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A new concept of micromachines has been developed for measuring the mechanical properties of thin metallic films. The actuator is a beam undergoing large internal stresses built up during the deposition process. Al thin films are deposited…

其他计算机科学 · 计算机科学 2007-11-29 D. Fabrègue , Nicolas André , T. Pardoen , J. P. Raskin

The effect of surface stress on the stiffness of cantilever beams remains an outstanding problem in the physical sciences. While numerous experimental studies report significant stiffness change due to surface stress, theoretical…

介观与纳米尺度物理 · 物理学 2012-11-05 Rassul B. Karabalin , L. G. Villanueva , M. H. Matheny , John E. Sader , Michael L. Roukes

In this work we present the design of a new test geometry inspired by the Tapered Double Cantilever Beam (TDCB) specimen that is shown to provide an improved characterization of the fracture properties of brittle solids. First, we show that…

We present a universal nanomechanical sensing platform for the investigation of magnetostriction in thin films. It is based on a doubly-clamped silicon nitride nanobeam resonator covered with a thin magnetostrictive film. Changing the…

We developed a process to fabricate nanoscale metallic gate electrodes on scanning probe cantilevers, including on the irregular surface of protruding cantilever tips. The process includes a floating-layer technique to coat the cantilevers…

仪器与探测器 · 物理学 2022-09-26 Luca Forrer , Aurèle Kamber , Armin Knoll , Martino Poggio , Floris Braakman

The profile of suspended silicon nitride thin films patterned with one-dimensional subwavelength grating structures is investigated using Atomic Force Microscopy. We first show that the results of the profilometry can be used as input to…

介观与纳米尺度物理 · 物理学 2021-02-18 Ali Akbar Darki , Alexios Parthenopoulos , Jens Vinge Nygaard , Aurélien Dantan

This work aims to identify common challenges in the preparation of the blister test devices designed for measurement of energy release rate for brittle thin films and to propose easy-to-implement solutions accordingly. To this end, we…

材料科学 · 物理学 2017-10-17 François Boulogne , Sepideh Khodaparast , Christophe Poulard , Howard A. Stone

Understanding the generation of mechanical stress in drying, particle-laden films is important for a wide range of industrial processes. The cantilever experiment allows the stress in a drying film that has been deposited onto a thin plate…

经典物理 · 物理学 2022-11-01 Matthew G. Hennessy , Richard V. Craster , Omar K. Matar

Numerical Simulations are employed to create amorphous nano-films of a chosen thickness on a crystalline substrate which induces strain on the film. The films are grown by a vapor deposition technique which was recently developed to create…

Nanoindentation is an effective way of finding mechanical properties at nanoscale. They are especially useful for thin films where elimination of the substrate effect is required. The mechanism is based upon depth sensing indentation based…

材料科学 · 物理学 2016-07-25 A. S. Bhattacharyya

Properties of typical MEMS materials have been widely investigated. Mechanical properties of MEMS structures depend not only on the bulk material properties, but also structural factors. A measurement system has been made to measure…

其他计算机科学 · 计算机科学 2008-12-18 Kai Axel Hals , Einar Halvorsen , Xuyuan Chen

A detailed investigation of the structural and vibrational properties of various prestressed silicon nitride membranes patterned with one-dimensional photonic crystal structures is presented. The tensile stress-related deformation of the…

应用物理 · 物理学 2022-05-20 Ali A. Darki , Robin V. Nielsen , Jens V. Nygaard , Aurélien Dantan

We present here a novel cantilever based apparatus to perform translational stress or strain controlled rheology in very soft solids, and obtain simultaneous confocal imaging of the 3 dimensional microstructure. The stress is measured using…

软凝聚态物质 · 物理学 2021-09-10 Akash Singh , Michio Tateno , Gilles Simon , Loïc Vanel , Mathieu Leocmach

We present a novel experimental setup to investigate two-dimensional thermal convection in a freestanding thin liquid film. We develop a setup for the reproducible generation of freestanding thin liquid films. Such films can be produced in…

仪器与探测器 · 物理学 2016-06-22 Michael Winkler , Markus Abel

We suggest the nondestructive method for determination of the dielectric constant of substrate-deposited thin films by capacitance measurement with two parallel wires placed on top of the film. The exact analytical formula for the…

介观与纳米尺度物理 · 物理学 2016-11-29 Svitlana Kondovych , Igor Luk'yanchuk

Diffraction of light beams from the phase steps due to the abrupt changes in the boundary of step leads to Fresnel fringes that their visibility and intensity profile depend on the change of the step height or light incident angle. The…

仪器与探测器 · 物理学 2018-12-05 Ali Motazedifard , S. Dehbod , A. Salehpour

This study is focused on the mechanical characterization of materials used in microelectronic and micro- electromechanical systems (MEMS) devices. In order to determine their mechanical parameters, a new deformation bench test with suitable…

其他计算机科学 · 计算机科学 2008-12-18 C. Seguineau , M. Ignat , C. Malhaire , S. Brida , X. Lafontan , J. -M. Desmarres , C. Josserond , L. Debove

We present mechanical measurements performed at low temperatures on cantilever-based microelectro-mechanicalstructures(MEMS) coated with a metallic layer. Two very different coatings are presented in order to illustrate the capabilities of…

介观与纳米尺度物理 · 物理学 2013-12-17 Eddy Collin , Johannes Kofler , Sabine Lakhloufi , Sebastien Pairis , Yuriy M. Bunkov , Henri Godfrin

We propose a numerical tool to mimic the pulsed deposition of nanoparticles, a technique used to fabricate thin films from the deposition of nanoparticles upon a substrate. We employ such tool under different initial conditions, in…

介观与纳米尺度物理 · 物理学 2024-07-01 Giacomo becatti , Francesca Baletto

The reliable operation of micro and nanomechanical devices necessitates a thorough knowledge of the water film thickness present on the surfaces of these devices with an accuracy in the nm range. In this work, the thickness of an ultra-thin…

材料科学 · 物理学 2007-05-23 A. Opitz , M. Scherge , S. I. -U. Ahmed , J. A. Schaefer
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