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相关论文: Operation and Design of Ferroelectric FETs for a B…

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This paper investigates and compares through a comprehensive TCAD analysis 2D and 3D simulations for ferroelectric based FETs. We provide clear evidence that the multiple read conductance values experimentally observed in FeFETs stem from…

新兴技术 · 计算机科学 2023-08-29 Daniel Lizzit , Thomas Bernardi , David Esseni

Silicon ferroelectric field-effect transistors (FeFETs) with low-k interfacial layer (IL) between ferroelectric gate stack and silicon channel suffers from high write voltage, limited write endurance and large read-after-write latency due…

A memory window of ferroelectric field-effect transistors (FeFETs), defined as a separation of the HIGH-state and the LOW-state threshold voltages, is an important measure of the FeFET memory characteristics. In this study, we theoretically…

应用物理 · 物理学 2022-11-04 Kasidit Toprasertpong , Mitsuru Takenaka , Shinichi Takagi

Intimate integration of memory devices with logic transistors is a frontier challenge in computer hardware. This integration is essential for augmenting computational power concurrently with enhanced energy efficiency in big-data…

In a ferroelectric field effect transistor (FeFET), it is generally assumed that the ferroelectric gate plays a purely electrostatic role. Recently it has been shown that in some cases, which could be called 'active FeFETs', electronic…

材料科学 · 物理学 2018-03-28 Xiaohui Liu , Evgeny Y. Tsymbal , Karin M. Rabe

Ferroelectrics offer a promising materials platform to realize energy-efficient non-volatile memory technology with the FeFET-based implementations being one of the most area-efficient ferroelectric memory architectures. However, the FeFET…

系统与控制 · 电气工程与系统科学 2021-08-30 Jaykumar Vaidya , R S Surya Kanthi , Shamiul Alam , Nazmul Amin , Ahmedullah Aziz , Nikhil Shukla

Tri-gate ferroelectric FETs with Hf0.5Zr0.5O2 gate insulator for memory and neuromorphic applications are fabricated and characterized for multi-level operation. The conductance and threshold voltage exhibit highly linear and symmetric…

应用物理 · 物理学 2020-08-26 Darsen D. Lu , Sourav De , Mohammed Aftab Baig , Bo-Han Qiu , Yao-Jen Lee

This paper provides a brief introduction to the phenomenological aspects of the polarization in ferrroelectric materials, and then an analysis of a few selected topics related to the modelling of ferroelectrics. The description of…

新兴技术 · 计算机科学 2023-11-08 David Esseni , Francesco Driussi , Daniel Lizzit , Marco Massarotto , Mattia Segatto

In this study, we propose a measurement technique for evaluating ferroelectric polarization characteristics in ferroelectric field-effect transistors (FeFETs). Different from standard metal/ferroelectric/metal capacitors, the depletion and…

应用物理 · 物理学 2020-06-17 Kasidit Toprasertpong , Kento Tahara , Mitsuru Takenaka , Shinichi Takagi

We demonstrate ferroelectric (FE) memory transistors on a crystalline silicon channel with endurance exceeding $10^{10}$ cycles. The ferroelectric transistors (FeFETs) incorporate a high-$\kappa$ interfacial layer (IL) of thermally grown…

应用物理 · 物理学 2021-03-17 Ava Jiang Tan , Yu-Hung Liao , Li-Chen Wang , Jong-Ho Bae , Chenming Hu , Sayeef Salahuddin

The ferroelectric field-effect transistor (Fe-FET) is a three-terminal semiconducting device first introduced in the 1950s. Despite its potential, a significant boost in Fe-FET research occurred about ten years ago with the discovery of…

TiO2 ferroelectric field effect transistors (FeFETs) with HfZrO2 (HZO) ferroelectric dielectric layers and bottom gate topology are fabricated for applications in neuromorphic systems. Two sets of devices are fabricated with different gate…

应用物理 · 物理学 2026-05-21 Chandan Samanta , Elia Palmese , Ziyu Ouyang , Tuofu Zhama , Robinson Pino , Yuping Zeng

A Ferroelectric Analog Non-Volatile Memory based on a WOx electrode and ferroelectric HfZrO$_4$ layer is fabricated at a low thermal budget (~375$^\circ$C), enabling BEOL processes and CMOS integration. The devices show suitable properties…

The question whether ferroelectricity (FE) may coexist with a metallic or highly conducting state, or rather it must be suppressed by the screening from the free charges, is the focus of a rapidly increasing number of theoretical studies…

材料科学 · 物理学 2019-02-20 F. Cordero , F. Trequattrini , F. Craciun , H. T. Langhammer , D. A. B. Quiroga , P. S. Silva

The commercialization of non-volatile memories based on ferroelectric transistors (FeFETs) has remained elusive due to scaling, retention, and endurance issues. Thus, it is important to develop accurate characterization tools to quantify…

应用物理 · 物理学 2020-05-15 Nicoló Zagni , Paolo Pavan , Muhammad Ashraful Alam

Ferroelectric field-effect transistors (FeFET) with two-dimensional (2D) semiconductor channels are promising low-power, embedded non-volatile memory (NVM) candidates for next-generation in-memory computing. However, the performance of…

The technological exploitation of ferroelectricity in CMOS electron devices offers new design opportunities, but also significant challenges from an integration, optimization and modelling perspective. We here revisit the working principle…

新兴技术 · 计算机科学 2021-05-04 David Esseni , Riccardo Fontanini , Daniel Lizzit , Marco Massarotto , Francesco Driussi , Mirko Loghi

Physical reservoir computing exploits inherent nonlinearity and short-term memory of physical dynamics to achieve efficient processing of time-series data with extremely-low training cost. In this study, we demonstrate a ferroelectric…

应用物理 · 物理学 2026-02-10 Eishin Nako , Ryosho Nakane , Mitsuru Takenaka , Kasidit Toprasertpong , Shinichi Takagi

The operation of a novel nonvolatile memory device based on a conductive ferroelectric/non-ferroelectric thin film multilayer stack is simulated numerically. The simulation involves the self-consistent steady state solution of Poisson's…

材料科学 · 物理学 2007-05-23 Rene Meyer , Hermann Kohlstedt

Single-port ferroelectric FET (FeFET) that performs write and read operations on the same electrical gate prevents its wide application in tunable analog electronics and suffers from read disturb, especially to the high-threshold voltage…

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