利用共焦 X 射线荧光通过薄样法在无样品制备情况下对中等厚度和无限厚样品的定量分析
光学
2015-05-29 v1
摘要
为了验证共焦 X 射线荧光在利用薄样法无样品制备分析中等厚度和无限厚样品方面具有潜在应用，作为一个示例，使用了基于多毛细管 X 射线光学器件的共焦 X 射线荧光来分析多元素溶液。
引用
@article{arxiv.1505.07530,
title = {Quantitative analysis of intermediately and infinitely thick samples with thin sample approach without sample preparation using confocal X-ray fluorescence},
author = {Xue-Peng Sun and Zhi-Guo Liu and Tian-Xi Sun and Song Peng and Wei-Yuan Sun and Fang-Zuo Li and Bo-Wen Jiang and Yong-Zhong Ma and Xun-Liang Ding},
journal= {arXiv preprint arXiv:1505.07530},
year = {2015}
}
备注
Submited to Chinese Physics C