A low-temperature dynamic mode scanning force microscope operating in high magnetic fields
凝聚态物理
2009-10-31 v1
摘要
A scanning force microscope was implemented operating at temperatures below 4.2K and in magnetic fields up to 8T. Piezoelectric quartz tuning forks were employed for non optical tip-sample distance control in the dynamic operation mode. Fast response was achieved by using a phase-locked loop for driving the mechanical oscillator. Possible applications of this setup for various scanning probe techniques are discussed.
引用
@article{arxiv.cond-mat/9901023,
title = {A low-temperature dynamic mode scanning force microscope operating in high magnetic fields},
author = {J. Rychen and T. Ihn and P. Studerus and A. Herrmann and K. Ensslin},
journal= {arXiv preprint arXiv:cond-mat/9901023},
year = {2009}
}
备注
5 pages, 5 figures, submitted to "Review of Scientific Instruments"