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相关论文: Low-temperature, high-resolution magnetic force mi…

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A scanning force microscope was implemented operating at temperatures below 4.2K and in magnetic fields up to 8T. Piezoelectric quartz tuning forks were employed for non optical tip-sample distance control in the dynamic operation mode.…

凝聚态物理 · 物理学 2009-10-31 J. Rychen , T. Ihn , P. Studerus , A. Herrmann , K. Ensslin

We have developed a low-temperature scanning probe microscope using a quartz tuning fork operating at 4.2 K. A silicon tip from a commercial cantilever was attached to one prong of the tuning fork. With a metallic coating, a potential could…

介观与纳米尺度物理 · 物理学 2007-05-23 Yongho Seo , Paul Cadden-Zimansky , Venkat Chandrasekhar

Piezoelectric quartz tuning forks are investigated in view of their use as force sensors in dynamic mode scanning probe microscopy at temperatures down to 1.5 K and in magnetic fields up to 8 T. The mechanical properties of the forks are…

凝聚态物理 · 物理学 2009-10-31 J. Rychen , T. Ihn , P. Studerus , A. Herrmann , K. Ensslin , H. J. Hug , P. J. A. van Schendel , H. J. Guentherodt

Magnetic Resonance Force Microscopy (MRFM) is a powerful technique to detect a small number of spins that relies on force-detection by an ultrasoft magnetically tipped cantilever and selective magnetic resonance manipulation of the spins.…

介观与纳米尺度物理 · 物理学 2015-05-28 A. Vinante , G. Wijts , O. Usenko , L. Schinkelshoek , T. H. Oosterkamp

We demonstrate a scanning force microscope, based upon a quartz tuning fork, that operates below 100 mK and in magnetic fields up to 6 T. The microscope has a conducting tip for electrical probing of nanostructures of interest, and it…

介观与纳米尺度物理 · 物理学 2007-05-23 K. R. Brown , L. Sun , B. E. Kane

A novel scanning probe technique is presented: Scanning microSQUID Force microscopy (SSFM). The instrument features independent topographic and magnetic imaging. The SSFM operates in a dilution refrigerator in cryogenic vacuum. Sample and…

超导电性 · 物理学 2007-05-23 C. Veauvy , D. Mailly , K. Hasselbach

The implementation of a scanning microscope capable of working in confocal, atomic force and apertureless near field configurations is presented. The microscope is designed to operate in the temperature range 4 - 300 K, using conventional…

其他凝聚态物理 · 物理学 2009-11-10 P. S. Fodor , H. Zhu , N. G. Patil , J. Levy

Tuning forks are very popular experimental tools widely applied in low and ultra low temperature physics as mechanical resonators and cantilevers in the study of quantum liquids, STM and AFM techniques, etc. As an added benefit, these forks…

材料科学 · 物理学 2015-06-22 M. Clovecko , M. Kupka , P. Skyba , F. Vavrek

There is a growing demand for experiments on calorimetric and thermal transport measurements at ultra-low temperatures below 1 mK and high magnetic fields up to 16 T. Particularly, milligram-sized solid samples are of great interest. We…

仪器与探测器 · 物理学 2022-10-17 Andrew J. Woods , Alexander. M. Donald , Rasul Gazizulin , Eddy Collin , Lucia Steinke

Piezoelectric quartz tuning forks have been employed as the force sensor in a dynamic mode scanning force microscope operating at temperatures down to 1.7 K at He-gas pressures of typically 5 mbar. An electrochemically etched tungsten tip…

凝聚态物理 · 物理学 2009-10-31 J. Rychen , T. Ihn , P. Studerus , A. Herrmann , K. Ensslin , H. J. Hug , P. J. A. van Schendel , H. J. Guentherodt

A number of aspects of magnetic force microscopy (MFM) specific to the imaging of hard magnetic films have been studied. Firstly, we show that topographic images made in tapping mode with probes characterized by the moderate cantilever…

材料科学 · 物理学 2015-11-02 G Ciuta , F Dumas-Bouchiat , Nora Dempsey , Olivier Fruchart

Sub-nm resolution images can be achieved by Atomic Force Microscopy (AFM) on samples that are deposited on hard substrates. However, it is still extremely challenging to image soft interfaces, such as biological membranes, due to the…

Since the invention of the atomic force microscope (AFM) in 1986, there has been a drive to apply this scanning probe technique or a form of this technique to various disciplines in nanoscale science. Magnetic force microscopy (MFM) is a…

仪器与探测器 · 物理学 2017-04-28 Gustavo Cordova , Brenda Yasie Lee , Zoya Leonenko

Using an ultra-low temperature, high magnetic field scanning probe microscope, we have measured electric potentials of a deeply buried two dimensional electron gas (2DEG). Relying on the capacitive coupling between the 2DEG and a resonant…

介观与纳米尺度物理 · 物理学 2010-11-25 J. A. Hedberg , A. Lal , Y. Miyahara , P. Grütter , G. Gervais , M. Hilke , L. Pfeiffer , K. W. West

Magnetic force microscopy (MFM) is a well-established technique in scanning probe microscopy that allows for the imaging of magnetic samples with a spatial resolution of tens of nm and stray fields down to the mT range. The spatial…

介观与纳米尺度物理 · 物理学 2024-11-13 Christopher Habenschaden , Sibylle Sievers , Alexander Klasen , Andrea Cerreta , Hans Werner Schumacher

Atomic Force Microscopy (AFM) allows to reconstruct the topography of surface with a resolution in the nanometer range. The exceptional resolution attainable with the AFM makes this instrument a key tool in nanoscience and technology. The…

Magnetic force microscopy is a widespread technique for imaging magnetic structures with a resolution of some 10 nanometers. MFM can be calibrated to obtain quantitative spatially resolved magnetization data in units of A/m by determining…

The design of an atomic force microscope with an all-fiber interferometric detection scheme capable of atomic resolution at about 500 mK is presented. The microscope body is connected to a small pumped 3He reservoir with a base temperature…

We demonstrate the quantitative measurement of the magnetization of individual magnetic nanoparticles (MNP) using a magnetic force microscope (MFM). The quantitative measurement is realized by calibration of the MFM signal using an MNP…

介观与纳米尺度物理 · 物理学 2010-02-22 Kai-Felix Braun , Sibylle Sievers , Dietmar Eberbeck , Stefan Gustafsson , Eva Olsson , Hans Werner Schumacher , Uwe Siegner

Magnetic force microscopy (MFM) is long established as a powerful tool for probing the local manifestation of magnetic nanostructures across a range of temperatures and applied stimuli. A major drawback of the technique, however, is that…

仪器与探测器 · 物理学 2023-08-21 Jori F. Schmidt , Lukas M. Eng , Samuel D. Seddon
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