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Pt/Ti metallisation bilayers are used as bottom electrodes for ferroelectric thin films. During deposition of the ferroelectric films, these electrodes are exposed to elevated temperatures causing modifications of the Pt/Ti bottom…

材料科学 · 物理学 2015-02-12 U. Scheithauer , W. Hösler , R. Bruchhaus

Thin film systems are often analysed by using sputter depth profiling. First the sample gets eroded by inert gas ion impact during sputter depth profiling. Then the elemental composition of the freshly unveiled surface is determined by…

仪器与探测器 · 物理学 2017-11-28 Uwe Scheithauer

Auger electron spectroscopy (AES) and electron energy loss spectroscopy (EELS) in a reflection mode are compared as the methods for phase composition investigation of thin film oxide systems by ion profiling. As an example, the Al/Al2O3/Si…

材料科学 · 物理学 2007-05-23 V. G. Beshenkov , V. A. Marchenko , V. T. Volkov , A. G. Znamenskii

Psychological research often involves understanding psychological constructs through conducting factor analysis on data collected by a questionnaire, which can comprise hundreds of questions. Without interactive systems for interpreting…

人机交互 · 计算机科学 2024-08-06 Yikai Lu , Chaoli Wang

Plasma profiling time of flight mass spectrometry (PP-TOFMS) has recently gained interest, as it enables the elemental profiling of semiconductor structures with high depth resolution in short acquisition times. As recently shown by Tempez…

Application of the so called mxing-roughness-information depth (MRI)-model to the quantitative reconstruction of the in-depth distribution of composition is demonstrated by comparing SIMS and AES depth profiles. A GaAs/AlAs reference sample…

材料科学 · 物理学 2007-05-23 S. Hofmann , A. Rar , D. W. Moon , K. Yoshihara

Electron and scanning probe microscopy produce vast amounts of data in the form of images or hyperspectral data, such as EELS or 4D STEM, that contain information on a wide range of structural, physical, and chemical properties of…

机器学习 · 计算机科学 2023-06-09 Arpan Biswas , Maxim Ziatdinov , Sergei V. Kalinin

In order to achieve state-of-the-art performance, modern machine learning techniques require careful data pre-processing and hyperparameter tuning. Moreover, given the ever increasing number of machine learning models being developed, model…

机器学习 · 统计学 2018-05-03 Nicolo Fusi , Rishit Sheth , Huseyn Melih Elibol

We explore the potential of Time-Of-Flight Medium Energy Ion Scattering (TOFMEIS) for thin film analysis and analyze possible difficulties in evaluation of experimental spectra. Issues regarding different combinations of composition and…

The employment of femtosecond pulsed lasers has received significant attention due to its capability to facilitate fabrication of precise patterns at the micro- and nano- lengths scales. A key issue for efficient material processing is the…

材料科学 · 物理学 2022-08-26 George D. Tsibidis , Dimitris Mansour , Emmanuel Stratakis

Modern high-resolution microscopes, such as the scanning tunneling microscope, are commonly used to study specimens that have dense and aperiodic spatial structure. Extracting meaningful information from images obtained from such…

High-dimensional data are crucial in biomedical research. Integrating such data from multiple studies is a critical process that relies on the choice of advanced statistical models, enhancing statistical power, reproducibility, and…

应用统计 · 统计学 2025-06-24 Mavis Liang , Blake Hansen , Alejandra Avalos-Pacheco , Roberta De Vito

Screening methods are useful tools for variable selection in regression analysis when the number of predictors is much larger than the sample size. Factor analysis is used to eliminate multicollinearity among predictors, which improves the…

统计方法学 · 统计学 2025-10-28 Shuntaro Tanaka , Hidetoshi Matsui

The overall quality of multilayer thin films prepared by electrodeposition is strongly influenced by the surface and interface roughness which increases with the layer number. For that very reason the reliable analysis of the first few…

材料科学 · 物理学 2009-02-11 A. Csik , K. Vad , G. A. Langer , G. L. Katona , E. Toth-Kadar , L. Peter

Antiferroelectrics have received blooming interests because of a wide range of potential applications in energy storage, solid-state cooling, thermal switch, transducer, actuation, and memory devices. Many of those applications are the most…

材料科学 · 物理学 2023-12-29 Yangyang Si , Tianfu Zhang , Chenhan Liu , Sujit Das , Bin Xu , Roman G Burkovsky , Xian-Kui Wei , Zuhuang Chen

The structural interface properties of layered Pt/Ti/SiO2/Si electrodes have been investigated using high-resolution specular and diffuse x-ray reflectivity under grazing angles. Currently this multilayer system represents a technological…

材料科学 · 物理学 2007-05-23 M. Aspelmeyer , U. Klemradt , W. Hartner , H. Bachhofer , G. Schindler

Actinide-based compounds exhibit unique physics due to the presence of 5f electrons, and serve in many cases as important technological materials. Targeted thin film synthesis of actinide materials has been successful in generating…

Factor analysis has proven to be a relevant tool for extracting tissue time-activity curves (TACs) in dynamic PET images, since it allows for an unsupervised analysis of the data. Reliable and interpretable results are possible only if…

图像与视频处理 · 电气工程与系统科学 2019-03-27 Yanna Cruz Cavalcanti , Thomas Oberlin , Nicolas Dobigeon , Cédric Févotte , Simon Stute , Maria-Joao Ribeiro , Clovis Tauber

Depth profiling of thin films by inert gas sputtering is one of the most important applications of Auger electron spectroscopy and X-ray photoelectron spectroscopy. Such an analysis monitors the elemental in-depth composition of the thin…

材料科学 · 物理学 2021-01-05 Uwe Scheithauer

A method of using X-ray absorption spectroscopy (XAS) together with resolved grazing incidence geometry for depth profiling atomic, electronic, chemical or magnetic local structures in thin films is presented. The quantitative deconvolution…

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