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相关论文: The difference between Si and Ge(001) surfaces in …

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The results of STM and RHEED studies of a thin Ge film grown on the Si/Si(001) epitaxial layers with different surface relief are presented. Process of the partial stress relaxation was accompanied by changes in the surface structure of the…

This communication covers investigation of the structural properties of surfaces of Si epitaxial layers deposited on different Si(001) vicinal substrates. We have shown processes of generation and growth of surface defects to depend on tilt…

材料科学 · 物理学 2012-07-18 L. V. Arapkina , V. A. Chapnin , K. V. Chizh , L. A. Krylova , V. A. Yuryev

We have studied initial growth of Sn atoms on Ge(001) surfaces at room temperature and 80 K by scanning tunneling microscopy. For Sn deposition onto the Ge(001) substrate at room temperature, the Sn atoms form two kinds of one-dimensional…

材料科学 · 物理学 2007-05-23 K. Tomatsu , K. Nakatsuji , T. Iimori , F. Komori

We have carried out scanning tunneling microscopy experiments under ultrahigh vacuum condition to study the morphology of ultrathin Ge films eposited on pristine Si(100) and ion-irradiated Si(100) self-affine fractal surfaces. The pristine…

材料科学 · 物理学 2009-11-10 D. K. Goswami , K. Bhattacharjee , B. N. Dev

Si/Ge heteroepitaxial dots under tensile strain are grown on nanostructured Ge substrates produced by high-temperature flash heating exploiting the spontaneous faceting of the Ge(001) surface close to the onset of surface melting. A very…

介观与纳米尺度物理 · 物理学 2019-04-18 L. Persichetti , M. Fanfoni , B. Bonanni , M. De Seta , L. Di Gaspare , C. Goletti , L. Ottaviano , A. Sgarlata

Using first-principles calculations within density functional theory, we study the energetics and kinetics of carbon nucleation in the early stages of epitaxial graphene growth on three representative stepped metal surfaces: Ir(111),…

介观与纳米尺度物理 · 物理学 2013-05-29 Hua Chen , Wenguang Zhu , Zhenyu Zhang

With the aim of investigating the possible integration of opto-electronic devices, epitaxial GaN layers have been grown on Si(111) SOI and on Si/CoSi2/Si(111) using metalorganic chemical vapor deposition. The samples are found to possess a…

材料科学 · 物理学 2009-11-11 Shengqiang Zhou , A. Vantomme , B. S. Zhang , H. Yang , M. F. Wu

Self-assembled Ge islands were grown on stripe-patterned Si (001) substrates by solid source molecular beam epitaxy. The surface morphology obtained by atomic force microscopy (AFM) and cross-sectional transmission electron microscopy…

材料科学 · 物理学 2009-11-10 Zhenyang Zhong , A. Halilovic , M. Muhlberger , F. Schaffler , G. Bauer

The materials science of graphene grown epitaxially on the hexagonal basal planes of SiC crystals is reviewed. We show that the growth of epitaxial graphene on Si-terminated SiC(0001) is much different than growth on the C-terminated…

The epitaxial deposition of the first oxide buffer layer (seed layer) on biaxially textured Ni tape for coated conductors is a critical step that is dependent on the atomistic surface condition of the metal. We present a study of the…

超导电性 · 物理学 2007-05-23 C. Cantoni , D. K. Christen , R. Feenstra , A. Goyal , G. W. Ownby , D. M. Zehner , D. P. Norton

Low temperature epitaxial breakdown of inhomogeneously strained Si capping layers is investigated. By growing Si films on coherently strained GeSi quantum dot surfaces, we differentiate effects of surface roughness, strain, and growth…

材料科学 · 物理学 2015-05-28 Christopher W. Petz , Jerrold A. Floro

In general, metal layers cannot be grown epitaxially on Si due to the tendency of metals to react and form a silicide. Even in case the metal layer has a matching lattice symmetry and atomic distance, the Si/metal interface is disturbed by…

Molecular beam epitaxy of Ge (111) thin films on epitaxial-Gd2O3/Si(111) substrates is reported, along with a systematic investigation of the evolution of Ge growth, and structural defects in the grown epilayer. While Ge growth begins in…

We address the stability of the surface phases that occur on the C-side of 3C-SiC($\bar{1} \bar{1} \bar{1}$) at the onset of graphene formation. In this growth range, experimental reports reveal a coexistence of several surface phases. This…

材料科学 · 物理学 2015-05-20 Lydia Nemec , Florian Lazarevic , Patrick Rinke , Matthias Scheffler , Volker Blum

The stability of interfaces and the mechanisms of thin film growth on semiconductors are issues of central importance in electronic devices. These issues can only be understood through detailed study of the relevant microscopic processes.…

mtrl-th · 物理学 2016-09-07 Efthimios Kaxiras

First-principles calculations are used to calculate the strain dependencies of the binding and diffusion-activation energies for Ge adatoms on both Si(001) and Ge(001) surfaces. Our calculations reveal that the binding and activation…

统计力学 · 物理学 2009-11-10 A. van de Walle , M. Asta , P. W. Voorhees

Normal incidence ion irradiation at elevated temperatures, when amorphization is prevented, induces novel nanoscale patterns of crystalline structures on elemental semiconductors by a reverse epitaxial growth mechanism: on Ge surfaces…

介观与纳米尺度物理 · 物理学 2015-06-15 Xin Ou , Adrian Keller , Manfred Helm , Jürgen Fassbender , Stefan Facsko

Although the clean Si(001) and Ge(001) surfaces are very similar, experiments to date have shown that dimer-vacancy (DV) defects self-organize into vacancy lines (VLs) on Si(001), but not on Ge(001). In this paper, we perform…

材料科学 · 物理学 2009-11-10 C. V. Ciobanu , D. T. Tambe , V. B. Shenoy

Si1-xGex/Si1-yGey/Si(100) heterostructures grown by Molecular Beam Epitaxy (MBE) were used in order to study B surface segregation during growth and B lattice diffusion. Ge concentration and stress effects were separated. Analysis of B…

材料科学 · 物理学 2007-05-23 A. Portavoce , P. Gas , I. Berbezier , A. Ronda , J. S. Christensen , B. Svensson

We investigate the growth kinetics on vicinal GaAs(001) surfaces by making detailed comparisons between reflection high--energy electron--diffraction specular intensity measured near in--phase diffraction conditions and the surface step…

凝聚态物理 · 物理学 2009-10-22 Pavel Šmilauer , Dimitri D. Vvedensky
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