利用X射线能谱测量射频腔电压
加速器物理
2007-05-23 v3
摘要
测量射频腔发射的X射线能谱的端点是一种有用的非侵入技术，用于测量腔内峰值电压。文中描述了将计算所得的X射线能谱与实测能谱进行匹配的方法，重点在于端点区域。
引用
@article{arxiv.physics/0008024,
title = {Measurements of RF Cavity Voltages by X-ray Spectrum Measurements},
author = {J. P. Duke and A. P. Letchford and D. J. S. Findlay},
journal= {arXiv preprint arXiv:physics/0008024},
year = {2007}
}
备注
For LINAC 2000 Conference, Monterey, 21-25 August 2000 Paper no. MOC08 Second PostScript version to replace first PostScript version in which caption to Fig. 1 overflowed on to second page