

The scattering effects are studied in nanometer-scaled double-gate MOSFET, using Monte Carlo simulation. The non-equilibrium transport in the channel is analyzed with the help of the spectroscopy of the number of scatterings experienced by…

介观与纳米尺度物理 · 物理学 2007-05-23 J. Saint Martin , A. Bournel , P. Dollfus

Two-dimensional (2D) materials are particularly attractive to build the channel of next-generation field-effect transistors (FETs) with gate lengths below 10-15 nm. Because the 2D technology has not yet reached the same level of maturity as…

介观与纳米尺度物理 · 物理学 2023-10-30 Mathieu Luisier , Cedric Klinkert , Sara Fiore , Jonathan Backman , Youseung Lee , Christian Stieger , Áron Szabó

Traditional transistors based on complementary metal-oxide-semiconductor (CMOS) and metal-oxide-semiconductor field-effect transistors (MOSFETs) are facing significant limitations as device scaling reaches the limits of Moore's Law. These…

应用物理 · 物理学 2024-09-30 Chloe Isabella Tsang , Haihui Pu , Junhong Chen

Two-dimensional (2D) semiconducting transition metal dichalcogenides (TMDs) are good candidates for high-performance flexible electronics. However, most demonstrations of such flexible field-effect transistors (FETs) to date have been on…

An evaluation of the gate capacitance of a field-effect transitor (FET) whose channel length and width are several ten nanometer, is a key point for sensors applications. However, experimental and precise evaluation of capacitance in the aF…

介观与纳米尺度物理 · 物理学 2011-09-16 Nicolas Clement , Katsuhiko Nishiguchi , Akira Fujiwara , Dominique Vuillaume

The latest field-effect transistors are entering the regime where quantum effects within the conduction channel can play a significant role because of the increasingly reduced dimensions. We investigate the effects of quantized states in…

介观与纳米尺度物理 · 物理学 2024-02-06 P. Xu , H. Luo

Ferroelectric field-effect transistors (FeFET) with two-dimensional (2D) semiconductor channels are promising low-power, embedded non-volatile memory (NVM) candidates for next-generation in-memory computing. However, the performance of…

We report the performance of field-effect transistors (FETs), comprised of mono-layer of recently synthesized layered two-dimensional MoSi2N_4 as channel material, using the first principles quantum transport simulations. The devices'…

介观与纳米尺度物理 · 物理学 2022-05-11 Keshari Nandan , Barun Ghosh , Amit Agarwal , Somnath Bhowmick , Yogesh S. Chauhan

Field-effect transistors (FETs) with single gates are adversely affected by short channel effects such as drain-induced barrier lowering (DIBL) and increases in the magnitude of sub-threshold swing as the channel length is reduced.…

材料科学 · 物理学 2026-04-22 Chankeun Yoon , Juhan Ahn , Yuchen Zhou , Jaydeep P. Kulkarni , Ananth Dodabalapur

In this letter we discuss how the short channel behavior in sub 100 nm channel range can be improved by inducing a step surface potential profile at the back gate of an asymmetrical double gate (DG) Silicon-On-Insulator (SOI)…

介观与纳米尺度物理 · 物理学 2010-08-19 M. Jagadesh Kumar , G. V. Reddy

In this article, we investigate electrical transport properties in ultrathin body (UTB) MoS2 two-dimensional (2D) crystals with channel lengths ranging from 2 {\mu}m down to 50 nm. We compare the short channel behavior of sets of MOSFETs…

材料科学 · 物理学 2013-03-05 Han Liu , Adam T. Neal , Peide D. Ye

Scaling transistors' dimensions has been the thrust for the semiconductor industry in the last 4 decades. However, scaling channel lengths beyond 10 nm has become exceptionally challenging due to the direct tunneling between source and…

介观与纳米尺度物理 · 物理学 2016-08-30 Hesameddin Ilatikhameneh , Tarek Ameen , Bozidar Novakovic , Yaohua Tan , Gerhard Klimeck , Rajib Rahman

As silicon transistors scale toward future technology nodes, three-dimensional architectures -- including gate-all-around (GAA) nanoribbon and complementary field-effect transistors (CFETs) -- require channel widths in the tens of…

We report the observation of channel-width dependent enhancement in nanoscale field effect transistors containing lithographically-patterned silicon nanowires as the conduction channel. These devices behave as conventional…

其他凝聚态物理 · 物理学 2008-02-18 Xihua Wang , Yu Chen , Mi K. Hong , Shyamsunder Erramilli , Pritiraj Mohanty

Quantization in the inversion layer and phase coherent transport are anticipated to have significant impact on device performance in 'ballistic' nanoscale transistors. While the role of some quantum effects have been analyzed qualitatively…

介观与纳米尺度物理 · 物理学 2009-11-07 A. Svizhenko , M. P. Anantram , T. R. Govindan , B. Biegel , R. Venugopal

Monolayer molybdenum disulfide (MoS$_2$) nanosheets, obtained via chemical vapor deposition onto SiO$_2$/Si substrates, are exploited to fabricate field-effect transistors with n-type conduction, high on/off ratio, steep subthreshold slope…

‹ 上一页 1 2 3 10 下一页 ›