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相关论文: Thickness Estimation of Epitaxial Graphene on SiC …

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Graphene has many unique properties that make it an ideal material for fundamental studies as well as for potential applications. Here we review the recent results on the Raman spectroscopy and imaging of graphene. Raman spectroscopy and…

材料科学 · 物理学 2008-10-17 Zhen hua Ni , Ying ying Wang , Ting Yu , Ze xiang Shen

The formation of epitaxial graphene on SiC is monitored in-situ using low-energy electron diffraction (LEED). The possibility of using LEED as an in-situ thickness monitor of the graphene is examined. The ratio of primary diffraction spot…

材料科学 · 物理学 2010-11-23 P. J. Fisher , Luxmi , N. Srivastava , S. Nie , R. M. Feenstra

The electronic properties of few-layer graphene grown on the carbon-face of silicon carbide (SiC) are found to be strongly dependent on the number of layers. The carrier mobility is larger in thicker graphene because substrate-related…

介观与纳米尺度物理 · 物理学 2015-05-30 Wenjuan Zhu , Christos Dimitrakopoulos , Marcus Freitag , Phaedon Avouris

The temperature-induced shift of the Raman G line in epitaxial graphene on SiC and Ni surfaces, as well as in graphene supported on SiO2, is investigated with Raman spectroscopy. The thermal shift rate of epitaxial graphene on 6H-SiC(0001)…

介观与纳米尺度物理 · 物理学 2011-02-18 Nicola Ferralis , Roya Maboudian , Carlo Carraro

We report a new method for quantitative estimation of graphene layer thicknesses using high contrast imaging of graphene films on insulating substrates with a scanning electron microscope. By detecting the attenuation of secondary electrons…

The buffer layer has been analysed by combined micro-Raman and micro-transmission experiments. The epitaxial graphene growth on the (0001) Si face of 6H-SiC substrates was tuned to get a mixed surface at the early stage of graphitization…

介观与纳米尺度物理 · 物理学 2012-12-07 A. Tiberj , J. R. Huntzinger , N. Camara , P. Godignon , J. Camassel

The fabrication of epitaxial graphene (EG) on SiC substrate by annealing has attracted a lot of interest as it may speed up the application of graphene for future electronic devices. The interaction of EG and the SiC substrate is critical…

材料科学 · 物理学 2009-11-13 Z. H. Ni , W. Chen , X. F. Fan , J. L. Kuo , T. Yu , A. T. S. Wee , Z. X. Shen

Graphene grown epitaxially on SiC has been proposed as a material for carbon-based electronics. Understanding the interface between graphene and the SiC substrate will be important for future applications. We report the ability to image the…

Raman spectra were measured for mono-, bi- and trilayer graphene grown on SiC by solid state graphitization, whereby the number of layers was pre-assigned by angle-resolved ultraviolet photoemission spectroscopy. It was found that the only…

Raman spectroscopic studies of graphene have attracted much interest. The G-band Raman intensity of a single layer graphene on Si substrate with 300 nm SiO2 capping layer is surprisingly strong and is comparable to that of bulk graphite. To…

材料科学 · 物理学 2009-11-13 Yingying Wang , Zhenhua Ni , Zexiang Shen , Haomin Wang , Yihong Wu

Epitaxial films of graphene on SiC(0001) are interesting from a basic physics as well as applications-oriented point of view. Here we study the emerging morphology of in-vacuo prepared graphene films using low energy electron microscopy…

Using a scanning electron microscope, we observed a reproducible, discrete distribution of secondary electron intensity stemming from an atomically thick graphene film on a thick insulating substrate. The discrete distribution made it…

材料科学 · 物理学 2010-09-29 Hidefumi Hiura , Hisao Miyazaki , Kazuhito Tsukagoshi

Raman spectroscopy is one of the widely used methods in the analysis of various samples including carbon-based materials. This study aimed to identify the number of layers and defects in graphene using micro-Raman spectroscopy. More…

光学 · 物理学 2024-03-21 Somayeh Gholipour , Maryam Bahreini , Mohamad Reza Jafarfard

We describe Raman spectroscopy based method of measuring thermal conductivity of thin films, and review significant results achieved with this technique pertinent to graphene and other two-dimensional materials. The optothermal Raman method…

介观与纳米尺度物理 · 物理学 2019-03-18 Hoda Malekpour , Alexander A. Balandin

The early stages of epitaxial graphene layer growth on the Si-terminated 6H-SiC(0001) are investigated by Auger electron spectroscopy (AES) and depolarized Raman spectroscopy. The selection of the depolarized component of the scattered…

材料科学 · 物理学 2008-11-20 Nicola Ferralis , Roya Maboudian , Carlo Carraro

Graphite is a well-studied material with known electronic and optical properties. Graphene, on the other hand, which is just one layer of carbon atoms arranged in a hexagonal lattice, has been studied theoretically for quite some time but…

介观与纳米尺度物理 · 物理学 2015-05-13 F. Molitor , D. Graf , C. Stampfer , T. Ihn , K. Ensslin

We demonstrate that the confocal laser scanning microscopy (CLSM) provides a non-destructive, highly-efficient characterization method for large-area epitaxial graphene and graphene nanostructures on SiC substrates, which can be applied in…

The vibrational properties of semiconducting graphene buffer layer epitaxially grown on hexagonal silicon carbide are determined using first-principles calculations on a realistic structural model. Despite the important chemical and…

材料科学 · 物理学 2025-06-23 Guillaume Radtke , Michele Lazzeri

We report results from two-dimensional Raman spectroscopy studies of large-area epitaxial graphene grown on SiC. Our work reveals unexpectedly large variation in Raman peak position across the sample resulting from inhomogeneity in the…

材料科学 · 物理学 2015-05-13 J. A. Robinson , C. P. Puls , N. E. Staley , J. Stitt , M. A. Fanton , K. V. Emtsev , T. Seyller , Y. Liu

We present energy filtered electron emission spectromicroscopy with spatial and wave-vector resolution on few layer epitaxial graphene on SiC$(000-1) grown by furnace annealing. Low energy electron microscopy shows that more than 80% of the…

材料科学 · 物理学 2015-05-27 C. Mathieu , N. Barrett , J. Rault , Y. Y. Mi , B. Zhang , W. A. de Heer , C. Berger , E. H. Conrad , O. Renault
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