基于主动热成像的界面缺陷近似反演公式的形式化推导
数学物理
2026-05-13 v3 math.MP
摘要
当双层复合导体的界面受损时，其热学性质会发生改变。本文研究由于缺陷存在所引起的界面热导扰动的的无损评估。在主动热成像的典型框架下，试样由灯系统或激光加热，同时用红外相机测量其表面温度。影响界面的缺陷通过由拉普拉斯变换及抛物型微分算子（互易性）的适当对称性所得的反演公式进行评估。基于模拟数据的数值反演结果令人鼓舞。
引用
@article{arxiv.2309.04497,
title = {Formal derivation of an inversion formula for the approximation of interface defects by means of active thermography},
author = {Gabriele Inglese and Raffaele Inglese},
journal= {arXiv preprint arXiv:2309.04497},
year = {2026}
}
备注
the perturbative analysis in section 5 is meaningful only if the terms delta h and delta U are normalized. The correction is absolutely necessary. It implies that the evaluation of the constants (stability/instability) must be done again and carefully checked