Low-temperature scanning probe microscopy using a tuning fork transducer
摘要
We have developed a low-temperature scanning probe microscope using a quartz tuning fork operating at 4.2 K. A silicon tip from a commercial cantilever was attached to one prong of the tuning fork. With a metallic coating, a potential could be applied to the tip to sense the charge distribution in a sample, while with a magnetically coated tip, magnetic force imaging could be performed. For the coarse approach mechanism, we developed a reliable low-temperature walker with low material cost and simple machining. We have obtained Coulomb force images of boron nanowires at room temperature and magnetic nano-structures at low temperature. For lift-mode scanning, we employed a frequency detection mode for the first topographic scan and phase detection mode for the second lift scan.
引用
@article{arxiv.cond-mat/0604407,
title = {Low-temperature scanning probe microscopy using a tuning fork transducer},
author = {Yongho Seo and Paul Cadden-Zimansky and Venkat Chandrasekhar},
journal= {arXiv preprint arXiv:cond-mat/0604407},
year = {2007}
}
备注
6 pages, 8 figures