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相关论文: Scanning Gate Spectroscopy on Nanoclusters

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We demonstrate a simple capacitive based method to quickly and efficiently locate micron size conductive samples on insulating substrates in a scanning tunneling microscope (STM). By using edge recognition the method is designed to locate…

介观与纳米尺度物理 · 物理学 2014-02-04 Guohong Li , Adina Luican , Eva Y. Andrei

We present a method to produce superconducting tips to be used in Scanning Tunneling Microscopy/Spectroscopy experiments. We use these tips to investigate the evolution of the electronic density of states of NbSe2 from 0.3K up to its…

超导电性 · 物理学 2009-11-10 J. G. Rodrigo , S. Vieira

We have fabricated single-electron transistors from individual metal nanoparticles using a geometry that provides improved coupling between the particle and the gate electrode. This is accomplished by incorporating a nanoparticle into a gap…

凝聚态物理 · 物理学 2009-11-10 K. I. Bolotin , F. Kuemmeth , A. N. Pasupathy , D. C. Ralph

The invention of scanning probe microscopy has revolutionized the way electronic phenomena are visualized. While present-day probes can access a variety of electronic properties at a single location in space, a scanning microscope that can…

介观与纳米尺度物理 · 物理学 2023-03-14 Alon Inbar , John Birkbeck , Jiewen Xiao , Takashi Taniguchi , Kenji Watanabe , Binghai Yan , Yuval Oreg , Ady Stern , Erez Berg , Shahal Ilani

Nitride-based superconductors represent a family of superconducting thin film materials displaying higher quality than their corresponding bare superconductor when used in devices for applications such as cosmic radiation sensing. In recent…

Scanning tunnelling microscopy (STM) is a powerful technique for imaging surfaces with atomic resolution, providing insight into physical and chemical processes at the level of single atoms and molecules. A regular task of STM image…

Scanning tunneling microscopy (STM) has made tremendous progress in the study and understanding of both classical and unconventional superconductors. This has motivated a rapidly growing effort to apply the same techniques to the iron-based…

超导电性 · 物理学 2013-07-29 Can-Li Song , Jennifer E. Hoffman

Scanning tunneling microscope (STM) has presented a revolutionary methodology to the nanoscience and nanotechnology. It enables imaging the topography of surfaces, mapping the distribution of electronic density of states, and manipulating…

介观与纳米尺度物理 · 物理学 2020-09-07 Wonhee Ko , Chuanxu Ma , Giang D. Nguyen , Marek Kolmer , An-Ping Li

We present the design and operation of a very-low temperature Scanning Tunneling Microscope (STM) working at $60 mK$ in a dilution refrigerator. The STM features both atomic resolution and micron-sized scanning range at low temperature.…

介观与纳米尺度物理 · 物理学 2009-10-31 N. Moussy , H. Courtois , B. Pannetier

An extension of the direct-current, double-lamella drop-off technique for electrochemically etching tungsten scanning-tunneling-microscope tips is presented. The key fabrication step introduced here is the use of an etch stop as a simple…

介观与纳米尺度物理 · 物理学 2015-01-22 G. Basnet , J. K. Schoelz , P. Xu , S. D. Barber , M. L. Ackerman , P. M. Thibado

The physical properties of ultrathin NaCl overlayers on the stepped Cu(311) surface have been characterized using scanning tunneling microscopy (STM) and spectroscopy, and density functional calculations. Simulations of STM images and…

材料科学 · 物理学 2009-11-10 F. E. Olsson , M. Persson , J. Repp , G. Meyer

The fabrication and performances of cantilevered probes with reduced parasitic capacitance starting from a commercial Si3N4 cantilever chip is presented. Nanomachining and metal deposition induced by focused ion beam techniques were…

材料科学 · 物理学 2009-11-11 P. Pingue , V. Piazza , P. Baschieri , C. Ascoli , C. Menozzi , A. Alessandrini , P. Facci

A scanning tunneling microscope (STM) can probe the inelastic spin excitations of single magnetic atoms in a surface via spin-flip assisted tunneling. A particular and intriguing case is the Mn dimer case. We show here that the existing…

介观与纳米尺度物理 · 物理学 2022-08-31 F. Delgado , J. Fernández-Rossier

We present a detailed modeling and characterization of our scalable microwave nanoprobe, which is a micro-fabricated cantilever-based scanning microwave probe with separated excitation and sensing electrodes. Using finite-element analysis,…

其他凝聚态物理 · 物理学 2008-09-24 K. Lai , W. Kundhikanjana , M. Kelly , Z. X. Shen

We theoretically study scanning gate microscopy (SGM) of electron and hole trajectories in a quantum point contact (QPC) embedded in a normal-superconductor (NS) junction. At zero voltage bias, the electrons and holes transported through…

介观与纳米尺度物理 · 物理学 2024-03-13 S. Maji , K. Sowa , M. P. Nowak

We describe the design and performance of a scanning tunneling microscope (STM) which operates at a base temperature of 30 mK in a vector magnetic field. The cryogenics is based on an ultra-high vacuum (UHV) top-loading wet dilution…

We compare classical versus quantum electron transport in recently investigated magnetic focusing devices [S. Bhandari et al., Nano Lett. 16, 1690 (2016)] exposed to the perturbing potential of a scanning gate microscope (SGM). Using the…

介观与纳米尺度物理 · 物理学 2017-04-26 M. D. Petrović , S. P. Milovanović , F. M. Peeters

Nanoscale optoelectronic components achieve functionality via spatial variation in electronic structure induced by composition, defects, and dopants. To dynamically change the local band alignment and influence defect states, a scanning…

应用物理 · 物理学 2025-02-20 Yen-Po Liu , Jonatan Fast , Yang Chen , Ren Zhe , Adam Burke , Rainer Timm , Heiner Linke , Anders Mikkelsen

Electronic transport in semiconducting single-wall carbon nanotubes is studied by combined scanning gate microscopy and scanning impedance microscopy (SIM). Depending on the probe potential, SIM can be performed in both invasive and…

介观与纳米尺度物理 · 物理学 2009-11-07 Sergei V. Kalinin , Dawn A. Bonnell , Marcus Freitag , A. T. Johnson

This paper presents the design and fabrication of batch-processed cantilever probes with electrical shielding for scanning microwave impedance microscopy. The diameter of the tip apex, which defines the electrical resolution, is less than…