Low-temperature, high-resolution magnetic force microscopy using a quartz tuning fork
介观与纳米尺度物理
2009-11-11 v1
摘要
We have developed a low temperature, high resolution magnetic force microscope (MFM) using a quartz tuning fork that can operate in a magnetic field. A tuning fork with a spring constant of 1300 N/m mounted with a commercial MFM cantilever tip was used. We have obtained high resolution images of the stray magnetic fields exerted from grains with a spatial resolution of 15 nm and force resolution of 2 pN at 4.2 K. Tuning fork based magnetic force microscopes have the potential to be used at millikelvin temperatures due to their low power dissipation and high force sensitivity.
关键词
引用
@article{arxiv.cond-mat/0505022,
title = {Low-temperature, high-resolution magnetic force microscopy using a quartz tuning fork},
author = {Yongho Seo and Paul Cadden-Zimansky and Venkat Chandrasekhar},
journal= {arXiv preprint arXiv:cond-mat/0505022},
year = {2009}
}
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3pages