ATLAS IBL 中单粒子翻转的测量
仪器与探测器
2020-08-26 v1 高能物理 - 实验
摘要
在 ATLAS 像素系统最内层的 FE-I4B 芯片中研究了单粒子翻转（SEU）和单粒子瞬态（SET）的影响。SEU/SET 影响 FE-I4B 全局寄存器以及各个像素的设置，导致除其他外还包括占用率损失、低压电流下降、噪声像素和沉默像素。定量数据分析和仿真表明，在存储器的负载线上 SET 主导于 SEU。给出了运行问题与缓解技术。
引用
@article{arxiv.2004.14116,
title = {Measurements of Single Event Upset in ATLAS IBL},
author = {G. Balbi and M. Barbero and R. Beccherle and M. Bindi and P. Breugnon and P. Butti and D. Cinca and J. Dickinson and D. Ferrere and D. Fougeron and M. Garcia-Sciveres and J. Garcia Pascual and A. Gaudiello and C. Gemme and N. Giangiacomi and T. Hemperek and L. Jeanty and O. Kepka and M. Kocian and K. Lantzsch and P. Liu and C. Martin and A. Mekkaoui and M. Menouni and K. Potamianos and A. Rozanov and Y. Takubo and M. Wensing},
journal= {arXiv preprint arXiv:2004.14116},
year = {2020}
}
备注
30 pages with 32 figures