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相关论文: Analysis of periodic Mo/Si multilayers: influence …

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The amorphous-to-crystalline transition in Al(1.0%wtSi)/Zr and Al(Pure)/Zr multilayers grown by direct-current magnetron sputtering system has been characterized over a range of Al layer thicknesses (1.0-5.0 nm) by using a series of…

This study presents a comprehensive investigation of chemical, structural, and magnetic properties of Ti/Ni multilayer systems with period thicknesses of 4 nm and 10 nm. Particular attention was paid to the characterization of the…

Ti/Cu multilayers with periods ranging from 4 to 52.5 nm were synthesized by magnetron sputtering to examine how the period thickness affects morphology, crystallization, texture development, and preservation of periodicity. The structural…

Understanding the interfacial electrical properties between metallic electrodes and low dimensional semiconductors is essential for both fundamental science and practical applications. Here we report the observation of thickness reduction…

介观与纳米尺度物理 · 物理学 2015-02-17 Song-Lin Li , K. Komatsu , Shu Nakaharai , Yen-Fu Lin , M. Yamamoto , X. F. Duan , K. Tsukagoshi

Molybdenum disulfide (MoS2) of single and few-layer thickness was exfoliated on SiO2/Si substrate and characterized by Raman spectroscopy. The number of S-Mo-S layers of the samples was independently determined by contact-mode atomic-force…

材料科学 · 物理学 2010-11-16 Changgu Lee , Hugen Yan , Louis E. Brus , Tony F. Heinz , James Hone , Sunmin Ryu

To enhance the reflectivity of X-ray mirrors beyond the critical angle, multilayer coatings are required. Interface imperfections in the multilayer growth process are known to cause non-specular scattering and degrade the mirror optical…

光学 · 物理学 2013-04-05 B. Salmaso , D. Spiga , R. Canestrari , L. Raimondi

3R-MoS2, a MoS2 polytype with broken inversion symmetry, enables unique light-matter interactions and is promising for linear and nonlinear integrated photonics beyond the monolayer limit. Yet, systematic studies of its thickness-dependent…

. We focused on the interaction between two ferromagnetic cobalt layers through a non-magnetic titanium layer. The magnetic properties of the structure were characterized by ferromagnetic resonance technique (FMR). The data were collected…

材料科学 · 物理学 2023-07-19 M. Erkovan , S. Tokdemir Ozturk , D. Taskin Gazioglu , R. Topkaya , O. Ozturk

Transition metal dichalcogenides are 2D structures with remarkable electronic, chemical, optical and mechanical properties. Monolayer and crystal properties of these structures have been extensively investigated, but a detailed…

介观与纳米尺度物理 · 物理学 2018-01-18 Y. M. Jaques , P. Manimunda , Y. Nakanishi , S. Susarla , C. F. Woellner , S. Bhowmick , S. A. S. Asif , D. S. Galvão , C. S. Tiwary , P. M. Ajayan

We report a study of long-range MoS2-substrate interaction using resonant Raman imaging. We observed a strong thickness-dependent peak shift of a Raman-forbidden mode that can be used as a new method of determining the thickness of…

材料科学 · 物理学 2016-12-13 Hongyuan Li , Dmitri V. Voronine

The silicon/silicon dioxide (Si/SiO2) interface plays a crucial role in the performance, cost, and reliability of most modern microelectronic devices, from the basic transistor to flash memory, digital cameras, and solar cells. Today the…

光学 · 物理学 2009-11-11 Matthew Borselli , Thomas J. Johnson , Oskar Painter

We experimentally study the surface roughness and the lateral friction force in single-layer MoS2 crystals deposited on different substrates: SiO2, mica and hexagonal boron nitride (h-BN). Roughness and sliding friction measurements are…

介观与纳米尺度物理 · 物理学 2015-06-22 Jorge Quereda , Andres Castellanos-Gomez , Nicolás Agraït , Gabino Rubio-Bollinger

The research field of two dimensional (2D) materials strongly relies on optical microscopy characterization tools to identify atomically thin materials and to determine their number of layers. Moreover, optical microscopy-based techniques…

Considering that two-dimensional (2D) molybdenum trioxide has acquired more attention in the last few years, it is relevant to speed up thickness identification of this material. We provide two fast and non-destructive methods to evaluate…

Interfaces govern the unique mechanical response of amorphous multilayers. Here, we examine nanoindentation hardness and deformation behaviour of amorphous-amorphous Ta$_2$O$_5$/SiO$_2$ nanolaminates with bilayer thicknesses ranging from 2…

Magnetic multilayers are a rich class of materials systems with numerous highly tunable physical parameters that determine both their magnetic and electronic properties. Here we present a comprehensive experimental study of a novel system,…

材料科学 · 物理学 2022-06-02 Martin Lonsky , Myoung-Woo Yoo , Yi-Siou Huang , Jiangchao Qian , Jian-Min Zuo , Axel Hoffmann

In this communication, we report results of a high resolution sputter depth profiling analysis of a stack of 16 alternating MgO and ZnO nanolayers grown by atomic layer deposition (ALD) with thickness of ~5.5 nm per layer. We used an…

材料科学 · 物理学 2014-03-21 S. V. Baryshev , J. A. Klug , A. V. Zinovev , C. E. Tripa , J. W. Elam , I. V. Veryovkin

The synthesis and structural analysis of Mo/B periodical multilayer X-ray mirrors (PMMs) for beyond extreme ultraviolet (BEUV) optics was performed. The PMMs were deposited by a combination of pulsed DC and radio frequency (RF) magnetron…

应用物理 · 物理学 2020-11-13 Oleksiy V. Penkov , Igor A. Kopylets , Valeriy V. Kondratenko , Mahdi Khadem

The random layer thickness variations can induce a great deformation of the experimental reflection of broadband extreme ultraviolet multilayer. In order to reduce this influence of random layer thickness fluctuations, the multiobjective…

应用物理 · 物理学 2018-10-17 Shang-qi Kuang , Jian-bo Wang , Hai-gui Yang , Tong-lin Huo , Hong-jun Zhou

Ni/Al reactive multilayers are promising materials for applications requiring controlled local energy release and superior mechanical performance. This study systematically investigates the impact of compositional variations, ranging from…

材料科学 · 物理学 2026-04-14 Nensi Toncich , Fabian Schwarz , Rebecca A. Gallivan , Jemma Gillon , Ralph Spolenak
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