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We report results of experimental investigation of the low-frequency noise in the top-gate graphene transistors. The back-gate graphene devices were modified via addition of the top gate separated by 20 nm of HfO2 from the single-layer…

材料科学 · 物理学 2015-05-14 G. Liu , W. Stillman , S. Rumyantsev , Q. Shao , M. Shur , A. A. Balandin

Low-frequency noise with the spectral density S(f)~1/f^g (f is the frequency and g~1) is a ubiquitous phenomenon, which hampers operation of many devices and circuits. A long-standing question of particular importance for electronics is…

介观与纳米尺度物理 · 物理学 2015-06-12 Guanxiong Liu , Sergey Rumyantsev , Michael S. Shur , Alexander A. Balandin

We present low-frequency electrical resistance fluctuations, or noise, in graphene-based field-effect devices with varying number of layers. In single-layer devices the noise magnitude decreases with increasing carrier density, which…

介观与纳米尺度物理 · 物理学 2010-06-09 Atindra Nath Pal , Arindam Ghosh

Low-frequency noise with a spectral density that depends inversely on frequency (f) has been observed in a wide variety of systems including current fluctuations in resistors, intensity fluctuations in music and signals in human cognition.…

介观与纳米尺度物理 · 物理学 2015-06-16 Alexander A. Balandin

The nature of the low-frequency current fluctuations, i.e. carrier number vs. mobility, defines the strategies for noise reduction in electronic devices. While the 1/f noise in metals has been attributed to the electron mobility…

We have investigated low-frequency 1/f noise in the boron nitride - grapheme - boron nitride heterostructure field - effect transistors on Si/SiO2 substrates (f is a frequency). The device channel was implemented with a single layer…

介观与纳米尺度物理 · 物理学 2015-08-11 Maxim A. Stolyarov , Guanxiong Liu , Sergey L. Rumyantsev , Michael Shur , Alexander A. Balandin

We fabricated a large number of single and bilayer graphene transistors and carried out a systematic experimental study of their low-frequency noise characteristics. A special attention was given to determining the dominant noise sources in…

材料科学 · 物理学 2015-05-19 S. Rumyantsev , G. Liu , W. Stillman , M. Shur , A. A. Balandin

We report the 1/f noise characteristics at low-frequency in graphene field-effect transistors that utilized a high-k dielectric tantalum oxide encapsulated layer (a few nanometers thick) placed by atomic layer deposition on Si3N4. A…

材料科学 · 物理学 2021-03-30 Yifei Wang , Vinh X. Ho , Zachary. N. Henschel , Michael P. Cooney , Nguyen Q. Vinh

We investigated the effect of the electron-beam irradiation on the level of the low-frequency 1/f noise in graphene devices. It was found that 1/f noise in graphene reveals an anomalous characteristic - it reduces with increasing…

介观与纳米尺度物理 · 物理学 2015-06-12 Md. Zahid Hossain , Sergey Rumyantsev , Michael S. Shur , Alexander A. Balandin

Low-frequency 1/f noise is ubiquitous, and dominates the signal-to-noise performance in nanodevices. Here we investigate the noise characteristics of single-layer and bilayer graphene nano-devices, and uncover an unexpected 1/f noise…

材料科学 · 物理学 2008-02-29 Yu-Ming Lin , Phaedon Avouris

Low-frequency 1/f noise in electronics is a conductance fluctuation, that has been expressed in terms of a mobility "$\alpha$-noise" by Hooge and Kleinpenning. Understanding this noise in graphene is a key towards high-performance…

介观与纳米尺度物理 · 物理学 2023-04-18 A. Schmitt , D. Mele , M. Rosticher , T. Taniguchi , K. Watanabe , C. Maestre , C. Journet , V. Garnier , G. Fève , J. M. Berroir , C. Voisin , B. Plaçais , 1 , E. Baudin

This letter investigates the bias-dependent low frequency noise of single layer graphene field-effect transistors. Noise measurements have been conducted with electrolyte-gated graphene transistors covering a wide range of gate and drain…

介观与纳米尺度物理 · 物理学 2018-10-22 Nikolaos Mavredakis , Ramon Garcia Cortadella , Andrea Bonaccini Calia , Jose A. Garrido , David Jiménez

We have investigated the low frequency (f) flicker (also called 1/f) noise of single-layer graphene devices on h-BN (placed on SiO2/Si) along with those on SiO2/Si. We observe that the devices fabricated on h-BN have on average one order of…

介观与纳米尺度物理 · 物理学 2015-09-30 Morteza Kayyalha , Yong P. Chen

A distinctive feature of single layer graphene is the linearly dispersive energy bands, which in case of multilayer graphene become parabolic. Other than the quantum Hall effect, this distinction has been hard to capture in electron…

介观与纳米尺度物理 · 物理学 2010-10-01 Atindra Nath Pal , Subhamoy Ghatak , Vidya Kochat , Sneha E. S. , Arjun B. S. , Srinivasan Raghavan , Arindam Ghosh

We report on the transport and low-frequency noise measurements of MoS2 thin-film transistors with "thin" (2-3 atomic layers) and "thick" (15-18 atomic layers) channels. The back-gated transistors made with the relatively thick MoS2…

介观与纳米尺度物理 · 物理学 2023-07-19 S. L. Rumyantsev , C. Jiang , R. Samnakay , M. S. Shur , A. A. Balandin

We report results of investigation of the low-frequency excess noise in device channels made from topological insulators - a new class of materials with a bulk insulating gap and conducting surface states. The thin-film bismuth selenide…

The speed of silicon-based transistors has reached an impasse in the recent decade, primarily due to scaling techniques and the short-channel effect. Conversely, graphene (a revolutionary new material possessing an atomic thickness) has…

材料科学 · 物理学 2013-09-03 K. C. Yung , W. M. Wu , M. P. Pierpoint , F. V. Kusmartsev

Single-layer Graphene (SLG) is a promising material for sensing applications. High performance graphene sensors can be achieved when Interdigitated Electrodes (IDE) are used. In this research work, we fabricated SLG micro-ribbon (GMR)…

We show that vapors of different chemicals produce distinguishably different effects on the low-frequency noise spectra of graphene. It was found in a systematic study that some gases change the electrical resistance of graphene devices…

We present the results of the experimental investigation of the low - frequency noise in bilayer graphene transistors. The back - gated devices were fabricated using the electron beam lithography and evaporation. The charge neutrality point…

材料科学 · 物理学 2009-11-13 Q. Shao , G. Liu , D. Teweldebrhan , A. A. Balandin , S. Roumyantesv , M. Shur , D. Yan
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