相关论文: Stress-strength reliability estimation for type-1 …
One of the important problem in reliability analysis is computation of stress-strength reliability. But it is impractical to compute it in certain situations. So the estimation stay as an alternative solution to get an approximate value of…
In this paper, we study the estimation of $R=P [Y < X ]$, also so-called the stress-strength model, when both $X$ and $Y$ are two independent random variables with the generalized linear failure rate distributions, under different…
In this article, the estimation of reliability of a system is discussed $p(y<x)$ when strength, $X$, and stress, $Y$, are two independent exponential distribution with different scale parameters when the available data are type II Censored…
In this article, inferences about the multicomponent stress strength reliability are drawn under the assumption that strength and stress follow independent Pareto distribution with different shapes $(\alpha_1,\alpha_2)$ and common scale…
This paper deals with the estimation of reliability $R=P(Y<X)$ when $X$ is a random strength of a component subjected to a random stress $Y$ and $(X,Y)$ follows a bivariate Rayleigh distribution. The maximum likelihood estimator of $R$ and…
This article explores the estimation of unknown parameters and reliability characteristics under the assumption that the lifetimes of the testing units follow an Inverted Exponentiated Pareto (IEP) distribution. Here, both point and…
Many modern products exhibit high reliability, often resulting in long times to failure. Consequently, conducting experiments under normal operating conditions may require an impractically long duration to obtain sufficient failure data for…
Accelerated life tests (ALTs) play a crucial role in reliability analyses, providing lifetime estimates of highly reliable products. Among ALTs, step-stress design increases the stress level at predefined times, while maintaining a constant…
One-shot devices analysis involves an extreme case of interval censoring, wherein one can only know whether the failure time is either before or after the test time. Some kind of one-shot devices do not get destroyed when tested, and so can…
The paper addresses the problem of estimation of the model parameters of the logistic exponential distribution based on progressive type-I hybrid censored sample. The maximum likelihood estimates are obtained and computed numerically using…
The log-Lindley distribution was recently introduced in the literature as a viable alternative to the Beta distribution. This distribution has a simple structure and possesses useful theoretical properties relevant in insurance. Classical…
The presence of erratic or unstable paths in standard kinetic Monte Carlo simulations significantly undermines the accurate simulation and sampling of transition pathways. While typically reliable methods, such as the Gillespie algorithm,…
A random graph model with prescribed degree distribution and degree dependent edge weights is introduced. Each vertex is independently equipped with a random number of half-edges and each half-edge is assigned an integer valued weight…
A new probability distribution to study lifetime data in reliability is introduced in this paper. This one is a first approach to a non-homogeneous phase-type distribution. It is built by considering one cut-point in the non-negative…
In this article, we proposed an inverse Lindley distribution and studied its fundamental properties such as quantiles, mode, stochastic ordering and entropy measure. The proposed distribution is observed to be a heavy-tailed distribution…
In the literature, the reliability analysis of one-shot devices is found under accelerated life testing in the presence of various stress factors. The application of one-shot devices can be extended to the bio-medical field, where we often…
Lately, a New Transmuted Logistic-exponential (NTLE) distribution was introduced and studied as an extension of the Logistic-Exponential Distribution (LED) with wider applicability in lifetime modelling. However, the maximum likelihood…
This article aims to introduced a new lifetime distribution named as exponentiated xgamma distribution (EXGD). The new generalization obtained from xgamma distribution, a special finite mixture of exponential and gamma distributions. The…
In this article we consider a simple step stress set up under the cumulative exposure model assumption. At each stress level the lifetime distribution of the experimental units are assumed to follow the generalized exponential distribution.…
Accelerated life-testing (ALT) is a very useful technique for examining the reliability of highly reliable products. It allows testing the products at higher than usual stress conditions to induce failures more quickly and economically than…