相关论文: Variable - temperature scanning optical and force …

A scanning force microscope was implemented operating at temperatures below 4.2K and in magnetic fields up to 8T. Piezoelectric quartz tuning forks were employed for non optical tip-sample distance control in the dynamic operation mode.…

We have built a variable temperature scanning probe microscope (SPM) that covers 4.6 K - 180 K and up to 7 Tesla whose SPM head fits in a 52 mm bore magnet. It features a temperature-controlled sample stage thermally well isolated from the…

The design of an atomic force microscope with an all-fiber interferometric detection scheme capable of atomic resolution at about 500 mK is presented. The microscope body is connected to a small pumped 3He reservoir with a base temperature…

Milli-Kelvin atomic force microscopy (mK-AFM) presents an ongoing experimental challenge due to the intense vibrations in a cryogen-free dilution refrigerator and the low cooling power available at mK temperatures. A viable approach is to…

A novel scanning probe technique is presented: Scanning microSQUID Force microscopy (SSFM). The instrument features independent topographic and magnetic imaging. The SSFM operates in a dilution refrigerator in cryogenic vacuum. Sample and…

We have developed a low temperature, high resolution magnetic force microscope (MFM) using a quartz tuning fork that can operate in a magnetic field. A tuning fork with a spring constant of 1300 N/m mounted with a commercial MFM cantilever…

We demonstrate a dynamic scanning capacitance microscope (DSCM) that operates at large bandwidths, cryogenic temperatures and high magnetic fields. The setup is based on a non-contact atomic force microscope (AFM) with a quartz tuning fork…

Piezoelectric quartz tuning forks have been employed as the force sensor in a dynamic mode scanning force microscope operating at temperatures down to 1.7 K at He-gas pressures of typically 5 mbar. An electrochemically etched tungsten tip…

We propose and evaluate a new type of optical force microscope based on a standing wave optical trap. Our microscope, calibrated in-situ and operating in a dynamic mode, is able to trap, without heating, a single metallic nanoparticle of…

Atomic force microscopy (AFM) has been constantly supporting nanosciences and nanotechnologies for over 30 years, being present in many fields from condensed matter physics to biology. It enables measuring very weak forces at the nanoscale,…

Piezoelectric quartz tuning forks are investigated in view of their use as force sensors in dynamic mode scanning probe microscopy at temperatures down to 1.5 K and in magnetic fields up to 8 T. The mechanical properties of the forks are…

Atomic Force Microscopy (AFM) allows to reconstruct the topography of surface with a resolution in the nanometer range. The exceptional resolution attainable with the AFM makes this instrument a key tool in nanoscience and technology. The…

Polarized light microscopy, as a contrast-enhancing technique for optically anisotropic materials, is a method well suited for the investigation of a wide variety of effects in solid-state physics, as for example birefringence in crystals…

We have developed low temperature part of an ultra high vacuum scanning probe microscope (UHV-SPM) working at variable temperature within the range from 20 K to 700 K. To achieve the required temperature range, a flow cooling system using…

We have developed a low-temperature scanning probe microscope using a quartz tuning fork operating at 4.2 K. A silicon tip from a commercial cantilever was attached to one prong of the tuning fork. With a metallic coating, a potential could…

We describe the design and performance of a scanning tunneling microscope (STM) which operates at a base temperature of 30 mK in a vector magnetic field. The cryogenics is based on an ultra-high vacuum (UHV) top-loading wet dilution…

We describe the operation of a free-space confocal optical microscope operated in a dilution refrigerator. The microscope is installed on a cold insertable probe to enable fast sample exchange while the refrigerator is held at low…

A cryo scanning transmission X-ray microscope, the cryo-STXM, has been designed and commissioned at the Canadian Light Source synchrotron. The instrument is designed to operate from 100 - 4000 eV (lambda = 12.4 - 0.31 nm). Users can insert…

Forces acting between an Atomic Force Microscope (AFM) tip and sample are three dimensional. Despite this, most AFM force measurements are confined to one or two dimensions. Extending AFM force measurements into three dimensions has…

We present the design and performance of a cryogenic scanning tunneling microscope (STM) which operates inside a water-cooled Bitter magnet, which can attain a magnetic field of up to 38 T. Due to the high vibration environment generated by…