铁电与介电氧化物薄膜中介电损耗随加工温度演化的建模
材料科学
2009-11-13 v1 其他凝聚态物理
摘要
实验发现，在铁电和介电氧化物薄膜中，介电损耗随加工温度的演化呈现共同趋势：当加工温度逐渐升高时，介电损耗先增加后减小。本文从理论上探讨了铁电/介电薄膜的这种介电响应。我们提出，在薄膜结晶过程的初始阶段，从非晶相到晶相的转变应会显著增加介电损耗；随后，随着加工温度的进一步升高，小晶粒聚结生长为大晶粒可通过降低晶界密度来帮助减少介电损耗。利用所建立的模型分析了厚度为500 nm的(Ba,Sr)TiO3薄膜的实验数据，结果表明与理论结果具有合理的一致性。
引用
@article{arxiv.0809.2008,
title = {Modeling of the evolution of dielectric loss with processing temperature in ferroelectric and dielectric thin oxide films},
author = {X. H. Zhu and B. Guigues and E. Defay and M. Aid},
journal= {arXiv preprint arXiv:0809.2008},
year = {2009}
}
备注
The experimentally observed dielectric loss responses in ferroelectric and dielectric thin oxide films have been theoretically addressed in this work, which paves the way for seeking methods in order to tailor the dielectric loss effectively for practical applications. Accepted for publication in Journal of Applied Physics