相关论文: Low-temperature, high-resolution magnetic force mi…
Recent advances in mechanical-diode based ultrasonic force microscopy techniques are reviewed. The potential of Ultrasonic Force Microscopy (UFM) for the study of material elastic properties is explained in detail. Advantages of the…
A high sensitivity force sensor based on dielectric microspheres in vacuum, optically trapped by a single, upward-propagating laser beam, is described. Off-axis parabolic mirrors are used both to focus the 1064~nm trapping beam and to…
In this study we present a new method of measuring magnetostriction with an atomic force microscope adapted for the application magnetic fields. The experiment allows us to visualise, in an elegant and educational way how the lateral…
Magnetic resonance imaging, based on the manipulation and detection of nuclear spins, is a powerful imaging technique that typically operates on the scale of millimeters to microns. Using magnetic resonance force microscopy, we have…
Atomic force microscopy (AFM) is an analytical surface characterization tool which can reveal a sample's topography with high spatial resolution while simultaneously probing tip-sample interactions. Local measurement of chemical properties…
Time-resolved scanning Kerr microscopy (TRSKM) is a powerful technique for the investigation of picosecond magnetization dynamics at sub-micron length scales by means of the magneto-optical Kerr effect (MOKE). The spatial resolution of…
Ferromagnetic Resonance Force Microscopy (FMRFM) offers a means of performing local ferromagnetic resonance. We have studied the evolution of the FMRFM force spectra in a continuous 50 nm thick permalloy film as a function of probe-film…
We report quantitative measurements of nanoscale permittivity and conductivity using tuning-fork (TF) based microwave impedance microscopy (MIM). The system is operated under the driving amplitude modulation mode, which ensures satisfactory…
We have studied the dynamics of quartz tuning fork resonators used in atomic force microscopy taking into account mechanical energy dissipation through the attachment of the tuning fork base. We find that the tuning fork resonator quality…
We describe an ultra-sensitive atomic magnetometer using optically-pumped potassium atoms operating in spin-exchange relaxation free (SERF) regime. We demonstrate magnetic field sensitivity of 160 aT/Hz$^{1/2}$ in a gradiometer arrangement…
A dipper probe for broadband Ferromagnetic Resonance (FMR) operating from 4.2 K to room temperature is described. The apparatus is based on a 2-port transmitted microwave signal measurement with a grounded coplanar waveguide. The waveguide…
The Photonic Force Microscope (PFM) is an opto-mechanical technique based on an optical trap that can be assumed to probe forces in microscopic systems. This technique has been used to measure forces in the range of pico- and femto-Newton,…
We constructed a dilution-refrigerator (DR) based ultra-low temperature scanning tunneling microscope (ULT-STM) which works at temperatures down to 30 mK, in magnetic fields up to 6 T and in ultrahigh vacuum (UHV). Besides these extreme…
Friction measurements in the range of several meters per second are still of great interests. With the atomic force microscopy (AFM), the oscilaltion situation of the quartz crystal resonators of 3MHz resonance frequency are studied. And…
Modern optical nano-elements pursue ever-smaller sizes and individualized functionalities. Those elements that can efficiently manipulate the magnetic field of light boast promising future applications with a great challenge: the magnetic…
We report the achievement of the first atomically resolved scanning tunneling microscope (STM) imaging in a water-cooled magnet (WM), where the extremely harsh vibrations and noises have been the major challenge. This homebuilt WM-STM…
Kelvin probe force microscopy (KPFM) adapts an atomic force microscope to measure electric potential on surfaces at nanometer length scales. Here we demonstrate that Heterodyne-KPFM enables scan rates of several frames per minute in air,…
The first order reversal curve (FORC) method is a macroscopic measurement technique which can be used to extract quantitative, microscopic properties of hysteretic systems. Using magnetic transmission X-ray microscopy (MTXM), local…
Traction Force Microscopy (TFM) computes the forces exerted at the surface of an elastic material by measuring induced deformations in volume. It is used to determine the pattern of the adhesion forces exerted by cells or by cellular…
The magnetic properties of arrays of nanowires (NWs) and nanotubes (NTs), 150 nm in diameter, electrodeposited inside nanoporous polycarbonate membranes are investigated. The comparison of the nanoscopic magnetic force microscopy (MFM)…